| 2025 | CVPR | From Words to Structured Visuals: A Benchmark and Framework for Text-to-Diagram Generation and Editing. | Jingxuan Wei, Cheng Tan, Qi Chen, Gaowei Wu, Siyuan Li, Zhangyang Gao, Linzhuang Sun, Bihui Yu, Ruifeng Guo |
| 2025 | IJCAI | SketchAgent: Generating Structured Diagrams from Hand-Drawn Sketches. | Cheng Tan, Qi Chen, Jingxuan Wei, Gaowei Wu, Zhangyang Gao, Siyuan Li, Bihui Yu, Ruifeng Guo, Stan Z. Li |
| 2024 | ECCV | Boosting the Power of Small Multimodal Reasoning Models to Match Larger Models with Self-consistency Training. | Cheng Tan, Jingxuan Wei, Zhangyang Gao, Linzhuang Sun, Siyuan Li, Ruifeng Guo, Bihui Yu, Stan Z. Li |
| 2024 | IJCAI | Sentence-Level or Token-Level? A Comprehensive Study on Knowledge Distillation. | Jingxuan Wei, Linzhuang Sun, Yichong Leng, Xu Tan, Bihui Yu, Ruifeng Guo |
| 2017 | HealthCom | A fault diagnosis method for information systems based on weighted fault diagnosis tree. | Liming Duan, Fenghai Wang, Ruifeng Guo, Rongli Gai |
| 2016 | TrustCom | A Dynamic Power Management Algorithm for Sporadic Tasks in Real-Time Embedded Systems. | Changyi Deng, Ruifeng Guo, Hongliang Wang, Azhen Peng |
| 2013 | ICNC | A tool path error estimate in computer numerical control for five-axis machining. | Hongliang Wang, Ruifeng Guo, Han Zhang, Yiwen Zhang, Ruirui Chen |
| 2013 | ITC | Diagnosis and Layout Aware (DLA) scan chain stitching. | Jing Ye, Yu Huang, Yu Hu, Wu-Tung Cheng, Ruifeng Guo, Liyang Lai, Ting-Pu Tai, Xiaowei Li, Wei-pin Changchien, Daw-Ming Lee, Ji-Jan Chen, Sandeep C. Eruvathi, Kartik K. Kumara, Charles C. C. Liu, Sam Pan |
| 2010 | ASPDAC | Emulating and diagnosing IR-drop by using dynamic SDF. | Ke Peng, Yu Huang, Ruifeng Guo, Wu-Tung Cheng, Mohammad Tehranipoor |
| 2010 | ETS | Scan based speed-path debug for a microprocessor. | Jing Zeng, Ruifeng Guo, Wu-Tung Cheng, Michael Mateja, Jing Wang, Kun-Han Tsai, Ken Amstutz |
| 2009 | DATE | Improving compressed test pattern generation for multiple scan chain failure diagnosis. | Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. Reddy |
| 2009 | ETS | Speed-Path Debug Using At-Speed Scan Test Patterns. | Ruifeng Guo, Wu-Tung Cheng, Kun-Han Tsai |
| 2009 | PRDC | Enhancing the Success Rate of Primary Version While Guaranteeing Fault-Tolerant Capability for Real-Time Systems. | Wanfu Ding, Ruifeng Guo |
| 2008 | ETS | Diagnose Multiple Stuck-at Scan Chain Faults. | Yu Huang, Wu-Tung Cheng, Ruifeng Guo |
| 2008 | ITC | Detection and Diagnosis of Static Scan Cell Internal Defect. | Ruifeng Guo, Liyang Lai, Yu Huang, Wu-Tung Cheng |
| 2007 | ITC | A complete test set to diagnose scan chain failures. | Ruifeng Guo, Yu Huang, Wu-Tung Cheng |
| 2007 | ITC | Diagnose compound scan chain and system logic defects. | Yu Huang, Wu-Tung Cheng, Ruifeng Guo, Will Hsu, Yuan-Shih Chen, Albert Mann |
| 2007 | VTS | Using Scan-Dump Values to Improve Functional-Diagnosis Methodology. | Vishnu C. Vimjam, M. Enamul Amyeen, Ruifeng Guo, Srikanth Venkataraman, Michael S. Hsiao, Kai Yang |
| 2006 | VTS | Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive. | Ruifeng Guo, Subhasish Mitra, M. Enamul Amyeen, Jinkyu Lee, Srihari Sivaraj, Srikanth Venkataraman |
| 2005 | ITC | Enabling yield analysis with X-compact. | Zoran Stanojevic, Ruifeng Guo, Subhasish Mitra, Srikanth Venkataraman |
| 2005 | RTCSA | The Research on Real-Time Middleware for Open Architecture Controller. | Dong Yu, Hu Lin, Ruifeng Guo, Jiangang Yang, Pengfei Xiao |
| 2004 | VTS | An Experimental Study of N-Detect Scan ATPG Patterns on a Processor. | Srikanth Venkataraman, Srihari Sivaraj, M. Enamul Amyeen, Sangbong Lee, Ajay Ojha, Ruifeng Guo |
| 2003 | VTS | Concurrent Execution of Diagnostic Fault Simulation and Equivalence Identification During Diagnostic Test Generation. | Xiaoming Yu, M. Enamul Amyeen, Srikanth Venkataraman, Ruifeng Guo, Irith Pomeranz |
| 2001 | ITC | A technique for fault diagnosis of defects in scan chains. | Ruifeng Guo, Srikanth Venkataraman |
| 2001 | VLSID | On Improving Static Test Compaction for Sequential Circuits. | Ruifeng Guo, Irith Pomeranz, Sudhakar M. Reddy |
| 1999 | DAC | Proptest: A Property Based Test Pattern Generator for Sequential Circuits Using Test Compaction. | Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz |
| 1999 | ITC | The effects of test compaction on fault diagnosis. | Yun Shao, Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz |
| 1999 | VTS | A Fault Simulation Based Test Pattern Generator for Synchronous Sequential Circuits. | Ruifeng Guo, Irith Pomeranz, Sudhakar M. Reddy |
| 1998 | DATE | Procedures for Static Compaction of Test Sequences for Synchronous Sequential Circuits Based on Vector Restoration. | Ruifeng Guo, Irith Pomeranz, Sudhakar M. Reddy |