Yasuo Sato
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
29
Venues
10
Active years
1983–2019
Best venue rank
A*
Where they publish
Papers
29 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2019 | PRDC | On-Chip Delay Measurement for In-Field Test of FPGAs. | Yousuke Miyake, Yasuo Sato, Seiji Kajihara |
| 2016 | ETS | Reliability enhancement of embedded memory with combination of aging-aware adaptive in-field self-repair and ECC. | Gian Mayuga, Yuta Yamato, Tomokazu Yoneda, Yasuo Sato, Michiko Inoue |
| 2015 | ETS | An ECC-based memory architecture with online self-repair capabilities for reliability enhancement. | Gian Mayuga, Yuta Yamato, Tomokazu Yoneda, Michiko Inoue, Yasuo Sato |
| 2014 | PRDC | Reduction of NBTI-Induced Degradation on Ring Oscillators in FPGA. | Yasuo Sato, Masafumi Monden, Yousuke Miyake, Seiji Kajihara |
| 2012 | ETS | On-chip temperature and voltage measurement for field testing. | Yukiya Miura, Yasuo Sato, Yousuke Miyake, Seiji Kajihara |
| 2012 | ITC | DART: Dependable VLSI test architecture and its implementation. | Yasuo Sato, Seiji Kajihara, Tomokazu Yoneda, Kazumi Hatayama, Michiko Inoue, Yukiya Miura, Satosni Untake, Takumi Hasegawa, Motoyuki Sato, Kotaro Shimamura |
| 2011 | DSN | Genetic algorithm based approach for segmented testing. | Xiaoxin Fan, Sudhakar M. Reddy, Senling Wang, Seiji Kajihara, Yasuo Sato |
| 2011 | ETS | Temperature-Variation-Aware Test Pattern Optimization. | Tomokazu Yoneda, Makoto Nakao, Michiko Inoue, Yasuo Sato, Hideo Fujiwara |
| 2011 | VTS | Special session: Multifaceted approaches for field reliability. | Yasuo Sato |
| 2010 | ETS | On estimation of NBTI-Induced delay degradation. | Mitsumasa Noda, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen, Yukiya Miura |
| 2010 | IOLTS | Aging test strategy and adaptive test scheduling for SoC failure prediction. | Hyunbean Yi, Tomokazu Yoneda, Michiko Inoue, Yasuo Sato, Seiji Kajihara, Hideo Fujiwara |
| 2010 | VTS | Thermal-uniformity-aware X-filling to reduce temperature-induced delay variation for accurate at-speed testing. | Tomokazu Yoneda, Michiko Inoue, Yasuo Sato, Hideo Fujiwara |
| 2006 | ASPDAC | A dynamic test compaction procedure for high-quality path delay testing. | Masayasu Fukunaga, Seiji Kajihara, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato |
| 2006 | ITC | Recognition of Sensitized Longest Paths in Transition Delay Test. | Shuji Hamada, Toshiyuki Maeda, Atsuo Takatori, Yasuyuki Noduyama, Yasuo Sato |
| 2006 | ITC | A Framework of High-quality Transition Fault ATPG for Scan Circuits. | Seiji Kajihara, Shohei Morishima, Akane Takuma, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato |
| 2005 | ASPDAC | Evaluation of the statistical delay quality model. | Yasuo Sato, Shuji Hamada, Toshiyuki Maeda, Atsuo Takatori, Seiji Kajihara |
| 2005 | DAC | Path delay test compaction with process variation tolerance. | Seiji Kajihara, Masayasu Fukunaga, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato |
| 2005 | ITC | Invisible delay quality - SDQM model lights up what could not be seen. | Yasuo Sato, Shuji Hamada, Toshiyuki Maeda, Atsuo Takatori, Yasuyuki Nozuyama, Seiji Kajihara |
| 2003 | ASPDAC | DFT timing design methodology for at-speed BIST. | Yasuo Sato, Motoyuki Sato, Koki Tsutsumida, Masatoshi Kawashima, Kazumi Hatayama, Kazuyuki Nomoto |
| 2002 | ITC | Application of High-Quality Built-In Test to Industrial Designs. | Kazumi Hatayama, Michinobu Nakao, Yoshikazu Kiyoshige, Koichiro Natsume, Yasuo Sato, Takaharu Nagumo |
| 2002 | ITC | A Persistent Diagnostic Technique for Unstable Defects. | Yasuo Sato, Iwao Yamazaki, Hiroki Yamanaka, Toshio Ikeda, Masahiro Takakura |
| 2001 | ITC | An evaluation of defect-oriented test: WELL-controlled low voltage test. | Yasuo Sato, Masaki Kohno, Toshio Ikeda, Iwao Yamazaki, Masato Hamamoto |
| 2000 | ITC | A BIST approach for very deep sub-micron (VDSM) defects. | Yasuo Sato, Toyohito Ikeya, Michinobu Nakao, Takaharu Nagumo |
| 1996 | ICDCS | A Snapshot Algorithm for Distributed Mobile Systems. | Yasuo Sato, Michiko Inoue, Toshimitsu Masuzawa, Hideo Fujiwara |
| 1991 | DAC | Timing- and Constraint-Oriented Placement for Interconnected LSIs in Mainframe Design. | Yasushi Ogawa, Tsutomu Itoh, Yoshio Miki, Tatsuki Ishii, Yasuo Sato, Reiji Toyoshima |
| 1986 | ICASSP | Connected word recognition by overlap and split of reference patterns and its performance evaluation tests. | Koji Tajima, Mitsuo Komura, Yasuo Sato |
| 1984 | ICASSP | Automatic recognition of spoken words from a large vocabulary using syllable templates. | Hiroya Fujisaki, Keikichi Hirose, Tomohiro Inoue, Yasuo Sato |
| 1984 | ICASSP | Spectral envelope sampling and interpolation in linear predictive analysis of speech. | Hynek Hermansky, Hiroya Fujisaki, Yasuo Sato |
| 1983 | ICASSP | Analysis and synthesis of speech based on spectral transform linear predictive method. | Hynek Hermansky, Hiroya Fujisaki, Yasuo Sato |