| 2017 | ITC | DFM-aware fault model and ATPG for intra-cell and inter-cell defects. | Arani Sinha, Sujay Pandey, Ayush Singhal, Alodeep Sanyal, Alan Schmaltz |
| 2014 | VTS | Special session 11C: Young professionals in test - Elevator talks. | Alodeep Sanyal, Yanjing Li |
| 2014 | VTS | Special session 12C: Young professionals in test - Town meeting. | Alodeep Sanyal, Yanjing Li, Yervant Zorian |
| 2013 | VTS | Special session 12C: Town-hall meeting "young professionals in test". | Alodeep Sanyal, Yervant Zorian |
| 2010 | ITC | RT-level design-for-testability and expansion of functional test sequences for enhanced defect coverage. | Alodeep Sanyal, Krishnendu Chakrabarty, Mahmut Yilmaz, Hideo Fujiwara |
| 2008 | DATE | On Modeling and Testing of Lithography Related Open Faults in Nano-CMOS Circuits. | Aswin Sreedhar, Alodeep Sanyal, Sandip Kundu |
| 2008 | IOLTS | A Built-In Self-Test Scheme for Soft Error Rate Characterization. | Alodeep Sanyal, Syed M. Alam, Sandip Kundu |
| 2007 | IOLTS | Accelerating Soft Error Rate Testing Through Pattern Selection. | Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu |
| 2007 | IOLTS | On Derating Soft Error Probability Based on Strength Filtering. | Alodeep Sanyal, Sandip Kundu |
| 2007 | VLSID | An Efficient Technique for Leakage Current Estimation in Sub 65nm Scaled CMOS Circuits Based on Loading Effect. | Ashesh Rastogi, Wei Chen, Alodeep Sanyal, Sandip Kundu |
| 2006 | ICCD | A Pattern Generation Technique for Maximizing Power Supply Currents. | Kunal P. Ganeshpure, Alodeep Sanyal, Sandip Kundu |
| 2005 | CEC | Dynamic power minimization during combinational circuit testing as a traveling salesman problem. | Artem Sokolov, Alodeep Sanyal, L. Darrell Whitley, Yashwant K. Malaiya |