On the Detectability of Scan Chain Internal Faults - An Industrial Case Study.
Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz
Browse the full VTS paper archive.
Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz
Browse the full VTS paper archive.