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Mariane Comte

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

12

Venues

5

Active years

2003–2020

Best venue rank

B

Where they publish

Papers

12 indexed papers, newest first.

YearVenueTitleAuthors
2020IOLTSDevelopment and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs.Florence Azas, Serge Bernard, Mariane Comte, Bastien Deveautour, Sophie Dupuis, Hassan El Badawi, Marie-Lise Flottes, Patrick Girard, Vincent Kerzrho, Laurent Latorre, Franois Lefvre, Bruno Rouzeyre, Emanuele Valea, T. Vayssade, Arnaud Virazel
2017ETSDetection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions.Amit Karel, Florence Azas, Mariane Comte, Jean-Marc Gallire, Michel Renovell, Keshav Singh
2014DATENew implementions of predictive alternate analog/RF test with augmented model redundancy.Haithem Ayari, Florence Azas, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell
2014IOLTSSolutions for the self-adaptation of communicating systems in operation.Martin Andraud, Anthony Deluthault, Mouhamadou Dieng, Florence Azas, Serge Bernard, Philippe Cauvet, Mariane Comte, Thibault Kervaon, Vincent Kerzerho, Salvador Mir, Paul-Henri Pugliesi-Conti, Michel Renovell, Fabien Soulier, Emmanuel Simeu, Haralampos-G. D. Stratigopoulos
2013ETSImplementing model redundancy in predictive alternate test to improve test confidence.Haithem Ayari, Florence Azas, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell
2012ITCMaking predictive analog/RF alternate test strategy independent of training set size.Haithem Ayari, Florence Azas, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell
2012VTSSmart selection of indirect parameters for DC-based alternate RF IC testing.Haithem Ayari, Florence Azas, Serge Bernard, Mariane Comte, Michel Renovell, Vincent Kerzerho, Olivier Potin, Christophe Kelma
2009VTSAn Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects.Nicolas Houarche, Mariane Comte, Michel Renovell, Alejandro Czutro, Piet Engelke, Ilia Polian, Bernd Becker
2008ETSA Simulator of Small-Delay Faults Caused by Resistive-Open Defects.Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, Michel Renovell, Bernd Becker
2007ETS"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC.Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azas, Mariane Comte, Michel Renovell
2006ETS"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC.Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azas, Mariane Comte, Michel Renovell
2003ITCA New Methodology For ADC Test Flow Optimization.Serge Bernard, Mariane Comte, Florence Azas, Yves Bertrand, Michel Renovell