Skip to content

Ilia Polian

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

114

Venues

20

Active years

1999–2026

Best venue rank

A*

Where they publish

Papers

114 indexed papers, newest first.

YearVenueTitleAuthors
2026DATESynthesizing Mixed-Mode Operations for Memristors using Majority Decomposition.Felix Bayhurst, Li-Wei Chen, Kefeng Li, Heidemarie Krger, Nan Du, Ilia Polian
2026DATELate Breaking Results: Practical Power Side-Channel Attack on Analog Compute-in-Memory Macro.Simon Wilhelmsttter, Johannes Stark, Devanshi Upadhyaya, Mal Gay, Ilia Polian, Maurits Ortmanns
2025ACNSHamming Weight-Based Side Channel Analysis of HLS Kyber Hardware Using Neural Networks.Alexander Kharitonov, Tarick Welling, Mal Gay, Ilia Polian
2025DATEOptimal Synthesis of Memristive Mixed-Mode Circuits.Ilia Polian, Xianyue Zhao, Li-Wei Chen, Felix Bayhurst, Ziang Chen, Heidemarie Schmidt, Nan Du
2025ETSTowards Understanding of System-Level Test Unique Fails.Nourhan Elhamawy, Jens Anders, Ilia Polian, Matthias Sauer
2025ETSAutomated Test Equipment Drift Characterization Based on Gauge Repeatability and Reproducibility.Anand Venkatachalam, Ernst Aderholz, Matthias Sauer, Simon Schweizer, Matthias Werner, Ilia Polian
2025ETSMulti Coefficient CPA on a Black Box Hardware Implementation of CRYSTALS-Kyber.Tarick Welling, Mal Gay, Ilia Polian
2025ISCASLow-Power Continuous Wavelet Transform Employing Stochastic Computing.Roshwin Sengupta, Ilia Polian, John P. Hayes
2025ITCInfluence of Automated Test Equipment Drift on Process Capability Studies.Anand Venkatachalam, Ernst Aderholz, Matthias Sauer, Simon Schweizer, Matthias Werner, Ilia Polian
2024DDECSPerformance and Error Tolerance of Stochastic Computing-Based Digital Filter Design.Roshwin Sengupta, Ilia Polian, John P. Hayes
2024ETSOptimizing System-Level Test Program Generation via Genetic Programming.Denis Schwachhofer, Francesco Angione, Steffen Becker, Stefan Wagner, Matthias Sauer, Paolo Bernardi, Ilia Polian
2024ETSTraining Large Language Models for System-Level Test Program Generation Targeting Non-functional Properties.Denis Schwachhofer, Peter Domanski, Steffen Becker, Stefan Wagner, Matthias Sauer, Dirk Pflger, Ilia Polian
2024IOLTSRefinement and Empirical Side-Channel Analysis of Inner Product Masking with Robust Error Detection.Anton Maidl, Mal Gay, Osnat Keren, Ilia Polian
2024VTSScenario-based Test Content Optimization: Scan Test vs. System-Level Test.Nourhan Elhamawy, Jens Anders, Ilia Polian, Matthias Sauer
2023DSDA Modular Open-Source Cryptographic Co-Processor for Internet of Things.Dina Hesse, Mal Gay, Ilia Polian, Elif Bilge Kavun, Owen Millwood, Witali Bartsch
2023DSNStochastic Computing as a Defence Against Adversarial Attacks.Florian Neugebauer, Vivek Vekariya, Ilia Polian, John P. Hayes
2023ETSA Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors.Jens Anders, Pablo Andreu, Bernd Becker, Steffen Becker, Riccardo Cantoro, Nikolaos Ioannis Deligiannis, Nourhan Elhamawy, Tobias Faller, Carles Hernndez, Nele Mentens, Mahnaz Namazi Rizi, Ilia Polian, Abolfazl Sajadi, Matthias Sauer, Denis Schwachhofer, Matteo Sonza Reorda, Todor Stefanov, Ilya Tuzov, Stefan Wagner, Nusa Zidaric
2023ETSSecrets Leaking Through Quicksand: Covert Channels in Approximate Computing.Lorenzo Masciullo, Roberto Passerone, Francesco Regazzoni, Ilia Polian
2023ETSAutomating Greybox System-Level Test Generation.Denis Schwachhofer, Maik Betka, Steffen Becker, Stefan Wagner, Matthias Sauer, Ilia Polian
2023ICISSPDesign Rationale for Symbiotically Secure Key Management Systems in IoT and Beyond.Witali Bartsch, Prosanta Gope, Elif Bilge Kavun, Owen Millwood, Andriy Panchenko, Aryan Mohammadi Pasikhani, Ilia Polian
2023QCEOptimal Qubit Reuse for Near-Term Quantum Computers.Sebastian Brandhofer, Ilia Polian, Kevin Krsulich
2022DATEIntelligent Methods for Test and Reliability.Hussam Amrouch, Jens Anders, Steffen Becker, Maik Betka, Gerd Bleher, Peter Domanski, Nourhan Elhamawy, Thomas Ertl, Athanasios Gatzastras, Paul R. Genssler, Sebastian Hasler, Martin Heinrich, Andr van Hoorn, Hanieh Jafarzadeh, Ingmar Kallfass, Florian Klemme, Steffen Koch, Ralf Ksters, Andrs Lalama, Raphal Latty, Yiwen Liao, Natalia Lylina, Zahra Paria Najafi-Haghi, Dirk Pflger, Ilia Polian, Jochen Rivoir, Matthias Sauer, Denis Schwachhofer, Steffen Templin, Christian Volmer, Stefan Wagner, Daniel Weiskopf, Hans-Joachim Wunderlich, Bin Yang, Martin Zimmermann
2022DDECSStochastic Computing Architectures for Lightweight LSTM Neural Networks.Roshwin Sengupta, Ilia Polian, John P. Hayes
2022ETSMachine Learning for Test, Diagnosis, Post-Silicon Validation and Yield Optimization.Hussam Amrouch, Krishnendu Chakrabarty, Dirk Pflger, Ilia Polian, Matthias Sauer, Matteo Sonza Reorda
2022ETSOn the Impact of Hardware Timing Errors on Stochastic Computing based Neural Networks.Florian Neugebauer, Stefan Holst, Ilia Polian
2022ISCASWavelet Transform Assisted Neural Networks for Human Activity Recognition.Roshwin Sengupta, Ilia Polian, John P. Hayes
2022QCECalibration-Aware Transpilation for Variational Quantum Optimization.Yanjun Ji, Sebastian Brandhofer, Ilia Polian
2021DATENano Security: From Nano-Electronics to Secure Systems.Ilia Polian, Frank Altmann, Tolga Arul, Christian Boit, Ralf Brederlow, Lucas Davi, Rolf Drechsler, Nan Du, Thomas Eisenbarth, Tim Gneysu, Sascha Hermann, Matthias Hiller, Rainer Leupers, Farhad Merchant, Thomas Mussenbrock, Stefan Katzenbeisser, Akash Kumar, Wolfgang Kunz, Thomas Mikolajick, Vivek Pachauri, Jean-Pierre Seifert, Frank Sill Torres, Jens Trommer
2021DSDExtending Circuit Design Flow for Early Assessment of Fault Attack Vulnerabilities.Felipe Valencia, Ilia Polian, Francesco Regazzoni
2021ETSSecurity, Reliability and Test Aspects of the RISC-V Ecosystem.Jaume Abella, Sergi Alcaide, Jens Anders, Francisco Bas, Steffen Becker, Elke De Mulder, Nourhan Elhamawy, Frank K. Grkaynak, Helena Handschuh, Carles Hernndez, Michael Hutter, Leonidas Kosmidis, Ilia Polian, Matthias Sauer, Stefan Wagner, Francesco Regazzoni
2021ETSArsoNISQ: Analyzing Quantum Algorithms on Near-Term Architectures.Sebastian Brandhofer, Simon J. Devitt, Ilia Polian
2021ICCADOptimal Mapping for Near-Term Quantum Architectures based on Rydberg Atoms.Sebastian Brandhofer, Ilia Polian, Hans Peter Bchler
2021IOLTSSystem-Level Test: State of the Art and Challenges.Davide Appello, H. H. Chen, Matthias Sauer, Ilia Polian, Paolo Bernardi, Matteo Sonza Reorda
2021VTSSpecial Session: Machine Learning for Semiconductor Test and Reliability.Hussam Amrouch, Animesh Basak Chowdhury, Wentian Jin, Ramesh Karri, Farshad Khorrami, Prashanth Krishnamurthy, Ilia Polian, Victor M. van Santen, Benjamin Tan, Sheldon X.-D. Tan
2021VTSSpecial Session: Noisy Intermediate-Scale Quantum (NISQ) Computers - How They Work, How They Fail, How to Test Them?Sebastian Brandhofer, Simon J. Devitt, Thomas Wellens, Ilia Polian
2020DATETowards Secure Composition of Integrated Circuits and Electronic Systems: On the Role of EDA.Johann Knechtel, Elif Bilge Kavun, Francesco Regazzoni, Annelie Heuser, Anupam Chattopadhyay, Debdeep Mukhopadhyay, Soumyajit Dey, Yunsi Fei, Yaacov Belenky, Itamar Levi, Tim Gneysu, Patrick Schaumont, Ilia Polian
2020ICCADMachine Learning and Hardware security: Challenges and Opportunities -Invited Talk-.Francesco Regazzoni, Shivam Bhasin, Amir Alipour, Ihab Alshaer, Furkan Aydin, Aydin Aysu, Vincent Beroulle, Giorgio Di Natale, Paul D. Franzon, David Hly, Naofumi Homma, Akira Ito, Dirmanto Jap, Priyank Kashyap, Ilia Polian, Seetal Potluri, Rei Ueno, Elena-Ioana Vatajelu, Ville Yli-Myry
2020ICCDHardware-based Fast Real-time Image Classification with Stochastic Computing.Ponnanna Kelettira Muthappa, Florian Neugebauer, Ilia Polian, John P. Hayes
2019ETSSecurity in Autonomous Systems.Stefan Katzenbeisser, Ilia Polian, Francesco Regazzoni, Marc Stttinger
2019FDTCHardware-Oriented Algebraic Fault Attack Framework with Multiple Fault Injection Support.Mal Gay, Tobias Paxian, Devanshi Upadhyaya, Bernd Becker, Ilia Polian
2018CHESDetection and Correction of Malicious and Natural Faults in Cryptographic Modules.Batya Karp, Mal Gay, Osnat Keren, Ilia Polian
2018ICCADSecurity: the dark side of approximate computing?Francesco Regazzoni, Cesare Alippi, Ilia Polian
2017ASPDACSecuring the hardware of cyber-physical systems.Francesco Regazzoni, Ilia Polian
2017DATEAnalyzing the effects of peripheral circuit aging of embedded SRAM architectures.Josef Kinseher, Leonhard Heis, Ilia Polian
2017DATEFramework for quantifying and managing accuracy in stochastic circuit design.Florian Neugebauer, Ilia Polian, John P. Hayes
2017DATESensitized path PUF: A lightweight embedded physical unclonable function.Matthias Sauer, Pascal Raiola, Linus Feiten, Bernd Becker, Ulrich Rhrmair, Ilia Polian
2017DSDBuilding a Better Random Number Generator for Stochastic Computing.Florian Neugebauer, Ilia Polian, John P. Hayes
2017ETSCounteracting malicious faults in cryptographic circuits.Ilia Polian, Francesco Regazzoni
2017FDTCAutoFault: Towards Automatic Construction of Algebraic Fault Attacks.Jan Burchard, Mael Gay, Ange-Salom Messeng Ekossono, Jan Horcek, Bernd Becker, Tobias Schubert, Martin Kreuzer, Ilia Polian
2016DATEImproving SRAM test quality by leveraging self-timed circuits.Josef Kinseher, Leonardo Bonet Zordan, Ilia Polian, Andreas Leininger
2016ETSFailure mechanisms and test methods for the SRAM TVC write-assist technique.Josef Kinseher, Moritz Vlker, Leonardo Bonet Zordan, Ilia Polian
2015DACDesign automation challenges for scalable quantum architectures.Ilia Polian, Austin G. Fowler
2015DATEFault-based attacks on the Bel-T block cipher family.Philipp Jovanovic, Ilia Polian
2015RCA Fully Fault-Tolerant Representation of Quantum Circuits.Alexandru Paler, Ilia Polian, Kae Nemoto, Simon J. Devitt
2014DATESoftware-based Pauli tracking in fault-tolerant quantum circuits.Alexandru Paler, Simon J. Devitt, Kae Nemoto, Ilia Polian
2014DDECSA new architecture for minimum mean square error sorted QR decomposition for MIMO wireless communication systems.Victor Tomashevich, Christina Gimmler-Dumont, Christian Fesl, Norbert Wehn, Ilia Polian
2014ETSDetection conditions for errors in self-adaptive better-than-worst-case designs.Ilia Polian, Jie Jiang, Adit D. Singh
2014ETSVariation-aware deterministic ATPG.Matthias Sauer, Ilia Polian, Michael E. Imhof, Abdullah Mumtaz, Eric Schneider, Alexander Czutro, Hans-Joachim Wunderlich, Bernd Becker
2014FDTCParametric Trojans for Fault-Injection Attacks on Cryptographic Hardware.Raghavan Kumar, Philipp Jovanovic, Wayne P. Burleson, Ilia Polian
2014IOLTSPrecise fault-injections using voltage and temperature manipulation for differential cryptanalysis.Raghavan Kumar, Philipp Jovanovic, Ilia Polian
2014RCCross-Level Validation of Topological Quantum Circuits.Alexandru Paler, Simon J. Devitt, Kae Nemoto, Ilia Polian
2014VLSIDSAT-Based Test Pattern Generation with Improved Dynamic Compaction.Alexander Czutro, Sudhakar M. Reddy, Ilia Polian, Bernd Becker
2014VLSIDBetter-than-Worst-Case Timing Design with Latch Buffers on Short Paths.Ravi Kanth Uppu, Ravi Tej Uppu, Adit D. Singh, Ilia Polian
2013ASPDACProvably optimal test cube generation using quantified boolean formula solving.Matthias Sauer, Sven Reimer, Ilia Polian, Tobias Schubert, Bernd Becker
2013DATEEfficient SAT-based dynamic compaction and relaxation for longest sensitizable paths.Matthias Sauer, Sven Reimer, Tobias Schubert, Ilia Polian, Bernd Becker
2013DDECSFault-based attacks on cryptographic hardware.Ilia Polian, Martin Kreuzer
2013VTSSpecial session 12A: Hot topic counterfeit IC identification: How can test help?Ilia Polian, Mohammad Tehranipoor
2012ASPDACDetection and diagnosis of faulty quantum circuits.Alexandru Paler, Ilia Polian, John P. Hayes
2012DATEOn the optimality of K longest path generation algorithm under memory constraints.Jie Jiang, Matthias Sauer, Alexander Czutro, Bernd Becker, Ilia Polian
2012ETSMulti-conditional SAT-ATPG for power-droop testing.Alexander Czutro, Matthias Sauer, Ilia Polian, Bernd Becker
2012ETSOn the quality of test vectors for post-silicon characterization.Matthias Sauer, Alexander Czutro, Bernd Becker, Ilia Polian
2012ICCADSmall-delay-fault ATPG with waveform accuracy.Matthias Sauer, Alexander Czutro, Ilia Polian, Bernd Becker
2012IOLTSCross-level protection of circuits against faults and malicious attacks.Victor Tomashevich, Sudarshan Srinivasan, Fabian Foerg, Ilia Polian
2012ITCFunctional test of small-delay faults using SAT and Craig interpolation.Matthias Sauer, Stefan Kupferschmid, Alexander Czutro, Ilia Polian, Sudhakar M. Reddy, Bernd Becker
2012VTSSAT-ATPG using preferences for improved detection of complex defect mechanisms.Alexander Czutro, Matthias Sauer, Tobias Schubert, Ilia Polian, Bernd Becker
2011DATEAdaptive voltage over-scaling for resilient applications.Philipp Klaus Krause, Ilia Polian
2011DDECSSAT-based analysis of sensitisable paths.Matthias Sauer, Alexander Czutro, Tobias Schubert, Stefan Hillebrecht, Ilia Polian, Bernd Becker
2011ETSTomographic Testing and Validation of Probabilistic Circuits.Alexandru Paler, Armin Alaghi, Ilia Polian, John P. Hayes
2011ETSTowards Variation-Aware Test Methods.Ilia Polian, Bernd Becker, Sybille Hellebrand, Hans-Joachim Wunderlich, Peter C. Maxwell
2011IOLTSEstimation of component criticality in early design steps.Matthias Sauer, Alejandro Czutro, Ilia Polian, Bernd Becker
2011IOLTSAn FPGA-based framework for run-time injection and analysis of soft errors in microprocessors.Matthias Sauer, Victor Tomashevich, Jrg Mller, Matthew Lewis, Andreas Spilla, Ilia Polian, Bernd Becker, Wolfram Burgard
2010DSNMassive statistical process variations: A grand challenge for testing nanoelectronic circuits.Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, Hans-Joachim Wunderlich
2010VTSSpecial session 4B: Panel low-power test and noise-aware test: Foes or friends?Ilia Polian
2009DATEAnalysis and optimization of fault-tolerant embedded systems with hardened processors.Viacheslav Izosimov, Ilia Polian, Paul Pop, Petru Eles, Zebo Peng
2009IOLTSATPG-based grading of strong fault-secureness.Marc Hunger, Sybille Hellebrand, Alejandro Czutro, Ilia Polian, Bernd Becker
2009VLSIDTIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis.Alejandro Czutro, Ilia Polian, Matthew Lewis, Piet Engelke, Sudhakar M. Reddy, Bernd Becker
2009VTSAn Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects.Nicolas Houarche, Mariane Comte, Michel Renovell, Alejandro Czutro, Piet Engelke, Ilia Polian, Bernd Becker
2008DATEResistive Bridging Fault Simulation of Industrial Circuits.Piet Engelke, Ilia Polian, Jrgen Schlffel, Bernd Becker
2008DDECSDiagnosis of Realistic Defects Based on the X-Fault Model.Ilia Polian, Kohei Miyase, Yusuke Nakamura, Seiji Kajihara, Piet Engelke, Bernd Becker, Stefan Spinner, Xiaoqing Wen
2008DSNA study of cognitive resilience in a JPEG compressor.Damian Nowroth, Ilia Polian, Bernd Becker
2008ETSA Simulator of Small-Delay Faults Caused by Resistive-Open Defects.Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, Michel Renovell, Bernd Becker
2008ETSSelective Hardening in Early Design Steps.Christian G. Zoellin, Hans-Joachim Wunderlich, Ilia Polian, Bernd Becker
2008ITCExtraction, Simulation and Test Generation for Interconnect Open Defects Based on Enhanced Aggressor-Victim Model.Stefan Hillebrecht, Ilia Polian, Piet Engelke, Bernd Becker, Martin Keim, Wu-Tung Cheng
2008VTSAutomatic Test Pattern Generation for Interconnect Open Defects.Stefan Spinner, Ilia Polian, Piet Engelke, Bernd Becker, Martin Keim, Wu-Tung Cheng
2007IOLTSIdentification of Critical Errors in Imaging Applications.Ilia Polian, Damian Nowroth, Bernd Becker
2007VTSAn Analysis Framework for Transient-Error Tolerance.John P. Hayes, Ilia Polian, Bernd Becker
2006DATEFunctional constraints vs. test compression in scan-based delay testing.Ilia Polian, Hideo Fujiwara
2006DDECSAutomatic Identification of Timing Anomalies for Cycle-Accurate Worst-Case Execution Time Analysis.Jochen Eisinger, Ilia Polian, Bernd Becker, Alexander Metzner, Stephan Thesing, Reinhard Wilhelm
2006ICCDPower Droop Testing.Ilia Polian, Alejandro Czutro, Sandip Kundu, Bernd Becker
2006IOLTSAn Improved Technique for Reducing False Alarms Due to Soft Errors.Sandip Kundu, Ilia Polian
2005DATEEvolutionary Optimization in Code-Based Test Compression.Ilia Polian, Alejandro Czutro, Bernd Becker
2005ITCTransient fault characterization in dynamic noisy environments.Ilia Polian, John P. Hayes, Sandip Kundu, Bernd Becker
2005VTSResistive Bridge Fault Model Evolution from Conventional to Ultra Deep Submicron Technologies.Ilia Polian, Sandip Kundu, Jean-Marc Gallire, Piet Engelke, Michel Renovell, Bernd Becker
2004ETSAutomatic test pattern generation for resistive bridging faults.Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker
2004ITCX-Masking During Logic BIST and Its Impact on Defect Coverage.Yuyi Tang, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Piet Engelke, Ilia Polian, Bernd Becker
2004VTSThe Pros and Cons of Very-Low-Voltage Testing: An Analysis based on Resistive Bridging Faults.Piet Engelke, Ilia Polian, Michel Renovell, Bharath Seshadri, Bernd Becker
2003DATEEvolutionary Optimization of Markov Sources for Pseudo Random Scan BIST.Ilia Polian, Bernd Becker, Sudhakar M. Reddy
2003ETSModeling feedback bridging faults with non-zero resistance.Ilia Polian, Piet Engelke, Michel Renovell, Bernd Becker
2003ITCSimulating Resistive Bridging and Stuck-At Faults.Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker
2002ETSSimulating realistic bridging and crosstalk faults in an industrial setting.Jonathan Bradford, Hartmut Delong, Ilia Polian, Bernd Becker
2002IOLTSStop & Go BIST.Ilia Polian, Bernd Becker
2002IOLTSSequential n -Detection Criteria: Keep It Simple.Ilia Polian, Martin Keim, Nicolai Mallig, Bernd Becker
2001VTSMultiple Scan Chain Design for Two-Pattern Testing.Ilia Polian, Bernd Becker
1999ETSA scalable BIST architecture for delay faults.Martin Keim, Ilia Polian, Harry Hengster, Bernd Becker