| 2011 | VLSID | Optimized Multitone Test Stimulus Driven Diagnosis of RF Transceivers Using Model Parameter Estimation. | Aritra Banerjee, Vishwanath Natarajan, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Soumendu Bhattacharya |
| 2010 | VTS | Concurrent process model and specification cause-effect monitoring using alternate diagnostic signatures. | Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee |
| 2009 | ICCD | Iterative built-in testing and tuning of mixed-signal/RF systems. | Abhijit Chatterjee, Donghoon Han, Vishwanath Natarajan, Shyam Kumar Devarakond, Shreyas Sen, Hyun Woo Choi, Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhilash Goyal, Deuk Lee, Madhavan Swaminathan |
| 2008 | VTS | Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise. | Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhijit Chatterjee |
| 2007 | VTS | Probabilistic Compensation for Digital Filters Using Pervasive Noise-Induced Operator Errors. | Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee |
| 2006 | ETS | Improving SNR for DSM Linear Systems Using Probabilistic Error Correction and State Restoration: A Comparative Study. | Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee |
| 2006 | ETS | Low Cost Parametric Failure Diagnosis of RF Transceivers. | Donghoon Han, Shalabh Goyal, Soumendu Bhattacharya, Abhijit Chatterjee |
| 2006 | VLSID | Efficient DNA Sensing with Fabricated Silicon Nanopores: Diagnosis Methodology and Algorithms. | Soumendu Bhattacharya, Vishwanath Natarajan, Abhijit Chatterjee, Sankar Nair |
| 2006 | VTS | Design of Soft Error Resilient Linear Digital Filters Using Checksum-Based Probabilistic Error Correction. | Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee |
| 2006 | VTS | Alternate Electrical Tests for Extracting Mechanical Parameters of MEMS Accelerometer Sensors. | Vishwanath Natarajan, Soumendu Bhattacharya, Abhijit Chatterjee |
| 2005 | IOLTS | On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST). | Donghoon Han, Selim Sermet Akbay, Soumendu Bhattacharya, Abhijit Chatterjee, William R. Eisenstadt |
| 2005 | ITC | Production test enhancement techniques for MB-OFDM ultra-wide band (UWB) devices: EVM and CCDF. | Soumendu Bhattacharya, Rajarajan Senguttuvan, Abhijit Chatterjee |
| 2005 | VLSID | A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode. | Achintya Halder, Soumendu Bhattacharya, Ganesh Srinivasan, Abhijit Chatterjee |
| 2005 | VTS | Production Test Methods for Measuring 'Out-of-Band' Interference of Ultra Wide Band (UWB) Devices. | Soumendu Bhattacharya, Abhijit Chatterjee |
| 2004 | DATE | Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit. | Ganesh Srinivasan, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee |
| 2004 | ITC | Use of Embedded Sensors for Built-In-Test of RF Circuits. | Soumendu Bhattacharya, Abhijit Chatterjee |
| 2004 | VTS | System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams. | Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee |
| 2003 | ITC | Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models. | Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee |
| 2003 | VTS | High Coverage Analog Wafer-Probe Test Design and Co-optimization with Assembled-Package Test to Minimize Overall Test Cost. | Soumendu Bhattacharya, Abhijit Chatterjee |