Piet Engelke
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
22
Venues
8
Active years
2000–2020
Best venue rank
A*
Where they publish
Papers
22 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2020 | ITC | IJTAG Through a Two-Pin Chip Interface. | Manu Baby, Bernd Bttner, Piet Engelke, Ulrike Pfannkuchen, Reinhard Meier, Jonathan Gaudet, Jean-Franois Ct, Givargis Danialy, Martin Keim, Lori Schramm |
| 2017 | DATE | BASTION: Board and SoC test instrumentation for ageing and no failure found. | Artur Jutman, Christophe Lotz, Erik Larsson, Matteo Sonza Reorda, Maksim Jenihhin, Jaan Raik, Hans G. Kerkhoff, Rene Krenz-Baath, Piet Engelke |
| 2014 | DAC | Advanced Diagnosis: SBST and BIST Integration in Automotive E/E Architectures. | Felix Reimann, Michael Gla, Jrgen Teich, Alejandro Cook, Laura Rodrguez Gmez, Dominik Ull, Hans-Joachim Wunderlich, Piet Engelke, Ulrich Abelein |
| 2014 | DATE | Non-intrusive integration of advanced diagnosis features in automotive E/E-architectures. | Ulrich Abelein, Alejandro Cook, Piet Engelke, Michael Gla, Felix Reimann, Laura Rodrguez Gmez, Thomas Russ, Jrgen Teich, Dominik Ull, Hans-Joachim Wunderlich |
| 2013 | DDECS | On the feasibility of combining on-line-test and self repair for logic circuits. | Tobias Koal, Markus Ulbricht, Piet Engelke, Heinrich Theodor Vierhaus |
| 2012 | DSD | Scan Based Tests via Standard Interfaces. | Christian Gleichner, Heinrich Theodor Vierhaus, Piet Engelke |
| 2012 | ETS | Funding project DIANA - Integrated diagnostics for the analysis of electronic failures in vehicles. | Piet Engelke, Hermann Obermeir |
| 2009 | VLSID | TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis. | Alejandro Czutro, Ilia Polian, Matthew Lewis, Piet Engelke, Sudhakar M. Reddy, Bernd Becker |
| 2009 | VTS | An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects. | Nicolas Houarche, Mariane Comte, Michel Renovell, Alejandro Czutro, Piet Engelke, Ilia Polian, Bernd Becker |
| 2008 | DATE | Resistive Bridging Fault Simulation of Industrial Circuits. | Piet Engelke, Ilia Polian, Jrgen Schlffel, Bernd Becker |
| 2008 | DDECS | Diagnosis of Realistic Defects Based on the X-Fault Model. | Ilia Polian, Kohei Miyase, Yusuke Nakamura, Seiji Kajihara, Piet Engelke, Bernd Becker, Stefan Spinner, Xiaoqing Wen |
| 2008 | ETS | A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. | Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, Michel Renovell, Bernd Becker |
| 2008 | ITC | Extraction, Simulation and Test Generation for Interconnect Open Defects Based on Enhanced Aggressor-Victim Model. | Stefan Hillebrecht, Ilia Polian, Piet Engelke, Bernd Becker, Martin Keim, Wu-Tung Cheng |
| 2008 | VTS | Automatic Test Pattern Generation for Interconnect Open Defects. | Stefan Spinner, Ilia Polian, Piet Engelke, Bernd Becker, Martin Keim, Wu-Tung Cheng |
| 2005 | ETS | A unified fault model and test generation procedure for interconnect opens and bridges. | Gang Chen, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski, Piet Engelke, Bernd Becker |
| 2005 | VTS | Resistive Bridge Fault Model Evolution from Conventional to Ultra Deep Submicron Technologies. | Ilia Polian, Sandip Kundu, Jean-Marc Gallire, Piet Engelke, Michel Renovell, Bernd Becker |
| 2004 | ETS | Automatic test pattern generation for resistive bridging faults. | Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker |
| 2004 | ITC | X-Masking During Logic BIST and Its Impact on Defect Coverage. | Yuyi Tang, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Piet Engelke, Ilia Polian, Bernd Becker |
| 2004 | VTS | The Pros and Cons of Very-Low-Voltage Testing: An Analysis based on Resistive Bridging Faults. | Piet Engelke, Ilia Polian, Michel Renovell, Bharath Seshadri, Bernd Becker |
| 2003 | ETS | Modeling feedback bridging faults with non-zero resistance. | Ilia Polian, Piet Engelke, Michel Renovell, Bernd Becker |
| 2003 | ITC | Simulating Resistive Bridging and Stuck-At Faults. | Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker |
| 2000 | ETS | A parameterizable fault simulator for bridging faults. | Piet Engelke, Bernd Becker, Martin Keim |