Yuta Yamato
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
15
Venues
9
Active years
2006–2016
Best venue rank
B
Where they publish
Papers
15 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2016 | ETS | Reliability enhancement of embedded memory with combination of aging-aware adaptive in-field self-repair and ECC. | Gian Mayuga, Yuta Yamato, Tomokazu Yoneda, Yasuo Sato, Michiko Inoue |
| 2015 | ETS | An ECC-based memory architecture with online self-repair capabilities for reliability enhancement. | Gian Mayuga, Yuta Yamato, Tomokazu Yoneda, Michiko Inoue, Yasuo Sato |
| 2014 | FPGA | Memory block based scan-BIST architecture for application-dependent FPGA testing. | Keita Ito, Tomokazu Yoneda, Yuta Yamato, Kazumi Hatayama, Michiko Inoue |
| 2012 | ITC | A fast and accurate per-cell dynamic IR-drop estimation method for at-speed scan test pattern validation. | Yuta Yamato, Tomokazu Yoneda, Kazumi Hatayama, Michiko Inoue |
| 2012 | VTS | A novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits. | Kohei Miyase, Masao Aso, Ryou Ootsuka, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Kazunari Enokimoto, Seiji Kajihara |
| 2011 | DATE | Transition-Time-Relation based capture-safety checking for at-speed scan test generation. | Kohei Miyase, Xiaoqing Wen, Masao Aso, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara |
| 2011 | ISLPED | SAT-based capture-power reduction for at-speed broadcast-scan-based test compression architectures. | Michael A. Kochte, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Kazunari Enokimoto, Hans-Joachim Wunderlich |
| 2011 | ITC | A novel scan segmentation design method for avoiding shift timing failure in scan testing. | Yuta Yamato, Xiaoqing Wen, Michael A. Kochte, Kohei Miyase, Seiji Kajihara, Laung-Terng Wang |
| 2011 | VTS | Power-aware test generation with guaranteed launch safety for at-speed scan testing. | Xiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A. Kochte, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor |
| 2009 | ICCAD | A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment. | Kohei Miyase, Yuta Yamato, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Xiaoqing Wen, Seiji Kajihara |
| 2009 | PRDC | A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-speed Scan Testing. | Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Hiroshi Furukawa, Seiji Kajihara |
| 2008 | ETS | A Capture-Safe Test Generation Scheme for At-Speed Scan Testing. | Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Hiroshi Furukawa, Yuta Yamato, Atsushi Takashima, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja |
| 2008 | ICCAD | Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification. | Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara |
| 2007 | ITC | A novel scheme to reduce power supply noise for high-quality at-speed scan testing. | Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Tatsuya Suzuki, Yuta Yamato, Patrick Girard, Yuji Ohsumi, Laung-Terng Wang |
| 2006 | ICCD | Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation. | Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Yuta Yamato, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja |