Worst-case analysis to obtain stable read/write DC margin of high density 6T-SRAM-array with local Vth variability.

Yasumasa Tsukamoto, Koji Nii, Susumu Imaoka, Yuji Oda, Shigeki Ohbayashi, Tomoaki Yoshizawa, Hiroshi Makino, Koichiro Ishibashi, Hirofumi Shinohara

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