Narendra Devta-Prasanna
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
15
Venues
6
Active years
2005–2012
Best venue rank
A
Where they publish
Papers
15 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2012 | VTS | Silicon evaluation of faster than at-speed transition delay tests. | Sreejit Chakravarty, Narendra Devta-Prasanna, Arun Gunda, Junxia Ma, Fan Yang, H. Guo, R. Lai, D. Li |
| 2012 | VTS | A novel method for fast identification of peak current during test. | Wei Zhao, Sreejit Chakravarty, Junxia Ma, Narendra Devta-Prasanna, Fan Yang, Mohammad Tehranipoor |
| 2010 | ITC | Clock Gate Test Points. | Narendra Devta-Prasanna, Arun Gunda |
| 2010 | ITC | Multiple fault activation cycle tests for transistor stuck-open faults. | Narendra Devta-Prasanna, Arun Gunda, Sudhakar M. Reddy, Irith Pomeranz |
| 2009 | ASPDAC | Detectability of internal bridging faults in scan chains. | Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz |
| 2009 | ITC | Accurate measurement of small delay defect coverage of test patterns. | Narendra Devta-Prasanna, Sandeep Kumar Goel, Arun Gunda, Mark Ward, P. Krishnamurthy |
| 2009 | ITC | Comparing the effectiveness of deterministic bridge fault and multiple-detect stuck fault patterns for physical bridge defects: A simulation and silicon study. | Sandeep Kumar Goel, Narendra Devta-Prasanna, Mark Ward |
| 2009 | VTS | Effective and Efficient Test Pattern Generation for Small Delay Defect. | Sandeep Kumar Goel, Narendra Devta-Prasanna, Ritesh P. Turakhia |
| 2008 | IOLTS | An Enhanced Logic BIST Architecture for Online Testing. | Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz |
| 2008 | ITC | Detection of Internal Stuck-open Faults in Scan Chains. | Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz |
| 2008 | VTS | On the Detectability of Scan Chain Internal Faults - An Industrial Case Study. | Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz |
| 2007 | ASPDAC | Systematic Scan Reconfiguration. | Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda |
| 2006 | ETS | A Unified Method to Detect Transistor Stuck-Open Faults and Transition Delay Faults. | Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz |
| 2005 | ICCD | A Novel Method of Improving Transition Delay Fault Coverage Using Multiple Scan Enable Signals. | Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz |
| 2005 | ITC | Methods for improving transition delay fault coverage using broadside tests. | Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz |