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Sule Ozev

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

120

Venues

14

Active years

2000–2026

Best venue rank

A*

Where they publish

Papers

120 indexed papers, newest first.

YearVenueTitleAuthors
2026ETSDistributed Delay-Based BIST for Mixed-Signal Circuits in Flexible Electronics.Paula Carolina Lozano Duarte, Sule Ozev, Mehdi B. Tahoori
2026ETSTDsReCAM: Time-Domain sensing for reliable ReRAM-based Content Addressable Memory.Haneen G. Hezayyin, Mahta Mayahinia, Mehdi B. Tahoori, Sule Ozev
2026VTSReliable Emerging Electronics in Wearable and Implantable Healthcare Applications.Priyanjana Pal, Paula Carolina Lozano Duarte, Suhas Krishna Kashyap, Mehdi B. Tahoori, Caroline J. Smith, Yuna Jung, Daniel W. Gulick, Jennifer Blain, Sule Ozev
2026VTSTemporal Reference Scouting Logic for PVT Reliable Logic Computation-in-Memory.Shanmukha Mangadahalli Siddaramu, Ali Nezhadi, Mahta Mayahinia, Sule Ozev, Mehdi B. Tahoori
2025VTSDC Stimulus Electrical Calibration of MEMS Accelerometers.Ishaan Bassi, Sule Ozev
2025VTSDefect Severity Analysis for Analog Circuits Using Zoom Search and Hierarchical Fault Simulation.Mehmet Onder, Lakshmanan Balasubramanian, Rubin A. Parekhji, Suriyaprakash Natarajan, Sule Ozev
2025VTSA Multi-Step Algorithm to Increase Measurement Accuracy of mm-Wave BIST Using Periodic Structures.Noah Rajbharti, Esteban Chacon, Muslum Emir Avci, Jennifer Kitchen, Sule Ozev
2024ETSHierarchical Fault Simulation for Mixed-Signal Circuits Using Template Based Fault Response Modeling.Tolga Aksoy, Nikhil Sagar Modala, Lakshmanan Balasubramanian, Rubin A. Parekhji, Sule Ozev
2024ISVCUnderwater Image Restoration Using Light Attenuation.Huseyin Seckin Demir, Jennifer Blain Christen, Sule Ozev
2024ISVCEvaluating the Impact of Dehazing Algorithms on Visual Object Tracking Performance.Huseyin Seckin Demir, Noah Rajbharti, Sloan Sciarappo, Jennifer Blain Christen, Sule Ozev
2024ITCElectrical Stimulus Based Calibration of MEMS Accelerometer.Ishaan Bassi, Sule Ozev
2024VTSMulti-Parameter Optimization of mm-Wave Antenna Layout Using Hybrid Modeling and Incremental Model Learning.Ferhat Can Ataman, Mohammed Aladsani, Y. B. Chethan Kumar, Georgios Trichopoulos, Sule Ozev
2024VTSCalibration and Source Localization Using an Array of Resistive Metal Oxide Gas Sensors.Ishaan Bassi, Sule Ozev
2024VTSStructural Built In Self Test of Analog Circuits using ON/OFF Keying and Delay Monitors.Suhas Krishna Kashyap, Chinmaye Raghavendra, Suriyaprakash Natarajan, Sule Ozev
2023ETSGlobal Tuning for System Performance Optimization of RF MIMO Radars.Ferhat Can Ataman, Muslum Emir Avci, Y. B. Chethan Kumar, Sule Ozev
2023ETSMismatch Measurement for MIMO mm-Wave Radars via Simple Power Monitors.Ferhat Can Ataman, Mohammed Aladsani, Georgios Trichopoulos, Y. B. Chethan Kumar, Sule Ozev
2023ITCImproving Angle of Arrival Estimation Accuracy for mm-Wave Radars.Ferhat Can Ataman, Y. B. Chethan Kumar, Sandeep Rao, Sule Ozev
2022DATEGuaranteed Activation of Capacitive Trojan Triggers During Post Production Test via Supply Pulsing.Bora Bilgic, Sule Ozev
2022ICASSPDetecting Anomaly in Chemical Sensors via Regularized Contrastive Learning.Diaa Badawi, Ishaan Bassi, Sule Ozev, Ahmet Enis etin
2022VTSFast RF Mismatch Calibration Using Built-in Detectors.Muslum Emir Avci, Sule Ozev, Y. B. Chethan Kumar
2022VTSPerformance Degradation Monitoring for Analog Circuits Using Lightweight Built-in Components.Bora Bilgic, Sule Ozev
2022VTSExploring Model-based Failure Prediction of Passive Bio-electro-mechanical Implants.Daniel W. Gulick, Yuna Jung, Seunghyun Lee, Sule Ozev, Jennifer Blain Christen
2021ICASSPDiscrete Cosine Transform Based Causal Convolutional Neural Network for Drift Compensation in Chemical Sensors.Diaa Badawi, Agamyrat Agambayev, Sule Ozev, A. Enis etin
2021ITCBackground Receiver IQ Imbalance Correction for in-Field and Post-Production Testing and Calibration.Muslum Emir Avci, Sule Ozev
2021VTSMaintaining NIST-Traceability for MEMS Sensors via In-Field Electrical Recalibration.Ishaan Bassi, Sule Ozev, Doohwang Chang
2020ETSDigital Defect Based Built-in Self-Test for Low Dropout Voltage Regulators.Mehmet Ince, Sule Ozev
2020ICCADA Crowd-Based Explosive Detection System with Two-Level Feedback Sensor Calibration.Chengmo Yang, Patrick Cronin, Agamyrat Agambayev, Sule Ozev, A. Enis etin, Alex Orailoglu
2020ITCDesign Optimization for N-port RF Network Reflectometers under Noise and Gain Imperfections.Muslum Emir Avci, Sule Ozev
2019ETSDigital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection.Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev
2019ICASSPDetecting Gas Vapor Leaks through Uncalibrated Sensor Based CPS.Diaa Badawi, Sule Ozev, Jennifer Blain Christen, Chengmo Yang, Alex Orailoglu, A. Enis etin
2019VTSOptimized Stress Testing for Flexible Hybrid Electronics Designs.Hang Gao, Ganapati Bhat, mit Y. Ogras, Sule Ozev
2019VTSPCB Hardware Trojans: Attack Modes and Detection Strategies.Matthew McGuire, mit Y. Ogras, Sule Ozev
2018VTSRF circuit authentication for detection of process Trojans.Fatih Karabacak, Richard Welker, Matthew J. Casto, Jennifer N. Kitchen, Sule Ozev
2018VTSOnline information utility assessment for per-device adaptive test flow.Yanjun Li, Ender Yilmaz, Peter Sarson, Sule Ozev
2018VTSA built-in self-test technique for transmitter-only systems.Maryam Shafiee, Jennifer N. Kitchen, Sule Ozev
2018VTSSpecial session on BIST/calibration of A/MS devices.Hans-Mart von Staudt, James Izon, Sule Ozev, Peter Sarson
2017ETSContact-less near-field measurement of RF phased array antenna mismatches.Maryam Shafiee, Sule Ozev
2017ISCASReceiver echo cancellation with real-time self calibration for passive implanted neuron recorders.Maryam Shafiee, Sule Ozev
2017ITCBuilt-in self-test for stability measurement of low dropout regulator.Jae Woong Jeong, Ender Yilmaz, LeRoy Winemberg, Sule Ozev
2016ICCADMulti-objective design optimization for flexible hybrid electronics.Ganapati Bhat, Ujjwal Gupta, Nicholas Tran, Jaehyun Park, Sule Ozev, mit Y. Ogras
2016ISCASPost-production adaptation of RF circuits for application-specific performance metrics.Doohwang Chang, Jennifer Kitchen, Sule Ozev
2016VTSProcess independent gain measurement with low overhead via BIST/DUT co-design.Jae Woong Jeong, Jennifer Kitchen, Sule Ozev
2015DATEOn-chip measurement of bandgap reference voltage using a small form factor VCO based zoom-in ADC.Osman Emir Erol, Sule Ozev, Chandra K. H. Suresh, Rubin A. Parekhji, Lakshmanan Balasubramanian
2015ETSRobust amplitude measurement for RF BIST applications.Jae Woong Jeong, Jennifer Kitchen, Sule Ozev
2015ITCA self-compensating built-in self-test solution for RF phased array mismatch.Jae Woong Jeong, Jennifer Kitchen, Sule Ozev
2015VTSDisturbance-free BIST for loop characterization of DC-DC buck converters.Navankur Beohar, Priyanka Bakliwal, Sidhanto Roy, Debashis Mandal, Philippe Adell, Bert Vermeire, Bertan Bakkaloglu, Sule Ozev
2015VTSEnabling unauthorized RF transmission below noise floor with no detectable impact on primary communication performance.Doohwang Chang, Bertan Bakkaloglu, Sule Ozev
2015VTSPanel: Analog/RF BIST: Are we there yet?Sule Ozev, Linda Milor
2014DATEApproximating the age of RF/analog circuits through re-characterization and statistical estimation.Doohwang Chang, Sule Ozev, Ozgur Sinanoglu, Ramesh Karri
2014DATEBuilt-in self-test and characterization of polar transmitter parameters in the loop-back mode.Jae Woong Jeong, Sule Ozev, Shreyas Sen, Vishwanath Natarajan, Mustapha Slamani
2014VTSReliability enhancement using in-field monitoring and recovery for RF circuits.Doohwang Chang, Sule Ozev, Bertan Bakkaloglu, Sayfe Kiaei, Engin Afacan, Gnhan Dndar
2014VTSDevelopment and empirical verification of an accuracy model for the power down leakage tests.Jae Woong Jeong, Sule Ozev, Friedrich Taenzler, Hui-Chuan Chao
2014VTSA built-in self-test technique for load inductance and lossless current sensing of DC-DC converters.Tao Liu, Chao Fu, Sule Ozev, Bertan Bakkaloglu
2014VTSSpecial session 4B: Panel: Testing and calibration for power management circuits.Sule Ozev, Bertan Bakkaloglu
2013DATEElectrical calibration of spring-mass MEMS capacitive accelerometers.Lingfei Deng, Vinay Kundur, Naveen Sai Jangala Naga, Muhlis Kenan Ozel, Ender Yilmaz, Sule Ozev, Bertan Bakkaloglu, Sayfe Kiaei, Divya Pratab, Tehmoor Dar
2013DATEAdaptive reduction of the frequency search space for multi-vdd digital circuits.Chandra K. H. Suresh, Ender Yilmaz, Sule Ozev, Ozgur Sinanoglu
2013DATEFault analysis and simulation of large scale industrial mixed-signal circuits.Ender Yilmaz, Geoff Shofner, LeRoy Winemberg, Sule Ozev
2013ETSAnalytical modeling for EVM in OFDM transmitters including the effects of IIP3, I/Q imbalance, noise, AM/AM and AM/PM distortion.Afsaneh Nassery, Sule Ozev, Mustapha Slamani
2013ETSAdaptive quality binning for analog circuits.Ender Yilmaz, Sule Ozev, Kenneth M. Butler
2013ITCZero-overhead self test and calibration of RF transceivers.Afsaneh Nassery, Jae Woong Jeong, Sule Ozev
2013VTSMeasurement of envelope/phase path delay skew and envelope path bandwidth in polar transmitters.Jae Woong Jeong, Sule Ozev, Shreyas Sen, T. M. Mak
2012DATEAn analytical technique for characterization of transceiver IQ imbalances in the loop-back mode.Afsaneh Nassery, Sule Ozev
2012ETSAdaptive testing of chips with varying distributions of unknown response bits.Chandra K. H. Suresh, Ozgur Sinanoglu, Sule Ozev
2012ETSAdaptive multi-site testing for analog/mixed-signal circuits incorporating neighborhood information.Ender Yilmaz, Sule Ozev
2012ETSAdaptive testing: Conquering process variations.Ender Yilmaz, Sule Ozev, Ozgur Sinanoglu, Peter C. Maxwell
2012VTSBuilt-in-Self Test of transmitter I/Q mismatch using self-mixing envelope detector.Afsaneh Nassery, Srinath Byregowda, Sule Ozev, Marian Verhelst, Mustapha Slamani
2011ETSExtraction of EVM from Transmitter System Parameters.Afsaneh Nassery, Sule Ozev, Marian Verhelst, Mustapha Slamani
2011ETSAnalysis and Mitigation of Electromigration in RF Circuits: An LNA Case Study.Ramachandran Venkatasubramanian, Doohwang Chang, Sule Ozev
2011ETSFast and Accurate DPPM Computation Using Model Based Filtering.Ender Yilmaz, Sule Ozev
2011ITCAdaptive multidimensional outlier analysis for analog and mixed signal circuits.Ender Yilmaz, Sule Ozev, Kenneth M. Butler
2011VTSAn industrial case study of analog fault modeling.Ender Yilmaz, Anne Meixner, Sule Ozev
2010ETSDefect filter for alternate RF test.Haralampos-G. D. Stratigopoulos, Salvador Mir, Erkan Acar, Sule Ozev
2010ITCAdaptive test flow for mixed-signal/RF circuits using learned information from device under test.Ender Yilmaz, Sule Ozev, Kenneth M. Butler
2009DACAdaptive test elimination for analog/RF circuits.Ender Yilmaz, Sule Ozev
2009ETSDefect Filter for Alternate RF Test.Haralampos-G. D. Stratigopoulos, Salvador Mir, Erkan Acar, Sule Ozev
2009ICCDDefect-based test optimization for analog/RF circuits for near-zero DPPM applications.Ender Yilmaz, Sule Ozev
2009ITCBuilt-in EVM measurement for OFDM transceivers using all-digital DFT.Ender Yilmaz, Afsaneh Nassery, Sule Ozev, Erkan Acar
2009VTSA Packet Based 2x-Site Test Solution for GSM Transceivers with Limited Tester Resources.Erdem Serkan Erdogan, Sule Ozev
2008ICCDDynamic test scheduling for analog circuits for improved test quality.Ender Yilmaz, Sule Ozev
2008ISCASDiagnosis of assembly failures for System-in-Package RF tuners.Erdem Serkan Erdogan, Sule Ozev, Philippe Cauvet
2008ITCOptimized EVM Testing for IEEE 802.11a/n RF ICs.Erkan Acar, Sule Ozev, Ganesh Srinivasan, Friedrich Taenzler
2008VTSSingle-Measurement Diagnostic Test Method for Parametric Faults of I/Q Modulating RF Transceivers.Erdem Serkan Erdogan, Sule Ozev
2007ASPDACAWafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for "Big-D/Small-A" Mixed-Signal SoCs.Sudarshan Bahukudumbi, Sule Ozev, Krishnendu Chakrabarty, Vikram Iyengar
2007DATEAn ADC-BiST scheme using sequential code analysis.Erdem Serkan Erdogan, Sule Ozev
2007ICCDDigital calibration of RF transceivers for I-Q imbalances and nonlinearity.Erkan Acar, Sule Ozev
2007ICCDLow-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor.Sule Ozev, Daniel J. Sorin, Mahmut Yilmaz
2007ITCLow cost characterization of RF transceivers through IQ data analysis.Erkan Acar, Sule Ozev
2007ITCTest yield estimation for analog/RF circuits over multiple correlated measurements.Fang Liu, Erkan Acar, Sule Ozev
2007ITCEfficient simulation of parametric faults for multi-stage analog circuits.Fang Liu, Sule Ozev
2007VTSA Low-Cost RF MIMO Test Method Using a Single Measurement Set-up.Erkan Acar, Sule Ozev, Kevin B. Redmond
2006ICCADEnhanced error vector magnitude (EVM) measurements for testing WLAN transceivers.Erkan Acar, Sule Ozev, Kevin B. Redmond
2006ICCDEfficient Testing of RF MIMO Transceivers Used in WLAN Applications.Erkan Acar, Sule Ozev
2006ITCA Robust, Self-Tuning CMOS Circuit for Built-in Go/No-Go Testing of Synthesizer Phase Noise.Erdem Serkan Erdogan, Sule Ozev
2006ITCSelf-Checking and Self-Diagnosing 32-bit Microprocessor Multiplier.Mahmut Yilmaz, Derek Hower, Sule Ozev, Daniel J. Sorin
2006SIGMETRICSApplying architectural vulnerability Analysis to hard faults in the microprocessor.Fred A. Bower, Derek Hower, Mahmut Yilmaz, Daniel J. Sorin, Sule Ozev
2006VTSParametric Fault Diagnosis for Analog Circuits Using a Bayesian Framework.Fang Liu, Plamen K. Nikolov, Sule Ozev
2005ASPDACHierarchical analysis of process variation for mixed-signal systems.Fang Liu, Sule Ozev
2005DATECircuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown.Jonathan R. Carter, Sule Ozev, Daniel J. Sorin
2005DATEHierarchical Variance Analysis for Analog Circuits Based on Graph Modelling and Correlation Loop Tracing.Fang Liu, Jacob J. Flomenberg, Devaka V. Yasaratne, Sule Ozev
2005DATETest Planning for Mixed-Signal SOCs with Wrapped Analog Cores.Anuja Sehgal, Fang Liu, Sule Ozev, Krishnendu Chakrabarty
2005ICCADParametric test development for RF circuits targeting physical fault locations and using specification-based fault definitions.Erkan Acar, Sule Ozev
2005ICCDFast Hierarchical Process Variability Analysis and Parametric Test Development for Analog/RF Circuits.Fang Liu, Sule Ozev
2005ICCDA Flexible Design Methodology for Analog Test Wrappers in Mixed-Signal SOCs.Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty
2005ITCDefect-based RF testing using a new catastrophic fault model.Erkan Acar, Sule Ozev
2005MICROA Mechanism for Online Diagnosis of Hard Faults in Microprocessors.Fred A. Bower, Daniel J. Sorin, Sule Ozev
2005VTSDiagnosis of Failing Component in RF Receivers through Adaptive Full-Path Measurements.Erkan Acar, Sule Ozev
2004DSNTolerating Hard Faults in Microprocessor Array Structures.Fred A. Bower, Paul G. Shealy, Sule Ozev, Daniel J. Sorin
2004ETSTest planning and test resource optimization for droplet-based microfluidic systems.Fei Su, Sule Ozev, Krishnendu Chakrabarty
2004ICCADDiagnosis of small-signal parameters for broadband amplifiers through S-parameter measurements and sensitivity-guided evolutionary search.Fang Liu, Sule Ozev, Martin A. Brooke
2004ICCDEnd-to-End Testability Analysis and DfT Insertion for Mixed-Signal Paths.Sule Ozev, Alex Orailoglu
2004ITCDelayed-RF Based Test Development for FM Transceivers Using Signature Analysis.Erkan Acar, Sule Ozev
2004VTSWafer-level RF Test and DfT for VCO Modulating Transceiver Architecures.Sule Ozev, Christian Olgaard
2003ICCADTAM Optimization for Mixed-Signal SOCs using Analog Test Wrappers.Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty
2003ITCTesting of Droplet-Based Microelectrofluidic Systems.Fei Su, Sule Ozev, Krishnendu Chakrabarty
2002ICCDCost-Effective Concurrent Test Hardware Design for Linear Analog Circuits.Sule Ozev, Alex Orailoglu
2002ISCASAutomated test development and test time reduction for RF subsystems.Sule Ozev, Alex Orailoglu, Hosam Haggag
2002VTSBoosting the Accuracy of Analog Test Coverage Computation through Statistical Tolerance Analysis.Sule Ozev, Alex Orailoglu
2001ITCTestability implications in low-cost integrated radio transceivers: a Bluetooth case study.Christian Olgaard, Sule Ozev, Alex Orailoglu
2000DATETest Synthesis for Mixed-Signal SOC Paths.Sule Ozev, Ismet Bayraktaroglu, Alex Orailoglu
2000VTSTest Selection Based on High Level Fault Simulation for Mixed-Signal Systems.Sule Ozev, Alex Orailoglu