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Manuel J. Barragn

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

26

Venues

6

Active years

2015–2026

Best venue rank

B

Where they publish

Papers

26 indexed papers, newest first.

YearVenueTitleAuthors
2026ETSExploration of Machine Learning-Based Test Methodologies in High-Volume Manufacturing RF Testing.Hakan Cetin, Alexandre Leon, Manuel J. Barragn, Philippe Ferrari
2026ETSOscillation-Based Test for mm-Wave Reflection-Type Phase Shifters.Marc Margalef-Rovira, Loc Vincent, Emmanuel Pistono, Sylvain Bourdel, Manuel J. Barragn, Philippe Ferrari
2024ISCASDynamic Analysis of RF CMOS Inverter-Based Ring Oscillators using an All-Region MOSFET Charge-Based Model in 28nm FD-SOI CMOS.Julien Poupon, Manuel J. Barragn, Andreia Cathelin, Sylvain Bourdel
2023ISCASPerformance benchmark of State-of-the-art Sub-6-GHz wideband LNAs Based on an Extensive Survey.Mohamed Khalil Bouchoucha, Mathieu Coustans, Manuel J. Barragn, Andreia Cathelin, Sylvain Bourdel
2023ISCASResistive Feedback LNA design using a 7-parameter design-oriented model for advanced technologies.Mohamed Khalil Bouchoucha, Dayana A. Pino-Monroy, Patrick Scheer, Philippe Cathelin, Jean-Michel Fournier, Manuel J. Barragn, Andreia Cathelin, Sylvain Bourdel
2023ISCASA harmonic cancellation-based high-frequency on-chip sinusoidal signal generator with calibration using a coarse-fine delay cell.Ankush Mamgain, Salvador Mir, Jai Narayan Tripathi, Manuel J. Barragn
2022ETSSpecial Session on RF/5G Test.William R. Eisenstadt, Mark Roos, Devin Morris, Jos Luis Gonzlez-Jimnez, Christopery Mounet, Manuel J. Barragn, Gildas Lger, Florent Cilici, Estelle Lauga-Larroze, Salvador Mir, Sylvain Bourdel, Marc Margalef-Rovira, Issa Alaji, Haitham Ghanem, Guillaume Ducournau, Christophe Gaquire
2022VTSInnovative Practices Track: Innovative Analog Circuit Testing Technologies.Chris Mangelsdorf, Manasa Madhvaraj, Salvador Mir, Manuel J. Barragn, Daisuke Iimori, Takayuki Nakatani, Shogo Katayama, Gaku Ogihara, Yujie Zhao, Jianglin Wei, Anna Kuwana, Kentaroh Katoh, Kazumi Hatayama, Haruo Kobayashi, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa
2021ETSAnalysis and mitigation of timing inaccuracies in high-frequency on-chip sinusoidal signal generators based on harmonic cancellation.Ankush Mamgain, Manuel J. Barragn, Salvador Mir
2020ETSOn-chip reduced-code static linearity test of VRenato S. Feitoza, Manuel J. Barragn, Antonio J. Gins, Salvador Mir
2020IOLTSA Comprehensive End-to-end Solution for a Secure and Dynamic Mixed-signal 1687 System.Michele Portolan, R. Silveira Feitoza, Ghislain Takam Tchendjou, Vincent Reynaud, Kalpana Senthamarai Kannan, Manuel J. Barragn, Emmanuel Simeu, Paolo Maistri, Lorena Anghel, Rgis Leveugle, Salvador Mir
2019DATEOn the use of causal feature selection in the context of machine-learning indirect test.Manuel J. Barragn, Gildas Lger, Florent Cilici, Estelle Lauga-Larroze, Sylvain Bourdel, Salvador Mir
2019ETSA 52 dB-SFDR 166 MHz sinusoidal signal generator for mixed-signal BIST applications in 28 nm FDSOI technology.Hani Malloug, Manuel J. Barragn, Salvador Mir
2019ISCASYield Recovery of mm-Wave Power Amplifiers using Variable Decoupling Cells and One-Shot Statistical Calibration.Florent Cilici, Manuel J. Barragn, Salvador Mir, Estelle Lauga-Larroze, Sylvain Bourdel, Gildas Lger
2018ETSAssisted test design for non-intrusive machine learning indirect test of millimeter-wave circuits.Florent Cilici, Manuel J. Barragn, Salvador Mir, Estelle Lauga-Larroze, Sylvain Bourdel
2018IOLTSReduced-code static linearity test of SAR ADCs using a built-in incremental ∑Δ converter.Renato S. Feitoza, Manuel J. Barragn, Salvador Mir, Daniel Dzahini
2018ISCASMixed-signal test automation: Are we there yet?Gildas Lger, Manuel J. Barragn
2018VTSAn oscillation-based test technique for on-chip testing of mm-wave phase shifters.Marc Margalef-Rovira, Manuel J. Barragn, Ekta Sharma, Philippe Ferrari, Emmanuel Pistono, Sylvain Bourdel
2017DATEOn the limits of machine learning-based test: A calibrated mixed-signal system case study.Manuel J. Barragn, Gildas Lger, Antonio J. Gins, Eduardo J. Peralas, Adoracin Rueda
2017ETSMixed-signal BIST computation offloading using IEEE 1687.Michele Portolan, Manuel J. Barragn, Rshdee Alhakim, Salvador Mir
2017VTSAnalysis of an efficient on-chip servo-loop technique for reduced-code static linearity test of pipeline ADCs.Guillaume Renaud, Marc Margalef-Rovira, Manuel J. Barragn, Salvador Mir
2016ETSLinearity test of high-speed high-performance ADCs using a self-testable on-chip generator.Antonio J. Gins, Eduardo J. Peralas, Gildas Lger, Adoracin Rueda, Guillaume Renaud, Manuel J. Barragn, Salvador Mir
2016ETSQuestioning the reliability of Monte Carlo simulation for machine learning test validation.Gildas Lger, Manuel J. Barragn
2015DATEFeature selection for alternate test using wrappers: application to an RF LNA case study.Manuel J. Barragn, Gildas Lger
2015ITCEvaluation of low-cost mixed-signal test techniques for circuits with long simulation times.Haralampos-G. D. Stratigopoulos, Manuel J. Barragn, Salvador Mir, Herv Le Gall, Neha Bhargava, Ankur Bal
2015VTSSpecial session: Hot topics: Statistical test methods.Manuel J. Barragn, Gildas Lger, Florence Azas, Ronald D. Blanton, Adit D. Singh, Stephen Sunter