Skip to content

Masaki Hashizume

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

9

Venues

7

Active years

1988–2018

Best venue rank

National

Where they publish

Papers

9 indexed papers, newest first.

YearVenueTitleAuthors
2018IOLTSA Sequentially Untestable Fault Identification Method Based on n-Bit State Cube Justification.Toshinori Hosokawa, Morito Niseki, Masayoshi Yoshimura, Hiroshi Yamazaki, Masayuki Arai, Hiroyuki Yotsuyanagi, Masaki Hashizume
2010ETSCurrent-based testable design of level shifters in liquid crystal display drivers.Masaki Hashizume, Kazuya Nakaminami, Hiroyuki Yotsuyanagi, Yukinori Nakajima, Kozo Kinoshita
2009VLSIDA Novel Approach for Improving the Quality of Open Fault Diagnosis.Koji Yamazaki, Toshiyuki Tsutsumi, Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume
2009VLSIDFault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC.Hiroyuki Yotsuyanagi, Masaki Hashizume, Toshiyuki Tsutsumi, Koji Yamazaki, Takashi Aikyo, Yoshinobu Higami, Hiroshi Takahashi, Yuzo Takamatsu
2005ISCASElectric field for detecting open leads in CMOS logic circuits by supply current testing.Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada
2001DATECMOS open defect detection by supply current test.Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada
1994ISCASA Maximum Clique Derivation Algorithm for Simplification of Incompletely Specified Machines.Masaki Hashizume, Takeomi Tamesada, Akio Sakamoto
1990ICCDA parameter adjustment method for analog circuits based on convex fuzzy decision using constraints of satisfactory level.Masaki Hashizume, Takeomi Tamesada, Koji Nii
1988ITCFault Detection of Combinational Circuits Based on Supply Current.Masaki Hashizume, Takeomi Tamesada, Kazuhiro Yamada, Masaaki Kawakami