| 2009 | CATA | Single Event Upset Detection and Correction in Virtex-4 and Virtex-5 FPGAs. | Bradley F. Dutton, Charles E. Stroud |
| 2009 | CATA | Built-in Self-Test for Memory Resources in Virtex-4 Field Programmable Gate Arrays. | Brooks R. Garrison, Daniel T. Milton, Charles E. Stroud |
| 2007 | ISCAS | Noise Figure Measurement Using Mixed-Signal BIST. | Jie Qin, Charles E. Stroud, Foster F. Dai |
| 2006 | ISCAS | Analog frequency response measurement in mixed-signal systems. | Charles E. Stroud, Dayu Yang, Foster F. Dai |
| 2005 | CATA | On-Chip BIST-Based Diagnosis of Embedded Programmable Logic Cores in System-on-Chip Devices. | Charles E. Stroud, Srinivas M. Garimella, John Sunwoo |
| 2005 | ISCAS | Built-in self-test for automatic analog frequency response measurement. | Dayu Yang, Foster F. Dai, Charles E. Stroud |
| 2004 | ITC | Automatic Linearity (IP3) Test with Built-in Pattern Generator and Analyzer. | Foster F. Dai, Charles E. Stroud, Dayu Yang, Shuying Qi |
| 2004 | ITC | Built-In Self-Test for System-on-Chip: A Case Study. | Charles E. Stroud, John Sunwoo, Srinivas M. Garimella, Jonathan Harris |
| 2003 | ITC | BIST for Xilinx 4000 and Spartan Series FPGAs: A Case Study. | Charles E. Stroud, Keshia N. Leach, Thomas A. Slaughter |
| 2002 | DAC | Using embedded FPGAs for SoC yield improvement. | Miron Abramovici, Charles E. Stroud, John Marty Emmert |
| 2002 | IOLTS | BIST-Based Delay-Fault Testing in FPGAs. | Miron Abramovici, Charles E. Stroud |
| 2002 | ITC | BIST-Based Diagnosis of FPGA Interconnect. | Charles E. Stroud, Jeremy Nall, Matthew Lashinsky, Miron Abramovici |
| 2001 | IOLTS | On-Line BIST and Diagnosis of FPGA Interconnect Using Roving STARs. | Miron Abramovici, Charles E. Stroud, Matthew Lashinsky, Jeremy Nall, John Marty Emmert |
| 2001 | VTS | Analog and Mixed Signal Benchmark Circuit Development: Who Needs Them? | Henry Chang, Steve Dollens, Gordon W. Roberts, Charles E. Stroud, Mani Soma, Jacob A. Abraham |
| 2000 | FCCM | Dynamic Fault Tolerance in FPGAs via Partial Reconfiguration. | John Marty Emmert, Charles E. Stroud, Brandon Skaggs, Miron Abramovici |
| 2000 | FPL | Performance Penalty for Fault Tolerance in Roving STARs. | John Marty Emmert, Charles E. Stroud, Jason A. Cheatham, Andrew M. Taylor, Pankaj Kataria, Miron Abramovici |
| 2000 | IOLTS | Improving On-Line BIST-Based Diagnosis for Roving STARs. | Miron Abramovici, Charles E. Stroud, Brandon Skaggs, John Marty Emmert |
| 2000 | ITC | DIST-based detection and diagnosis of multiple faults in FPGAs. | Miron Abramovici, Charles E. Stroud |
| 2000 | ITC | Bridging fault extraction from physical design data for manufacturing test development. | Charles E. Stroud, John Marty Emmert, John R. Bailey, Khushru S. Chhor, Dragan Nikolic |
| 1999 | ITC | Using roving STARs for on-line testing and diagnosis of FPGAs in fault-tolerant applications. | Miron Abramovici, Charles E. Stroud, Carter Hamilton, Sajitha Wijesuriya, Vinay Verma |
| 1999 | VTS | Enhanced Bist-Based Diagnosis of FPGAs via Boundary Scan Access. | Carter Hamilton, Gretchen Gibson, Sajitha Wijesuriya, Charles E. Stroud |
| 1998 | ITC | Built-in self-test of FPGA interconnect. | Charles E. Stroud, Sajitha Wijesuriya, Carter Hamilton, Miron Abramovici |
| 1998 | VTS | Applying Built-In Self-Test to Majority Voting Fault Tolerant Circuits. | Charles E. Stroud, Joe K. Tannehill Jr. |
| 1997 | ITC | A Parameterized VHDL Library for On-Line Testing. | Charles E. Stroud, M. Ding, S. Seshadri, Ramesh Karri, I. Kim, Subhajit Roy, S. Wu |
| 1997 | ITC | BIST-Based Diagnostics of FPGA Logic Blocks. | Charles E. Stroud, Eric Lee, Miron Abramovici |
| 1996 | FPGA | Evaluation of FPGA Resources for Built-In Self-Test of Programmable Logic Blocks. | Charles E. Stroud, Ping Chen, Srinivasa Konala, Miron Abramovici |
| 1996 | ITC | Using ILA Testing for BIST in FPGAs. | Charles E. Stroud, Eric Lee, Srinivasa Konala, Miron Abramovici |
| 1996 | VTS | Built-in self-test of logic blocks in FPGAs (Finally, a free lunch: BIST without overhead!). | Charles E. Stroud, Srinivasa Konala, Ping Chen, Miron Abramovici |
| 1995 | ASPDAC | A built-in self test scheme for VLSI. | T. Raju Damarla, Wei Su, Gerald T. Michael, Moon J. Chung, Charles E. Stroud |
| 1995 | VTS | Improving the efficiency of error identification via signature analysis. | Charles E. Stroud, T. Raju Damarla |
| 1991 | ITC | Built-In Self-Test for High-Speed Data-Path Circuitry. | Charles E. Stroud |
| 1991 | ITC | Distractions in Design for Testability and Built-Is Self-Test. | Charles E. Stroud |
| 1990 | ICPP | Parallel Processing and Hardware Acceleration for Synthesis of VLSI Devices from Behavioral Models. | Charles E. Stroud, Ahmed E. Barbour |
| 1989 | ITC | Design for Testability and Test Generation for Static Redundancy System Level Fault-Tolerant Circuits. | Charles E. Stroud, Ahmed E. Barbour |
| 1988 | DAC | An Automated BIST Approach for General Sequential Logic Synthesis. | Charles E. Stroud |