| 2020 | IOLTS | An ECC-Based Repair Approach with an Offset-Repair CAM for Mitigating the MBUs Affecting Repair CAM. | Panagiota Papavramidou, Michael Nicolaidis, Patrick Girard |
| 2018 | DATE | Designing reliable processor cores in ultimate CMOS and beyond: A double sampling solution. | Thierry Bonnoit, Fraidy Bouesse, Nacer-Eddine Zergainoh, Michael Nicolaidis |
| 2017 | ASPDAC | Detailed and highly parallelizable cycle-accurate network-on-chip simulation on GPGPU. | Amir Charif, Alexandre Coelho, Nacer-Eddine Zergainoh, Michael Nicolaidis |
| 2017 | ETS | Rout3D: A lightweight adaptive routing algorithm for tolerating faulty vertical links in 3D-NoCs. | Amir Charif, Nacer-Eddine Zergainoh, Alexandre Coelho, Michael Nicolaidis |
| 2016 | ETS | Addressing transient routing errors in fault-tolerant Networks-on-Chips. | Amir Charif, Nacer-Eddine Zergainoh, Michael Nicolaidis |
| 2016 | IOLTS | Advanced double-sampling architectures. | Michael Nicolaidis, Michael G. Dimopoulos |
| 2015 | IOLTS | MUGEN: A high-performance fault-tolerant routing algorithm for unreliable Networks-on-Chip. | Amir Charif, Nacer-Eddine Zergainoh, Michael Nicolaidis |
| 2015 | IOLTS | Low-power memory repair for high defect densities. | Panagiota Papavramidou, Michael Nicolaidis |
| 2015 | VTS | Memory repair for high defect densities. | Michael Nicolaidis, Panagiota Papavramidou |
| 2014 | ETS | A generic and high-level model of large unreliable NoCs for fault tolerance and performance analysis. | Fabien Chaix, Nacer-Eddine Zergainoh, Michael Nicolaidis |
| 2014 | NCA | Congestion-Aware Adaptive Routing in 2D-Mesh Multicores. | Dimiter Avresky, Fabien Chaix, Michael Nicolaidis |
| 2013 | DATE | Reliability challenges of real-time systems in forthcoming technology nodes. | Said Hamdioui, Michael Nicolaidis, Dimitris Gizopoulos, Arnaud Grasset, Guido Groeseneken, Philippe Bonnot |
| 2013 | ETS | Variability-aware and fault-tolerant self-adaptive applications for many-core chips. | Gilles Bizot, Fabien Chaix, Nacer-Eddine Zergainoh, Michael Nicolaidis |
| 2013 | ETS | Reducing power dissipation in memory repair for high defect densities. | Panagiota Papavramidou, Michael Nicolaidis |
| 2013 | IOLTS | Variability-aware and fault-tolerant self-adaptive applications for many-core chips. | Gilles Bizot, Fabien Chaix, Nacer-Eddine Zergainoh, Michael Nicolaidis |
| 2013 | IOLTS | Fault-tolerant adaptive routing under permanent and temporary failures for many-core systems-on-chip. | Michael G. Dimopoulos, Yi Gang, Mounir Benabdenbi, Lorena Anghel, Nacer-Eddine Zergainoh, Michael Nicolaidis |
| 2013 | IOLTS | Transparent BIST for ECC-based memory repair. | Michael Nicolaidis, Panagiota Papavramidou |
| 2013 | VTS | Hot topic session 4A: Reliability analysis of complex digital systems. | Adrian Evans, Michael Nicolaidis, Rob Aitken, Burcin Aktan, Olivier Lauzeral |
| 2013 | VTS | An iterative diagnosis approach for ECC-based memory repair. | Panagiota Papavramidou, Michael Nicolaidis |
| 2012 | DATE | Design for test and reliability in ultimate CMOS. | Michael Nicolaidis, Lorena Anghel, Nacer-Eddine Zergainoh, Yervant Zorian, Tanay Karnik, Keith A. Bowman, James W. Tschanz, Shih-Lien Lu, Carlos Tokunaga, Arijit Raychowdhury, Muhammad M. Khellah, Jaydeep P. Kulkarni, Vivek De, Dimiter Avresky |
| 2012 | IOLTS | RIIF - Reliability information interchange format. | Adrian Evans, Michael Nicolaidis, Shi-Jie Wen, Dan Alexandrescu, Enrico Costenaro |
| 2012 | IOLTS | Through-silicon-via built-in self-repair for aggressive 3D integration. | Michael Nicolaidis, Vladimir Pasca, Lorena Anghel |
| 2012 | VTS | Test algorithms for ECC-based memory repair in nanotechnologies. | Panagiota Papavramidou, Michael Nicolaidis |
| 2011 | DATE | A fault-tolerant deadlock-free adaptive routing for on chip interconnects. | Fabien Chaix, Dimiter Avresky, Nacer-Eddine Zergainoh, Michael Nicolaidis |
| 2011 | DATE | Eliminating speed penalty in ECC protected memories. | Michael Nicolaidis, Thierry Bonnoit, Nacer-Eddine Zergainoh |
| 2011 | ETS | I-BIRAS: Interconnect Built-In Self-Repair and Adaptive Serialization in 3D Integrated Systems. | Michael Nicolaidis, Vladimir Pasca, Lorena Anghel |
| 2011 | ETS | Efficient Fault Detection Architecture Design of Latch-Based Low Power DSP/MCU Processor. | Hai Yu, Michael Nicolaidis, Lorena Anghel, Nacer-Eddine Zergainoh |
| 2011 | ICCD | Towards a tool for implementing delay-free ECC in embedded memories. | Thierry Bonnoit, Michael Nicolaidis, Nacer-Eddine Zergainoh |
| 2011 | IOLTS | Variability-aware task mapping strategies for many-cores processor chips. | Fabien Chaix, Gilles Bizot, Michael Nicolaidis, Nacer-Eddine Zergainoh |
| 2011 | IOLTS | Memory BIST with address programmability. | Aymen Fradi, Michael Nicolaidis, Lorena Anghel |
| 2011 | NCA | Self-Recovering Parallel Applications in Multi-core Systems. | Gilles Bizot, Dimiter Avresky, Fabien Chaix, Nacer-Eddine Zergainoh, Michael Nicolaidis |
| 2010 | DSN | Fourth workshop on dependable and secure nanocomputing. | Jean Arlat, Cristian Constantinescu, Ravishankar K. Iyer, Johan Karlsson, Michael Nicolaidis |
| 2010 | IOLTS | Interconnect Built-In Self-Repair and Adaptive-Serialization (I-BIRAS) for 3D integrated systems. | Michael Nicolaidis, Vladimir Pasca, Lorena Anghel |
| 2010 | NCA | Fault-Tolerant Deadlock-Free Adaptive Routing for Any Set of Link and Node Failures in Multi-cores Systems. | Fabien Chaix, Dimiter Avresky, Nacer-Eddine Zergainoh, Michael Nicolaidis |
| 2009 | DSN | Third workshop on dependable and secure nanocomputing. | Jean Arlat, Cristian Constantinescu, Ravishankar K. Iyer, Johan Karlsson, Michael Nicolaidis |
| 2009 | IOLTS | Variability and reliability-aware application tasks scheduling and power control (Voltage and Frequency Scaling) in the future nanoscale multiprocessors system on chip. | Gilles Bizot, Nacer-Eddine Zergainoh, Michael Nicolaidis |
| 2009 | IOLTS | Enhanced self-configurability and yield in multicore grids. | Eleftherios Kolonis, Michael Nicolaidis, Dimitris Gizopoulos, Mihalis Psarakis, Jacques Henri Collet, Piotr Zajac |
| 2008 | DSN | Second workshop on dependable and secure nanocomputing. | Jean Arlat, Cristian Constantinescu, Ravishankar K. Iyer, Michael Nicolaidis |
| 2008 | IOLTS | Special Session 2: Benchmarking and Standardization in Software-Based SER Characterization: Towards an IEEE Task Force? | Michael Nicolaidis |
| 2008 | VTS | Low-Cost Highly-Robust Hardened Cells Using Blocking Feedback Transistors. | Michael Nicolaidis, Renaud Perez, Dan Alexandrescu |
| 2007 | DSN | Workshop on Dependable and Secure Nanocomputing. | Jean Arlat, Ravishankar K. Iyer, Michael Nicolaidis |
| 2007 | IOLTS | GRAAL: A Fault-Tolerant Architecture for Enabling Nanometric Technologies. | Michael Nicolaidis |
| 2007 | ITC | GRAAL: a new fault tolerant design paradigm for mitigating the flaws of deep nanometric technologies. | Michael Nicolaidis |
| 2007 | IWANN | Defects Tolerant Logic Gates for Unreliable Future Nanotechnologies. | Lorena Anghel, Michael Nicolaidis |
| 2006 | ETS | A Transparent based Programmable Memory BIST. | Slimane Boutobza, Michael Nicolaidis, Kheiredine M. Lamara, Andrea Costa |
| 2006 | IOLTS | From Nuclear Reaction to System Failures: Can We Address All Levels of Soft Errors Accurately? | Lorena Anghel, Michael Nicolaidis, Nadine Buard |
| 2006 | IOLTS | A Low-Cost Single-Event Latchup Mitigation Sscheme. | Michael Nicolaidis |
| 2006 | VTS | Session Abstract. | Michael Nicolaidis |
| 2005 | DATE | An Efficient BICS Design for SEUs Detection and Correction in Semiconductor Memories. | Balkaran S. Gill, Michael Nicolaidis, Francis G. Wolff, Christos A. Papachristou, Steven L. Garverick |
| 2005 | IOLTS | Simulation and Mitigation of Single Event Effects. | Lorena Anghel, Michael Nicolaidis |
| 2005 | IOLTS | Radiation Induced Single-Word Multiple-Bit Upsets Correction in SRAM. | Balkaran S. Gill, Michael Nicolaidis, Christos A. Papachristou |
| 2005 | IOLTS | Design for Mitigation of Single Event Effects. | Michael Nicolaidis |
| 2005 | ITC | Programmable memory BIST. | Slimane Boutobza, Michael Nicolaidis, Kheiredine M. Lamara, Andrea Costa |
| 2004 | PRDC | Evaluation of Memory Built-in Self Repair Techniques for High Defect Density Technologie. | Lorena Anghel, Nadir Achouri, Michael Nicolaidis |
| 2004 | VTS | A Diversified Memory Built-In Self-Repair Approach for Nanotechnologies. | Michael Nicolaidis, Nadir Achouri, Lorena Anghel |
| 2003 | DATE | Optimal Reconfiguration Functions for Column or Data-bit Built-In Self-Repair. | Michael Nicolaidis, Nadir Achouri, Slimane Boutobza |
| 2003 | ICCAD | Dynamic Data-bit Memory Built-In Self- Repair. | Michael Nicolaidis, Nadir Achouri, Slimane Boutobza |
| 2003 | IOLTS | Memory Built-In Self-Repair for Nanotechnologies. | Michael Nicolaidis, Nadir Achouri, Lorena Anghel |
| 2003 | ITC | Reliability Threats in VDSM - Shortcomings in Conventional Test and Fault-Tolerance Alternatives. | Michael Nicolaidis |
| 2002 | DATE | Embedded Robustness Ips. | Eric Dupont, Michael Nicolaidis, Peter Rohr |
| 2002 | DATE | IP for Embedded Robustness. | Michael Nicolaidis |
| 2002 | ITC | Robustness IPs for Reliability and Security of SoCs. | Eric Dupont, Michael Nicolaidis |
| 2001 | VTS | Soft Errors and Tolerance for Soft Errors. | Jim Chung, N. Derhacobian, Jean Gasiot, Michael Nicolaidis, David Towne, Raoul Velazco |
| 2000 | DATE | Cost Reduction and Evaluation of a Temporary Faults Detecting Technique. | Lorena Anghel, Michael Nicolaidis |
| 2000 | DATE | Tutorial Statement. | Yervant Zorian, Michael Nicolaidis, Peter Muhmenthaler, David Y. Lepejian, Chris W. H. Strolenberg, Kees Veelenturf |
| 2000 | IOLTS | ISIS: A Fail-Safe Interface Realized in Smart Power Technology. | Michael Nicolaidis, N. Zaidan, Th. Calin, D. Bied-Charreton |
| 2000 | VTS | Self-Checking Circuits versus Realistic Faults in Very Deep Submicron. | Lorena Anghel, Michael Nicolaidis, Issam Alzaher-Noufal |
| 1999 | DATE | Scaling Deeper to Submicron: On-Line Testing to the Rescue. | Michael Nicolaidis, Yervant Zorian |
| 1999 | DATE | A CAD Framework for Generating Self-Checking 1 Multipliers Based on Residue Codes. | Issam Alzaher-Noufal, Michael Nicolaidis |
| 1999 | DATE | A One-Bit-Signature BIST for Embedded Operational Amplifiers in Mixed-Signal Circuits Based on the Slew-Rate Detection. | Iyad Rayane, Jaime Velasco-Medina, Michael Nicolaidis |
| 1999 | ICCD | On-Line BIST for Testing Analog Circuits. | Jaime Velasco-Medina, Iyad Rayane, Michael Nicolaidis |
| 1999 | PRDC | A New Placement Algorithm Dedicated to Parallel Computers: Bases and Application. | Fabien Clermidy, Thierry Collette, Michael Nicolaidis |
| 1999 | VTS | Built-In Current Sensor for IDDQ Testing in Deep Submicron CMOS. | Th. Calin, Lorena Anghel, Michael Nicolaidis |
| 1999 | VTS | Time Redundancy Based Soft-Error Tolerance to Rescue Nanometer Technologies. | Michael Nicolaidis |
| 1999 | VTS | A Digital BIST for Operational Amplifiers Embedded in Mixed-Signal Circuits. | Iyad Rayane, Jaime Velasco-Medina, Michael Nicolaidis |
| 1998 | DATE | Design of Fault-Secure Parity-Prediction Booth Multipliers. | Michael Nicolaidis, Ricardo de Oliveira Duarte |
| 1998 | DATE | Fault Detection for Linear Analog Circuits Using Current Injection. | Jaime Velasco-Medina, Th. Calin, Michael Nicolaidis |
| 1998 | ICCD | Current-based testing for analog and mixed-signal circuits. | Jaime Velasco-Medina, Michael Nicolaidis |
| 1998 | ITC | Scaling Deeper to Submicron: On-Line Testing to the Rescue. | Michael Nicolaidis |
| 1998 | ITC | Design for soft-error robustness to rescue deep submicron scaling. | Michael Nicolaidis |
| 1997 | DATE | Fault-secure shifter design: results and implementations. | Ricardo de Oliveira Duarte, Michael Nicolaidis, Hakim Bederr, Yervant Zorian |
| 1997 | ITC | On-Line Testing for VLSI. | Michael Nicolaidis |
| 1996 | DATE | Achieving Fault Secureness in Parity Prediction Arithmetic Operators: General Conditions and Implementations. | Michael Nicolaidis, Salvador Manich, Joan Figueras |
| 1996 | VTS | Can Defect-Tolerant Chips Better Meet the Quality Challenge? | R. L. Campbell, P. Kuekes, David Y. Lepejian, Wojciech P. Maly, Michael Nicolaidis, Alex Orailoglu |
| 1996 | VTS | Enhancing realistic fault secureness in parity prediction array arithmetic operators by I | Salvador Manich, Michael Nicolaidis, Joan Figueras |
| 1995 | ARITH | Analytic approach for error masking elimination in on-line multipliers. | Hakim Bederr, Michael Nicolaidis, Alain Guyot |
| 1995 | DATE | Area versus detection latency trade-offs in self-checking memory design. | O. Kebichi, Yervant Zorian, Michael Nicolaidis |
| 1995 | ITC | Upset-Tolerant CMOS SRAM Using Current Monitoring: Prototype and Test Experiments. | Th. Calin, F. L. Vargas, Michael Nicolaidis |
| 1995 | ITC | Exact Aliasing Computation for RAM BIST. | O. Kebichi, Michael Nicolaidis, Vyacheslav N. Yarmolik |
| 1995 | ITC | An Approach for Designing Total-Dose Tolerant MCMs Based on Current Monitoring. | Fabian Vargas, Michael Nicolaidis, Yervant Zorian |
| 1995 | VTS | A tool for automatic generation of self-checking data paths. | B. Hamdi, Hakim Bederr, Michael Nicolaidis |
| 1994 | FPL | A Test Methodology Applied to Cellular Logic Programmable Gate Arrays. | Ricardo de Oliveira Duarte, Michael Nicolaidis |
| 1994 | ITC | Aliasing-free Signature Analysis for RAM BIST. | Vyacheslav N. Yarmolik, Michael Nicolaidis, O. Kebichi |
| 1994 | VTS | Design for testability of on-line multipliers. | Hakim Bederr, Michael Nicolaidis, Alain Guyot |
| 1994 | VTS | Efficient UBIST for RAMs. | Michael Nicolaidis |
| 1993 | ICCD | Quiescent Current Monitoring to Improve the Reliability of Electronic Systems in Space Radiation Environments. | F. L. Vargas, Michael Nicolaidis, Bernard Courtois |
| 1993 | VTS | Finitely self-checking circuits and their application on current sensors. | Michael Nicolaidis |
| 1993 | VTS | Quiescent current estimation based on quality requirements. | Fabian Luis Vargas, Michael Nicolaidis, B. Hamdi |
| 1992 | ICCD | A Tool for Automatic Generation of BISTed and Transparent BISTed Rams. | O. Kebichi, Michael Nicolaidis |
| 1992 | ITC | Transparent BIST for RAMs. | Michael Nicolaidis |
| 1992 | VTS | Improving the theory of truth table verification of iterative logic arrays. | Michael Nicolaidis |
| 1991 | ICCAD | Built-In Self-Test for Multi-Port RAMs. | Vladimir Castro Alves, Michael Nicolaidis, P. Lestrat, Bernard Courtois |
| 1991 | ICCD | New Implementations, Tools, and Experiments for Decreasing Self-Checking PLAs Area Overhead. | Michael Nicolaidis, M. Boudjit |
| 1990 | ITC | Efficient UBIST implementation for microprocessor sequencing parts. | Michael Nicolaidis |
| 1988 | ICCD | UBIST version of the SYCO's control section compiler. | Kholdoun Torki, Michael Nicolaidis, Ahmed Amine Jerraya, Bernard Courtois |