Sudarshan Bahukudumbi
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
6
Venues
5
Active years
2005–2008
Best venue rank
National
Where they publish
Papers
6 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2008 | DATE | Test Scheduling for Wafer-Level Test-During-Burn-In of Core-Based SoCs. | Sudarshan Bahukudumbi, Krishnendu Chakrabarty, Richard Kacprowicz |
| 2008 | VTS | Test-Pattern Ordering for Wafer-Level Test-During-Burn-In. | Sudarshan Bahukudumbi, Krishnendu Chakrabarty |
| 2007 | ASPDAC | AWafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for "Big-D/Small-A" Mixed-Signal SoCs. | Sudarshan Bahukudumbi, Sule Ozev, Krishnendu Chakrabarty, Vikram Iyengar |
| 2007 | VLSID | Test-Length Selection and TAM Optimization for Wafer-Level, Reduced Pin-Count Testing of Core-Based Digital SoCs. | Sudarshan Bahukudumbi, Krishnendu Chakrabarty |
| 2006 | ITC | Defect-Oriented and Time-Constrained Wafer-Level Test-Length Selection for Core-Based Digital SoCs. | Sudarshan Bahukudumbi, Krishnendu Chakrabarty |
| 2005 | VLSID | A Low Overhead High Speed Histogram Based Test Methodology for Analog Circuits and IP Cores. | Sudarshan Bahukudumbi, Krishna Bharath |