Florence Azas
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
45
Venues
7
Active years
1996–2022
Best venue rank
A*
Where they publish
Papers
45 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2022 | CCS | Leveraging Layout-based Effects for Locking Analog ICs. | Muayad J. Aljafar, Florence Azas, Marie-Lise Flottes, Samuel Pagliarini |
| 2021 | DATE | Digital test of ZigBee transmitters: Validation in industrial test environment. | Thibault Vayssade, Florence Azas, Laurent Latorre, Franois Lefvre |
| 2021 | ETS | Exploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuli. | Thibault Vayssade, Mouhamad Chehaitly, Florence Azas, Laurent Latorre, Franois Lefvre |
| 2020 | IOLTS | Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs. | Florence Azas, Serge Bernard, Mariane Comte, Bastien Deveautour, Sophie Dupuis, Hassan El Badawi, Marie-Lise Flottes, Patrick Girard, Vincent Kerzrho, Laurent Latorre, Franois Lefvre, Bruno Rouzeyre, Emanuele Valea, T. Vayssade, Arnaud Virazel |
| 2019 | ETS | Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled Acquisition. | T. Vayssade, Florence Azas, Laurent Latorre, Francois Lefevre |
| 2018 | IOLTS | Low-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATE. | T. Vayssade, Florence Azas, Laurent Latorre, Francois Lefevre |
| 2017 | ETS | Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions. | Amit Karel, Florence Azas, Mariane Comte, Jean-Marc Gallire, Michel Renovell, Keshav Singh |
| 2015 | DDECS | Embedded Test Instrument for On-Chip Phase Noise Evaluation of Analog/IF Signals. | Florence Azas, Stephane David-Grignot, Laurent Latorre, Francois Lefevre |
| 2015 | ETS | Analog test: Why still " la mode" after more than 25 years of research? | Florence Azas |
| 2015 | ETS | A new technique for low-cost phase noise production testing from 1-bit signal acquisition. | Stephane David-Grignot, Florence Azas, Laurent Latorre, Francois Lefevre |
| 2015 | VTS | Special session: Hot topics: Statistical test methods. | Manuel J. Barragn, Gildas Lger, Florence Azas, Ronald D. Blanton, Adit D. Singh, Stephen Sunter |
| 2014 | DATE | New implementions of predictive alternate analog/RF test with augmented model redundancy. | Haithem Ayari, Florence Azas, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell |
| 2014 | IOLTS | Solutions for the self-adaptation of communicating systems in operation. | Martin Andraud, Anthony Deluthault, Mouhamadou Dieng, Florence Azas, Serge Bernard, Philippe Cauvet, Mariane Comte, Thibault Kervaon, Vincent Kerzerho, Salvador Mir, Paul-Henri Pugliesi-Conti, Michel Renovell, Fabien Soulier, Emmanuel Simeu, Haralampos-G. D. Stratigopoulos |
| 2014 | ITC | Low-cost phase noise testing of complex RF ICs using standard digital ATE. | Stephane David-Grignot, Florence Azas, Laurent Latorre, Francois Lefevre |
| 2013 | ETS | Implementing model redundancy in predictive alternate test to improve test confidence. | Haithem Ayari, Florence Azas, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell |
| 2012 | ITC | Making predictive analog/RF alternate test strategy independent of training set size. | Haithem Ayari, Florence Azas, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell |
| 2012 | VTS | Smart selection of indirect parameters for DC-based alternate RF IC testing. | Haithem Ayari, Florence Azas, Serge Bernard, Mariane Comte, Michel Renovell, Vincent Kerzerho, Olivier Potin, Christophe Kelma |
| 2011 | DATE | An electrical test method for MEMS convective accelerometers: Development and evaluation. | Ahmed Amine Rekik, Florence Azas, Norbert Dumas, Frdrick Mailly, Pascal Nouet |
| 2010 | ETS | On the use of standard digital ATE for the analysis of RF signals. | Nicolas Pous, Florence Azas, Laurent Latorre, Jochen Rivoir |
| 2009 | DDECS | An analysis of the timing behavior of CMOS digital blocks under Simultaneous Switching Noise conditions. | Florence Azas, Yves Bertrand, Michel Renovell |
| 2008 | DDECS | A novel method for test and calibration of capacitive accelerometers with a fully electrical setup. | Norbert Dumas, Florence Azas, Frdrick Mailly, Andrew Richardson, Pascal Nouet |
| 2008 | IOLTS | On the Detection of SSN-Induced Logic Errors through On-Chip Monitoring. | Florence Azas, Laurent Larguier, Yves Bertrand, Michel Renovell |
| 2007 | ETS | "Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. | Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azas, Mariane Comte, Michel Renovell |
| 2006 | ETS | "Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. | Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azas, Mariane Comte, Michel Renovell |
| 2005 | ETS | Towards on-line testing of MEMS using electro-thermal excitation. | Frdrick Mailly, Florence Azas, Norbert Dumas, Laurent Latorre, Pascal Nouet |
| 2005 | VTS | On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor. | Norbert Dumas, Florence Azas, Laurent Latorre, Pascal Nouet |
| 2005 | VTS | Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays. | Gustavo Pereira, Antonio Andrade Jr., Tiago R. Balen, Marcelo Lubaszewski, Florence Azas, Michel Renovell |
| 2004 | ETS | Electrically-induced thermal stimuli for MEMS testing. | Norbert Dumas, Florence Azas, Laurent Latorre, Pascal Nouet |
| 2004 | ITC | Testing the Configurable Analog Blocks of Field Programmable Analog Arrays. | Tiago R. Balen, Antonio Andrade Jr., Florence Azas, Michel Renovell, Marcelo Lubaszewski |
| 2004 | VTS | An Approach to the Built-In Self-Test of Field Programmable Analog Arrays. | Tiago R. Balen, Antonio Andrade Jr., Florence Azas, Marcelo Lubaszewski, Michel Renovell |
| 2003 | ITC | A New Methodology For ADC Test Flow Optimization. | Serge Bernard, Mariane Comte, Florence Azas, Yves Bertrand, Michel Renovell |
| 2002 | ETS | A high accuracy triangle-wave signal generator for on-chip ADC testing. | Serge Bernard, Florence Azas, Yves Bertrand, Michel Renovell |
| 2002 | ETS | Modeling gate oxide short defects in CMOS minimum transistors. | Michel Renovell, Jean Marc Gallire, Florence Azas, Yves Bertrand |
| 2001 | DATE | Implementation of a linear histogram BIST for ADCs. | Florence Azas, Serge Bernard, Yves Bertrand, Michel Renovell |
| 2001 | ITC | Boolean and current detection of MOS transistor with gate oxide short. | Michel Renovell, Jean Marc Gallire, Florence Azas, Serge Bernard, Yves Bertrand |
| 2001 | VTS | A Low-Cost Adaptive Ramp Generator for Analog BIST Applications. | Florence Azas, Serge Bernard, Yves Bertrand, Xavier Michel, Michel Renovell |
| 2000 | DATE | Reuse of Existing Resources for Analog BIST of a Switch Capacitor Filte. | rika F. Cota, Michel Renovell, Florence Azas, Yves Bertrand, Luigi Carro, Marcelo Lubaszewski |
| 2000 | ETS | Towards an ADC BIST scheme using the histogram test technique. | Florence Azas, Serge Bernard, Y. Betrand, Michel Renovell |
| 2000 | VTS | Hardware Resource Minimization for Histogram-Based ADC BIST. | Michel Renovell, Florence Azas, Serge Bernard, Yves Bertrand |
| 1999 | ETS | Functional and structural testing of switched-current circuits. | Michel Renovell, Florence Azas, J.-C. Bodin, Yves Bertrand |
| 1999 | ITC | Optimal conditions for Boolean and current detection of floating gate faults. | Michel Renovell, Andr Ivanov, Yves Bertrand, Florence Azas, Sumbal Rafiq |
| 1998 | DATE | Optimized Implementations of the Multi-Configuration DFT Technique for Analog Circuits. | Michel Renovell, Florence Azas, Yves Bertrand |
| 1998 | VTS | Design-For-Testability for Switched-Current Circuits. | Florence Azas, Michel Renovell, Yves Bertrand, J.-C. Bodin |
| 1997 | DATE | On-chip analog output response compaction. | Michel Renovell, Florence Azas, Yves Bertrand |
| 1996 | VTS | The multi-configuration: A DFT technique for analog circuits. | Michel Renovell, Florence Azas, Yves Bertrand |