| 2019 | VTS | Special Session (New Topic): Emerging Computing and Testing Techniques. | Max M. Shulaker, Laurent Lebrun, Bozena Kaminska, Bernard Courtois |
| 2018 | VTS | Special session on quantum systems: Next challenges in design, test, integration. | Carlo Reita, Jonathan Baugh, Gabriel Poulin-Lamarre, Bozena Kaminska, Bernard Courtois |
| 2014 | VTS | New topic session 2B: Co-design and reliability of power electronic modules - Current status and future challenges. | Bozena Kaminska, Bernard Courtois, Chris Bailey |
| 2014 | VTS | New topic session 7B: Challenges and opportunities in test and design for test (DFT) of MEMS sensors. | Bozena Kaminska, Bernard Courtois, Mary Ann Maher |
| 2013 | DATE | Panel: the heritage of Mead & Conway: what has remained the same, what was missed, what has changed, what lies ahead. | Marco Casale-Rossi, Alberto L. Sangiovanni-Vincentelli, Luca P. Carloni, Bernard Courtois, Hugo De Man, Antun Domic, Jan M. Rabaey |
| 2013 | VTS | New topic session 7B: Challenges and directions for ultra-low voltage VLSI circuits and systems: CMOS and beyond. | Bozena Kaminska, Bernard Courtois, Massimo Alioto |
| 2013 | VTS | New topic session 2B: Why (Re-)Designing Biology is ∗Slightly∗ more challenging than designing electronics. | Bozena Kaminska, Bernard Courtois, Soha Hassoun |
| 2009 | VLSID | Infrastructures for Education, Research and Industry in Microelectronics A Look Worldwide and a Look at India. | Bernard Courtois, Kholdoun Torki, Sophie Dumont, Sylvaine Eyraud, Jean-Franois Paillotin, Gregory di Pendina |
| 2009 | VTS | Microscale and Nanoscale Thermal Characterization of Integrated Circuit Chips. | Bernard Courtois, Ali Shakouri |
| 2009 | VTS | Special Session 8: New Topics: At-Speed Testing in the Face of Process Variations. | Bernard Courtois, Chandu Visweswariah |
| 2007 | DATE | Heterogeneous systems on chip and systems in package. | Ian O'Connor, Bernard Courtois, Krishnendu Chakrabarty, Nicolas Delorme, M. Hampton, J. Hartung |
| 2006 | VTS | Session Abstract. | Bernard Courtois |
| 2004 | VLSID | On-chip testing of embedded transducers. | Salvador Mir, Libor Rufer, Bernard Courtois |
| 2001 | VTS | Electrically Induced Stimuli For MEMS Self-Test. | Benot Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois |
| 1999 | ETS | Extending fault-based testing to microelectromechanical systems. | Salvador Mir, Benot Charlot, Bernard Courtois |
| 1999 | ITC | Fault modeling of suspended thermal MEMS. | Benot Charlot, Salvador Mir, rika F. Cota, Marcelo Lubaszewski, Bernard Courtois |
| 1999 | VLSID | Design and Test of MEMs. | Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimr Szkely, Mrta Rencz, Klaus Hofmann, Manfred Glesner |
| 1998 | DATE | Microsystems Testing: an Approach and Open Problems. | Marcelo Lubaszewski, rika F. Cota, Bernard Courtois |
| 1998 | ISLPED | 3D CMOS SOL for high performance computing. | Selim J. Abou-Samra, P. A. Aisa, Alain Guyot, Bernard Courtois |
| 1998 | ITC | Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems. | A. Castillejo, D. Veychard, Salvador Mir, Jean-Michel Karam, Bernard Courtois |
| 1997 | DAC | CAD and Foundries for Microsystems. | Jean-Michel Karam, Bernard Courtois, Hicham Boutamine, Paul Drake, Andrs Poppe, Vladimr Szkely, Mrta Rencz, Klaus Hofmann, Manfred Glesner |
| 1997 | DATE | Generation of the HDL-A-model of a micromembrane from its finite-element-description. | Klaus Hofmann, Manfred Glesner, Nicu Sebe, Anca Manuela Manolescu, Santiago Marco, Josep Samitier, Jean-Michel Karam, Bernard Courtois |
| 1997 | VTS | Integrating on-chip temperature sensors into DfT schemes and BIST architectures. | Vladimr Szkely, Mrta Rencz, Bernard Courtois |
| 1996 | DATE | High level CAD melds microsystems with foundries. | Jean-Michel Karam, Bernard Courtois, M. Bauge |
| 1996 | DATE | Applied design and analysis of microsystems. | Jean-Michel Karam, Bernard Courtois, Andrs Poppe, Klaus Hofmann, Mrta Rencz, Manfred Glesner, Vladimr Szkely |
| 1996 | DATE | Automatic Test Generation for Maximal Diagnosis of Linear Analogue Circuits. | Salvador Mir, Bernard Courtois, Marcelo Lubaszewski, Vladimir Kolarik |
| 1995 | DATE | Mixed-signal circuits and boards for high safety applications. | Marcelo Lubaszewski, Vladimir Kolarik, Salvador Mir, C. Nielsen, Bernard Courtois |
| 1995 | VTS | Frequency-based BIST for analog circuit testin. | Khaled Saab, Bozena Kaminska, Bernard Courtois, Marcelo Lubaszewski |
| 1994 | ICCAD | Built-in self-test and fault diagnosis of fully differential analogue circuits. | Salvador Mir, Vladimir Kolarik, Marcelo Lubaszewski, C. Nielsen, Bernard Courtois |
| 1994 | VTS | Designing self-exercising analogue checkers. | Vladimir Kolarik, Marcelo Lubaszewski, Bernard Courtois |
| 1993 | ICCD | Quiescent Current Monitoring to Improve the Reliability of Electronic Systems in Space Radiation Environments. | F. L. Vargas, Michael Nicolaidis, Bernard Courtois |
| 1992 | ITC | Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift Registers. | Sybille Hellebrand, Steffen Tarnick, Bernard Courtois, Janusz Rajski |
| 1992 | ITC | On the Design of Self-Checking Boundary Scannable Boards. | Marcelo Lubaszewski, Bernard Courtois |
| 1992 | VLSID | Towards System level modeling and synthesis. | Ahmed Amine Jerraya, Kevin O'Brien, Inhag Park, Bernard Courtois |
| 1991 | ICCAD | Built-In Self-Test for Multi-Port RAMs. | Vladimir Castro Alves, Michael Nicolaidis, P. Lestrat, Bernard Courtois |
| 1991 | ITC | Coupling Electron-Beam Probing with Knowledge-Based Fault Localization. | M. Marzouki, J. Laurent, Bernard Courtois |
| 1988 | ICCD | UBIST version of the SYCO's control section compiler. | Kholdoun Torki, Michael Nicolaidis, Ahmed Amine Jerraya, Bernard Courtois |
| 1988 | ITC | Fault Simulation and Test Pattern Generation at the Multiple-Valued Switch Level. | Jean Paul Caisso, Bernard Courtois |
| 1986 | DAC | Principles of the SYCO compiler. | Ahmed Amine Jerraya, Patrick Varinot, Robert Jamier, Bernard Courtois |
| 1986 | ITC | Towards Automatic Failure Analysis of Complex ICs Through E-Beam Testing. | J. Laurent, L. Bergher, Bernard Courtois, Jacques P. Collin |
| 1981 | ITC | Analytical Testing of Data Processing Sections of Integrated CPUs. | Bernard Courtois |
| 1975 | MICRO | On balancing hardware-firmware for designing a fault-tolerant computers' series. | Bernard Courtois, Gabriele Saucier |