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A Novel Approach for Improving the Quality of Open Fault Diagnosis.

Koji Yamazaki, Toshiyuki Tsutsumi, Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume

Year2009
ProceedingsVLSI Design

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