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Laurent Latorre

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

19

Venues

9

Active years

1999–2021

Best venue rank

B

Where they publish

Papers

19 indexed papers, newest first.

YearVenueTitleAuthors
2021DATEDigital test of ZigBee transmitters: Validation in industrial test environment.Thibault Vayssade, Florence Azas, Laurent Latorre, Franois Lefvre
2021ETSExploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuli.Thibault Vayssade, Mouhamad Chehaitly, Florence Azas, Laurent Latorre, Franois Lefvre
2020IOLTSDevelopment and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs.Florence Azas, Serge Bernard, Mariane Comte, Bastien Deveautour, Sophie Dupuis, Hassan El Badawi, Marie-Lise Flottes, Patrick Girard, Vincent Kerzrho, Laurent Latorre, Franois Lefvre, Bruno Rouzeyre, Emanuele Valea, T. Vayssade, Arnaud Virazel
2019ETSPower Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled Acquisition.T. Vayssade, Florence Azas, Laurent Latorre, Francois Lefevre
2018IOLTSLow-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATE.T. Vayssade, Florence Azas, Laurent Latorre, Francois Lefevre
2017EDUCONCombo of innovative educational approaches to teach industrial test to undergraduate students.Beatrice Pradarelli, Pascal Nouet, Laurent Latorre
2016EDUCONIndustrial test project oriented education.Beatrice Pradarelli, Pascal Nouet, Laurent Latorre
2015DDECSEmbedded Test Instrument for On-Chip Phase Noise Evaluation of Analog/IF Signals.Florence Azas, Stephane David-Grignot, Laurent Latorre, Francois Lefevre
2015ETSA new technique for low-cost phase noise production testing from 1-bit signal acquisition.Stephane David-Grignot, Florence Azas, Laurent Latorre, Francois Lefevre
2014ITCLow-cost phase noise testing of complex RF ICs using standard digital ATE.Stephane David-Grignot, Florence Azas, Laurent Latorre, Francois Lefevre
2012ICCADAn efficient control variates method for yield estimation of analog circuits based on a local model.Pierre-Francois Desrumaux, Yoan Dupret, Jens Tingleff, Sean Minehane, Mark Redford, Laurent Latorre, Pascal Nouet
2010ETSOn the use of standard digital ATE for the analysis of RF signals.Nicolas Pous, Florence Azas, Laurent Latorre, Jochen Rivoir
2010ISCASA low power interface circuit for resistive sensors with digital offset compensation.El Mehdi Boujamaa, Boris Alandry, Souha Hacine, Laurent Latorre, Frdrick Mailly, Pascal Nouet
2005ETSTowards on-line testing of MEMS using electro-thermal excitation.Frdrick Mailly, Florence Azas, Norbert Dumas, Laurent Latorre, Pascal Nouet
2005VTSOn-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor.Norbert Dumas, Florence Azas, Laurent Latorre, Pascal Nouet
2004ETSElectrically-induced thermal stimuli for MEMS testing.Norbert Dumas, Florence Azas, Laurent Latorre, Pascal Nouet
2002DATEOn the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical Systems.Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet
2002VTSEvaluation of the Oscillation-based Test Methodology for Micro-Electro-Mechanical Systems.Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet
1999DATEDesign, Characterization & Modelling of a CMOS Magnetic Field Sensor.Laurent Latorre, Yves Bertrand, P. Hazard, Francis Pressecq, Pascal Nouet