| 2018 | ISCAS | Concurrent Sampling with Local Digitization - An Alternative to Analog Test Bus. | Nanqi Liu, Shravan K. Chaganti, Zhiqiang Liu, Degang Chen, Amitava Majumdar |
| 2017 | IOLTS | Field profiling & monitoring of payload transistors in FPGAs. | Da Cheng, Amitava Majumdar, Xiaobao Wang, Nui Chong |
| 2017 | ISCAS | A digital clock-less pulse stretcher with application in deep sub-nanosecond pulse detection. | Zhiqiang Liu, Nanqi Liu, Shravan K. Chaganti, Degang Chen, Amitava Majumdar |
| 2014 | ETS | Avoiding burnt probe tips: Practical solutions for testing internally regulated power supplies. | Richard Swanson, Anna Wong, Suraj Ethirajan, Amitava Majumdar |
| 2014 | VTS | Innovative practices session 3C: Solving today's test challenges. | John Kim, Wolfgang Meyer, T. M. Mak, Amitava Majumdar |
| 2014 | VTS | Innovative practices session 4C: Disruptive solutions in the non-digital world. | Amitava Majumdar, Suriya Natarajan, Stephen K. Sunter, Prashant Goteti, Ke Huang |
| 2014 | VTS | Hot topic session 9C: Test and fault tolerance for emerging memory technologies. | Suriya Natarajan, Amitava Majumdar, Jeyavijayan Rajendran |
| 2012 | VTS | Power Characterization of Embedded SRAMs for Power Binning. | Yang Zhao, Lisa Grenier, Amitava Majumdar |
| 2011 | VTS | A Novel mechanism for speed characterization during delay test. | Amitava Majumdar, Arani Sinha, Nehal Patel, Ramamurthy Setty, Yan Dong, Shu-Hsuan Chou |
| 2011 | VTS | Special session 5B: Panel How much toggle activity should we be testing with? | Xiaoqing Wen, Mohammad Tehranipoor, Rohit Kapur, Anand Bhat, Amitava Majumdar, LeRoy Winemberg |
| 2010 | ICS | Quantifying performance benefits of overlap using MPI-2 in a seismic modeling application. | Sreeram Potluri, Ping Lai, Karen A. Tomko, Sayantan Sur, Yifeng Cui, Mahidhar Tatineni, Karl W. Schulz, William L. Barth, Amitava Majumdar, Dhabaleswar K. Panda |
| 2009 | VTS | Panel: Analog Characterization and Test: The Long Road to Realization. | Arani Sinha, Amitava Majumdar, Vasu Ganti |
| 2007 | ICCS | Enabling Very-Large Scale Earthquake Simulations on Parallel Machines. | Yifeng Cui, Reagan W. Moore, Kim B. Olsen, Amit Chourasia, Philip Maechling, Bernard Minster, Steven M. Day, Yuanfang Hu, Jing Zhu, Amitava Majumdar, Thomas H. Jordan |
| 2006 | DAC | Hold time validation on silicon and the relevance of hazards in timing analysis. | Amitava Majumdar, Wei-Yu Chen, Jun Guo |
| 2006 | ICPADS | On-Demand High Performance Computing: Image Guided Neuro-Surgery Feasibility Study. | Tharaka Devadithya, Kim K. Baldridge, Adam Birnbaum, Amitava Majumdar, Dong Ju Choi, Richard Wolski, Simon K. Warfield, Neculai Archip |
| 2005 | ICCS | A Dynamic Data Driven Grid System for Intra-operative Image Guided Neurosurgery. | Amitava Majumdar, Adam Birnbaum, Dong Ju Choi, Abhishek Trivedi, Simon K. Warfield, Kim K. Baldridge, Petr Krysl |
| 2003 | ITC | Instruction Based BIST for Board/System Level Test of External Memories and Internconnects. | Olivier Caty, Ismet Bayraktaroglu, Amitava Majumdar, Richard Lee, John Bell, Lisa Curhan |
| 2002 | ITC | A Scalable, Low Cost Design-for-Test Architecture for UltraSPARC | Ishwar Parulkar, Thomas A. Ziaja, Rajesh Pendurkar, Anand D'Souza, Amitava Majumdar |
| 2001 | ICCD | Automatic Generation and Validation of Memory Test Models for High Performance Microprocessors. | Kamran Zarrineh, Thomas A. Ziaja, Amitava Majumdar |
| 1998 | VTS | Ground Bounce Considerations in DC Parametric Test Generation Using Boundary Scan. | Amitava Majumdar, Michio Komoda, Tim Ayres |
| 1996 | DATE | Deterministic Test Pattern Reproduction by a Counter. | Dimitrios Kagaris, Spyros Tragoudas, Amitava Majumdar |
| 1994 | ICCD | WRAPTure: A Tool for Evaluation and Optimization of Weights for Weighted Random Pattern Testing. | Amitava Majumdar |
| 1993 | VLSID | Statistical Analysis of Controllability. | Amitava Majumdar, Sarma Sastry |
| 1992 | DAC | On the Distribution of Fault Coverage and Test length in Random Testing of Combinational Circuits. | Amitava Majumdar, Sarma Sastry |
| 1991 | DAC | A Branching Process Model for Observability Analysis of Combinational Circuits. | Sarma Sastry, Amitava Majumdar |
| 1988 | ICCD | Fault tolerance and testing aspects of an architecture for a generalized sidelobe cancellor. | Melvin A. Breuer, Amitava Majumdar, Cauligi S. Raghavendra |