Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs.

Florence Azas, Serge Bernard, Mariane Comte, Bastien Deveautour, Sophie Dupuis, Hassan El Badawi, Marie-Lise Flottes, Patrick Girard, Vincent Kerzrho, Laurent Latorre, Franois Lefvre, Bruno Rouzeyre, Emanuele Valea, T. Vayssade, Arnaud Virazel

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