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Aida Todri

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

20

Venues

9

Active years

2007–2014

Best venue rank

B

Where they publish

Papers

20 indexed papers, newest first.

YearVenueTitleAuthors
2014DDECSTest and diagnosis of power switches.Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri, Arnaud Virazel, Patrick Girard, P. Debaud, S. Guilhot
2014DDECSProtecting combinational logic in pipelined microprocessor cores against transient and permanent faults.Imran Wali, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri
2014ETSiBoX - Jitter based Power Supply Noise sensor.Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri, Arnaud Virazel, Patrick Girard, P. Debaud, S. Guilhot
2013DATETest solution for data retention faults in low-power SRAMs.Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2013ETSAnalyzing resistive-open defects in SRAM core-cell under the effect of process variability.Elena I. Vatajelu, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2013IOLTSSRAM soft error rate evaluation under atmospheric neutron radiation and PVT variations.Georgios Tsiligiannis, Elena I. Vatajelu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Frederic Wrobel, Frdric Saign
2013ITCOn the reuse of read and write assist circuits to improve test efficiency in low-power SRAMs.Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2013VTSA built-in scheme for testing and repairing voltage regulators of low-power srams.Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2012ETSCoupling-based resistive-open defects in TAS-MRAM architectures.Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Guillaume Prenat, Jrmy Alvarez-Herault, Ken Mackay
2012ETSThrough-Silicon-Via resistive-open defect analysis.Carolina Metzler, Aida Todri, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel
2012ETSDefect analysis in power mode control logic of low-power SRAMs.Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2012IOLTSEvaluation of test algorithms stress effect on SRAMs under neutron radiation.Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri, Arnaud Virazel, Antoine D. Touboul, Frederic Wrobel, Frdric Saign
2012ITCLow-power SRAMs power mode control logic: Failure analysis and test solutions.Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2012VTSA pseudo-dynamic comparator for error detection in fault tolerant architectures.D. A. Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Michael E. Imhof, Hans-Joachim Wunderlich
2011DDECSA study of path delay variations in the presence of uncorrelated power and ground supply noise.Aida Todri, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
2009ISLPEDElectromigration study of power-gated grids.Aida Todri, Malgorzata Marek-Sadowska
2008ICCADPower supply noise aware workload assignment for multi-core systems.Aida Todri, Malgorzata Marek-Sadowska, Joseph N. Kozhaya
2008ICCDA study of reliability issues in clock distribution networks.Aida Todri, Malgorzata Marek-Sadowska
2007ICCADAnalysis and optimization of power-gated ICs with multiple power gating configurations.Aida Todri, Malgorzata Marek-Sadowska, Shih-Chieh Chang
2007ISLPEDElectromigration and voltage drop aware power grid optimization for power gated ICs.Aida Todri, Shih-Chieh Chang, Malgorzata Marek-Sadowska