| 2019 | IOLTS | Estimation of oxide breakdown effects by fault injection. | Chiara Sandionigi, Olivier Hron |
| 2016 | IOLTS | Fine-grain analysis of the parameters involved in aging of digital circuits. | Boukary Ouattara, Olivier Hron, Chiara Sandionigi |
| 2015 | IOLTS | Identifying aging-aware representative paths in processors. | Chiara Sandionigi, Olivier Hron |
| 2013 | IOLTS | When processors get old: Evaluation of BTI and HCI effects on performance and reliability. | Chiara Sandionigi, Olivier Hron, Clement Bertolini, Raphal David |
| 2012 | IOLTS | Relation between HCI-induced performance degradation and applications in a RISC processor. | Clement Bertolini, Olivier Hron, Nicolas Ventroux, Franois Marc |
| 2011 | VTS | Impact of the application activity on intermittent faults in embedded systems. | Julien Guilhemsang, Olivier Hron, Nicolas Ventroux, Olivier Goncalves, Alain Giulieri |
| 2010 | IOLTS | Analysis of on-line self-testing policies for real-time embedded multiprocessors in DSM technologies. | Olivier Hron, Julien Guilhemsang, Nicolas Ventroux, Alain Giulieri |
| 2010 | SBAC-PAD | High Level Power and Energy Exploration Using ArchC. | Tushar Gupta, Clement Bertolini, Olivier Hron, Nicolas Ventroux, Thomas Zimmer, Franois Marc |
| 2005 | FPL | On the Reliability Evaluation of SRAM-Based FPGA Designs. | Olivier Hron, Talal Arnaout, Hans-Joachim Wunderlich |
| 2004 | ETS | Manufacturing-oriented testing of delay faults in the logic architecture of symmetrical FPGAs. | Patrick Girard, Olivier Hron, Serge Pravossoudovitch, Michel Renovell |
| 2004 | IOLTS | BIST of Delay Faults in the Logic Architecture of Symmetrical FPGAs. | Patrick Girard, Olivier Hron, Serge Pravossoudovitch, Michel Renovell |
| 2003 | ETS | Requirements for delay testing of look-up tables in SRAM-based FPGAs. | Patrick Girard, Olivier Hron, Serge Pravossoudovitch, Michel Renovell |
| 2003 | IOLTS | Defect Analysis for Delay-Fault BIST in FPGAs. | Patrick Girard, Olivier Hron, Serge Pravossoudovitch, Michel Renovell |