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Cluster-based detection of SEU-caused errors in LUTs of SRAM-based FPGAs.

E. Syam Sundar Reddy, Vikram Chandrasekhar, Milagros Sashiknth, V. Kamakoti, Narayanan Vijaykrishnan

VenueBASPDAC
Year2005
ProceedingsASP-DAC

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