Florian Cacho
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
16
Venues
5
Active years
2015–2023
Best venue rank
C
Where they publish
Papers
16 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2023 | IOLTS | Minimum SRAM Retention Voltage: Insight about optimizing Power Efficiency across Temperature Profile, Process Variation and Aging. | Yunus Emre Aslan, Florian Cacho, T. Kumar, D. K. Janardan, A. Kumar, F. Giner, M. Faurichon, Lorena Anghel |
| 2022 | VLSID | 40nm Ultra-low Leakage SRAM with Embedded Sub-threshold Analog Closed Loop System for Efficient Source Biasing of the Memory Array in Retention Mode. | Kedar Janardan Dhori, Promod Kumar, Christophe Lecocq, Pascal Urard, Olivier Callen, Florian Cacho, Maryline Parra, Prashant Pandey, Daniel Noblet |
| 2019 | IOLTS | Global and Local Process Variation Simulations in Design for Reliability approach. | Audrey Michard, Florian Cacho, Damien Celeste, Xavier Federspiel |
| 2018 | DATE | NBTI aged cell rejuvenation with back biasing and resulting critical path reordering for digital circuits in 28nm FDSOI. | Ajith Sivadasan, Riddhi Jitendrakumar Shah, Vincent Huard, Florian Cacho, Lorena Anghel |
| 2018 | IOLTS | Integrated Test Structures for Reliability Investigation under Dynamic Stimuli. | Florian Cacho, D. Nouguier, M. Arabi, X. Federspiel, Y. Carminati, M. Saliva |
| 2017 | DATE | Workload dependent reliability timing analysis flow. | Ajith Sivadasan, Armelle Notin, Vincent Huard, Etienne Maurin, Souhir Mhira, Florian Cacho, Lorena Anghel |
| 2017 | IOLTS | Investigation of critical path selection for in-situ monitors insertion. | Florian Cacho, Ahmed Benhassain, Riddhi Jitendrakumar Shah, Souhir Mhira, Vincent Huard, Lorena Anghel |
| 2017 | IOLTS | Dynamic aging compensation and Safety measures in Automotive environment. | Souhir Mhira, Vincent Huard, Ahmed Benhassain, Florian Cacho, Sylvie Naudet, Abhishek Jain, C. R. Parthasarathy, Alain Bravaix |
| 2017 | ITC | Cognitive approach to support dynamic aging compensation. | Souhir Mhira, Vincent Huard, Ahmed Benhassain, Florian Cacho, David Meyer, Sylvie Naudet, Abhishek Jain, C. R. Parthasarathy, Alain Bravaix |
| 2016 | DATE | Early failure prediction by using in-situ monitors: Implementation and application results. | Ahmed Benhassain, Florian Cacho, Vincent Huard, Lorena Anghel |
| 2016 | DATE | Study of workload impact on BTI HCI induced aging of digital circuits. | Ajith Sivadasan, Florian Cacho, Sidi Ahmed Benhassain, Vincent Huard, Lorena Anghel |
| 2016 | DATE | Workload Impact on BTI HCI Induced Aging of Digital Circuits: A System level Analysis. | Ajith Sivadasan, Florian Cacho, Sidi Ahmed Benhassain, Vincent Huard, Lorena Anghel |
| 2016 | IOLTS | Hot-carrier and BTI damage distinction for high performance digital application in 28nm FDSOI and 28nm LP CMOS nodes. | Alain Bravaix, M. Saliva, Florian Cacho, X. Federspiel, Cheikh Ndiaye, Souhir Mhira, Edith Kussener, E. Pauly, Vincent Huard |
| 2016 | IOLTS | Activity profiling: Review of different solutions to develop reliable and performant design. | Florian Cacho, Ahmed Benhassain, Souhir Mhira, Ajith Sivadasan, Vincent Huard, P. Cathelin, Vincent Knopik, Abhishek Jain, C. R. Parthasarathy, Lorena Anghel |
| 2016 | VTS | Early system failure prediction by using aging in situ monitors: Methodology of implementation and application results. | Lorena Anghel, Ahmed Benhassain, Ajith Sivadasan, Florian Cacho, Vincent Huard |
| 2015 | DATE | Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI. | M. Saliva, Florian Cacho, Vincent Huard, X. Federspiel, D. Angot, Ahmed Benhassain, Alain Bravaix, Lorena Anghel |