Takashi Aikyo
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
12
Venues
7
Active years
1990–2009
Best venue rank
A*
Where they publish
Papers
12 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2009 | ICCAD | A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment. | Kohei Miyase, Yuta Yamato, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Xiaoqing Wen, Seiji Kajihara |
| 2009 | ITC | Diagnostic test generation for transition faults using a stuck-at ATPG tool. | Yoshinobu Higami, Yosuke Kurose, Satoshi Ohno, Hironori Yamaoka, Hiroshi Takahashi, Yoshihiro Shimizu, Takashi Aikyo, Yuzo Takamatsu |
| 2009 | VLSID | A Novel Approach for Improving the Quality of Open Fault Diagnosis. | Koji Yamazaki, Toshiyuki Tsutsumi, Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume |
| 2009 | VLSID | Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC. | Hiroyuki Yotsuyanagi, Masaki Hashizume, Toshiyuki Tsutsumi, Koji Yamazaki, Takashi Aikyo, Yoshinobu Higami, Hiroshi Takahashi, Yuzo Takamatsu |
| 2009 | VTS | Small Delay Fault Model for Intra-Gate Resistive Open Defects. | Masayuki Arai, Akifumi Suto, Kazuhiko Iwasaki, Katsuyuki Nakano, Michihiro Shintani, Kazumi Hatayama, Takashi Aikyo |
| 2008 | ETS | A Capture-Safe Test Generation Scheme for At-Speed Scan Testing. | Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Hiroshi Furukawa, Yuta Yamato, Atsushi Takashima, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja |
| 2008 | ICCAD | Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification. | Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara |
| 2007 | ICCAD | Estimation of delay test quality and its application to test generation. | Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo |
| 2006 | ITC | Test Data Compression of 100x for Scan-Based BIST. | Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo |
| 2000 | ASPDAC | Issues on SOC testing in DSM area: embedded tutorial. | Takashi Aikyo |
| 1997 | DAC | A Test Synthesis Approach to Reducing BALLAST DFT Overhead. | Douglas Chang, Mike Tien-Chien Lee, Malgorzata Marek-Sadowska, Takashi Aikyo, Kwang-Ting Cheng |
| 1990 | ITC | ASIC CAD system based on hierarchical design-for-testability. | Michiaki Emori, Takashi Aikyo, Yasuhide Machida, Jun-ichi Shikatani |