TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis.
Alejandro Czutro, Ilia Polian, Matthew Lewis, Piet Engelke, Sudhakar M. Reddy, Bernd Becker
Browse the full VLSID paper archive.
Alejandro Czutro, Ilia Polian, Matthew Lewis, Piet Engelke, Sudhakar M. Reddy, Bernd Becker
Browse the full VLSID paper archive.