| 1999 | ISCAS | Correct diagnosis of almost all faulty units in a multiprocessor system. | Krishnaiyan Thulasiraman, Anindya Das, Kaiyuan Huang, Vinod K. Agarwal |
| 1999 | VLSID | Invited Talk: Embedded Test for Systems-on-a-Chip. | Vinod K. Agarwal |
| 1999 | VTS | VTS 1999 Keynote Address Embedded Test OR External Test. | Vinod K. Agarwal |
| 1995 | ITC | Distributed Probabilistic Diagnosis of MCMs on Large Area. | Koppolu Sasidhar, Abhijit Chatterjee, Vinod K. Agarwal, Joseph L. A. Hughes |
| 1994 | ISCAS | VAMP: A Hierarchical Framework for Design for Manufacturability. | Morie E. Malowany, Gordon W. Roberts, Vinod K. Agarwal |
| 1993 | ITC | Fault Location Algorithms for Repairable Embedded. | Robert P. Treuer, Vinod K. Agarwal |
| 1993 | RSP | The design of a library support system for a telecommunication system synthesis environment. | Oryal Tanir, Vinod K. Agarwal, P. C. P. Bhatt |
| 1992 | ICCI | Performance Evaluation of Latency Tolerant Architectures. | Shashank S. Nemawarkar, Ramaswamy Govindarajan, Guang R. Gao, Vinod K. Agarwal |
| 1992 | RSP | A system level synthesis framework for computer architectures. | Oryal Tanir, Vinod K. Agarwal, P. C. P. Bhatt |
| 1991 | ITC | Fast Signature Computation for Linear Compactors. | D. Lambidonis, Andr Ivanov, Vinod K. Agarwal |
| 1990 | ITC | A new procedure for weighted random built-in self-test. | Fidel Muradali, Vinod K. Agarwal, Benoit Nadeau-Dostie |
| 1989 | ICCAD | A diagnosis method using pseudo-random vectors without intermediate signatures. | Robert C. Aitken, Vinod K. Agarwal |
| 1989 | ITC | Testing of Glue Logic Interconnects Using Boundary Scan Architecture. | Abu S. M. Hassan, Vinod K. Agarwal, Janusz Rajski, Benoit Nadeau-Dostie |
| 1989 | ITC | : Experiments on Aliasing in Signature Analysis Registers. | Dhiren Xavier, Robert C. Aitken, Andr Ivanov, Vinod K. Agarwal |
| 1989 | WG | t/s-Diagnosable Systems: A Characterization and Diagnosis Algorithm. | Anindya Das, Krishnaiyan Thulasiraman, Vinod K. Agarwal, K. B. Lakshmanan |
| 1988 | ICCAD | Aliasing probability of non-exhaustive randomized syndrome tests. | Robert C. Aitken, Vinod K. Agarwal |
| 1988 | ITC | On Multiple Fault Coverage and Aliasing Probability Measures. | Henry Cox, Andr Ivanov, Vinod K. Agarwal, Janusz Rajski |
| 1988 | ITC | Testing and Diagnosis of Interconnects Using Boundary Scan Architecture. | Abu S. M. Hassan, Vinod K. Agarwal, Janusz Rajski |
| 1986 | ITC | Testability Measures : What Do They Do for ATPG ? | Andr Ivanov, Vinod K. Agarwal |
| 1985 | DAC | The McBOOLE logic minimizer. | Michel R. Dagenais, Vinod K. Agarwal, Nicholas C. Rumin |
| 1985 | ITC | Testing Properties and Applications of Inverter-Free PLA's. | Vinod K. Agarwal, Janusz Rajski |
| 1984 | ISCA | An Efficient VLSI Dictionary Machine. | Arun K. Somani, Vinod K. Agarwal |
| 1984 | ITC | A Design for Machines with Built-In Tolerance to Soft Errors. | Yvon Savaria, Vinod K. Agarwal, Nicholas C. Rumin, Jeremiah F. Hayes |
| 1984 | ITC | Higher Certainty of Error Coverage by Output Data Modification. | Yervant Zorian, Vinod K. Agarwal |
| 1983 | ITC | Non-Stuck-At Fault Detection in nMOS Circuits by Region Analysis. | Michael G. Lamoureux, Vinod K. Agarwal |