| 2009 | ITC | Diagnostic test generation for transition faults using a stuck-at ATPG tool. | Yoshinobu Higami, Yosuke Kurose, Satoshi Ohno, Hironori Yamaoka, Hiroshi Takahashi, Yoshihiro Shimizu, Takashi Aikyo, Yuzo Takamatsu |
| 2009 | VLSID | A Novel Approach for Improving the Quality of Open Fault Diagnosis. | Koji Yamazaki, Toshiyuki Tsutsumi, Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume |
| 2009 | VLSID | Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC. | Hiroyuki Yotsuyanagi, Masaki Hashizume, Toshiyuki Tsutsumi, Koji Yamazaki, Takashi Aikyo, Yoshinobu Higami, Hiroshi Takahashi, Yuzo Takamatsu |
| 2007 | VLSID | Fault Coverage and Fault Efficiency of Transistor Shorts using Gate-Level Simulation and Test Generation. | Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Yuzo Takamatsu |
| 2006 | ASPDAC | Compaction of pass/fail-based diagnostic test vectors for combinational and sequential circuits. | Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Shin-ya Kobayashi, Yuzo Takamatsu |
| 2005 | ISCAS | On the fault diagnosis in the presence of unknown fault models using pass/fail information. | T. Seiyama, Hiroshi Takahashi, Yoshinobu Higami, Kazuo Yamazaki, Yuzo Takamatsu |
| 2003 | ICCD | A Method to Find Don't Care Values in Test Sequences for Sequential Circuits. | Yoshinobu Higami, Shin-ya Kobayashi, Yuzo Takamatsu, Seiji Kajihara, Irith Pomeranz |
| 2002 | PRDC | An Alternative Method of Generating Tests for Path Delay Faults Using N -Detection Test Sets. | Hiroshi Takahashi, Kewal K. Saluja, Yuzo Takamatsu |
| 2001 | ITC | On reducing the target fault list of crosstalk-induced delay faults in synchronous sequential circuits. | Keith J. Keller, Hiroshi Takahashi, Kewal K. Saluja, Yuzo Takamatsu |
| 2000 | ASPDAC | Fault models and test generation for IDDQ testing: embedded tutorial. | Yoshinobu Higami, Yuzo Takamatsu, Kewal K. Saluja, Kozo Kinoshita |
| 2000 | VTS | General BIST-Amenable Method of Test Generation for Iterative Logic Arrays. | Kwame Osei Boateng, Hiroshi Takahashi, Yuzo Takamatsu |
| 1999 | VTS | A New Method for Diagnosing Multiple Stuck-at Faults using Multiple and Single Fault Simulations. | Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu |
| 1983 | DAC | Test generation for scan design circuits with tri-state modules and bidirectional terminals. | Takuji Ogihara, Shinichi Murai, Yuzo Takamatsu, Kozo Kinoshita, Hideo Fujiwara |