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Alex Orailoglu

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

145

Venues

17

Active years

1986–2026

Best venue rank

A*

Where they publish

Papers

145 indexed papers, newest first.

YearVenueTitleAuthors
2026ASPDACPrometheusFree: Concurrent Detection of Laser Fault Injection Attacks in Optical Neural Networks.Kota Nishida, Yoshihiro Midoh, Noriyuki Miura, Satoshi Kawakami, Alex Orailoglu, Jun Shiomi
2025ASPDACWhite-box logic obfuscation: A Transparent Solution to Hardware Piracy and Reverse Engineering.Leon Li, Alex Orailoglu
2024ETSTranscoders: A Better Alternative To Denoising Autoencoders.Pushpak Raj Gautam, Alex Orailoglu
2024ITCLocked-by-Design: Enhancing White-box Logic Obfuscation with Effective Key Mutation.Leon Li, Alex Orailoglu
2023VTSThwarting Reverse Engineering Attacks through Keyless Logic Obfuscation.Leon Li, Alex Orailoglu
2022DATEJANUS-HD: Exploiting FSM Sequentiality and Synthesis Flexibility in Logic Obfuscation to Thwart SAT Attack While Offering Strong Corruption.Leon Li, Alex Orailoglu
2021ICCADEvolving Complementary Sparsity Patterns for Hardware-Friendly Inference of Sparse DNNs.Elbruz Ozen, Alex Orailoglu
2020ASPDACConcurrent Monitoring of Operational Health in Neural Networks Through Balanced Output Partitions.Elbruz Ozen, Alex Orailoglu
2020CCSHunting Sybils in Participatory Mobile Consensus-Based Networks.Nickolai Verchok, Alex Orailoglu
2020DATETest Pattern Superposition to Detect Hardware Trojans.Chris Nigh, Alex Orailoglu
2020ICCADJust Say Zero: Containing Critical Bit-Error Propagation in Deep Neural Networks With Anomalous Feature Suppression.Elbruz Ozen, Alex Orailoglu
2020ICCADA Crowd-Based Explosive Detection System with Two-Level Feedback Sensor Calibration.Chengmo Yang, Patrick Cronin, Agamyrat Agambayev, Sule Ozev, A. Enis etin, Alex Orailoglu
2020VTSTaming Combinational Trojan Detection Challenges with Self-Referencing Adaptive Test Patterns.Chris Nigh, Alex Orailoglu
2019DATEPiercing Logic Locking Keys through Redundancy Identification.Leon Li, Alex Orailoglu
2019ICASSPDetecting Gas Vapor Leaks through Uncalibrated Sensor Based CPS.Diaa Badawi, Sule Ozev, Jennifer Blain Christen, Chengmo Yang, Alex Orailoglu, A. Enis etin
2019VTSShielding Logic Locking from Redundancy Attacks.Leon Li, Alex Orailoglu
2018ITCVariation-Aware Hardware Trojan Detection through Power Side-channel.Fakir Sharif Hossain, Michihiro Shintani, Michiko Inoue, Alex Orailoglu
2017ASPDACEnsuring system security through proximity based authentication.Joshua Marxen, Alex Orailoglu
2017ETSDetecting hardware Trojans without a Golden IC through clock-tree defined circuit partitions.Fakir Sharif Hossain, Tomokazu Yoneda, Michiko Inoue, Alex Orailoglu
2015ICCDMobile ecosystem driven application-specific low-power control microarchitecture.Garo Bournoutian, Alex Orailoglu
2014DATEOn-device objective-C application optimization framework for high-performance mobile processors.Garo Bournoutian, Alex Orailoglu
2014ISLPEDSleep-aware variable partitioning for energy-efficient hybrid PRAM and DRAM main memory.Chenchen Fu, Mengying Zhao, Chun Jason Xue, Alex Orailoglu
2013ASPDACFull exploitation of process variation space for continuous delivery of optimal delay test quality.Baris Arslan, Alex Orailoglu
2013DATEProfit maximization through process variation aware high level synthesis with speed binning.Mengying Zhao, Alex Orailoglu, Chun Jason Xue
2013VTSTracing the best test mix through multi-variate quality tracking.Baris Arslan, Alex Orailoglu
2013VTSTowards a cost-effective hardware trojan detection methodology.Raymond Paseman, Alex Orailoglu
2013RTCSABranch Prediction directed Dynamic instruction Cache Locking for embedded systems.Keni Qiu, Mengying Zhao, Chun Jason Xue, Alex Orailoglu
2012VTSDelay test resource allocation and scheduling for multiple frequency domains.Baris Arslan, Alex Orailoglu
2012VTSSmall-delay defects detection under process variation using Inter-Path Correlation.Francisco J. Galarza-Medina, Jose Luis Garcia-Gervacio, Vctor H. Champac, Alex Orailoglu
2011DACDiagnosing scan clock delay faults through statistical timing pruning.Mingjing Chen, Alex Orailoglu
2011DATEAdaptive test optimization through real time learning of test effectiveness.Baris Arslan, Alex Orailoglu
2011DATEDiagnosing scan chain timing faults through statistical feature analysis of scan images.Mingjing Chen, Alex Orailoglu
2011DATERegister allocation for simultaneous reduction of energy and peak temperature on registers.Tiantian Liu, Alex Orailoglu, Chun Jason Xue, Minming Li
2011DATEFrugal but flexible multicore topologies in support of resource variation-driven adaptivity.Chengmo Yang, Alex Orailoglu
2010DATECost-effective IR-drop failure identification and yield recovery through a failure-adaptive test scheme.Mingjing Chen, Alex Orailoglu
2010ICCDDelay test quality maximization through process-aware selection of test set size.Baris Arslan, Alex Orailoglu
2010VTSVDDmin test optimization for overscreening minimization through adaptive scan chain masking.Mingjing Chen, Alex Orailoglu
2009CASESReducing impact of cache miss stalls in embedded systems by extracting guaranteed independent instructions.Garo Bournoutian, Alex Orailoglu
2009DATEMaking DNA self-assembly error-proof: Attaining small growth error rates through embedded information redundancy.Saturnino Garcia, Alex Orailoglu
2009DATETowards no-cost adaptive MPSoC static schedules through exploitation of logical-to-physical core mapping latitude.Chengmo Yang, Alex Orailoglu
2009DSNProcessor reliability enhancement through compiler-directed register file peak temperature reduction.Chengmo Yang, Alex Orailoglu
2009ICCADScan power reduction in linear test data compression scheme.Mingjing Chen, Alex Orailoglu
2008CASESA light-weight cache-based fault detection and checkpointing scheme for MPSoCs enabling relaxed execution synchronization.Chengmo Yang, Alex Orailoglu
2008DACMiss reduction in embedded processors through dynamic, power-friendly cache design.Garo Bournoutian, Alex Orailoglu
2008DATETowards fault tolerant parallel prefix adders in nanoelectronic systems.Wenjing Rao, Alex Orailoglu
2008ICCDTest cost minimization through adaptive test development.Mingjing Chen, Alex Orailoglu
2007ASPDACCore-Based Testing of Multiprocessor System-on-Chips Utilizing Hierarchical Functional Buses.Fawnizu Azmadi Hussin, Tomokazu Yoneda, Alex Orailoglu, Hideo Fujiwara
2007CASESLight-weight synchronization for inter-processor communication acceleration on embedded MPSoCs.Chengmo Yang, Alex Orailoglu
2007DATEInteractive presentation: Logic level fault tolerance approaches targeting nanoelectronics PLAs.Wenjing Rao, Alex Orailoglu, Ramesh Karri
2007DSNFault Tolerant Approaches to Nanoelectronic Programmable Logic Arrays.Wenjing Rao, Alex Orailoglu, Ramesh Karri
2007ICCDPower efficient register file update approach for embedded processors.Raid Ayoub, Alex Orailoglu
2007ICCDCircuit-level mismatch modelling and yield optimization for CMOS analog circuits.Mingjing Chen, Alex Orailoglu
2006CASESPower efficient branch prediction through early identification of branch addresses.Chengmo Yang, Alex Orailoglu
2006DACTopology aware mapping of logic functions onto nanowire-based crossbar architectures.Wenjing Rao, Alex Orailoglu, Ramesh Karri
2006ETSFault Identification in Reconfigurable Carry Lookahead Adders Targeting Nanoelectronic Fabrics.Wenjing Rao, Alex Orailoglu, Ramesh Karri
2006ICCDPower-Constrained SOC Test Schedules through Utilization of Functional Buses.Fawnizu Azmadi Hussin, Tomokazu Yoneda, Alex Orailoglu, Hideo Fujiwara
2006VTSDecision Tree Based Mismatch Diagnosis in Analog Circuits.Mingjing Chen, Hosam Haggag, Alex Orailoglu
2006VTSNanofabric Topologies and Reconfiguration Algorithms to Support Dynamically Adaptive Fault Tolerance.Wenjing Rao, Alex Orailoglu, Ramesh Karri
2005ASPDACA unified transformational approach for reductions in fault vulnerability, power, and crosstalk noise & delay on processor buses.Raid Ayoub, Alex Orailoglu
2005ASPDACFault tolerant nanoelectronic processor architectures.Wenjing Rao, Alex Orailoglu, Ramesh Karri
2005ASPDACForward discrete probability propagation method for device performance characterization under process variations.Rasit Onur Topaloglu, Alex Orailoglu
2005ASPDACFault tolerant quantum cellular array (QCA) design using Triple Modular Redundancy with shifted operands.Tongquan Wei, Kaijie Wu, Ramesh Karri, Alex Orailoglu
2005DACEnergy-effcient physically tagged caches for embedded processors with virtual memory.Peter Petrov, Daniel Tracy, Alex Orailoglu
2005DACA DFT approach for diagnosis and process variation-aware structural test of thermometer coded current steering DACs.Rasit Onur Topaloglu, Alex Orailoglu
2005ICCDArchitectural-Level Fault Tolerant Computation in Nanoelectronic Processors.Wenjing Rao, Alex Orailoglu, Ramesh Karri
2004ASPDACEfficient RT-level fault diagnosis methodology.Ozgur Sinanoglu, Alex Orailoglu
2004ASPDACOn mismatch in the deep sub-micron era - from physics to circuits.Rasit Onur Topaloglu, Alex Orailoglu
2004DATECircularScan: A Scan Architecture for Test Cost Reduction.Baris Arslan, Alex Orailoglu
2004DATEScan Power Minimization through Stimulus and Response Transformations.Ozgur Sinanoglu, Alex Orailoglu
2004ETSPipelined test of SOC cores through test data transformations.Ozgur Sinanoglu, Alex Orailoglu
2004ICCADDesign space exploration for aggressive test cost reduction in CircularScan architectures.Baris Arslan, Alex Orailoglu
2004ICCADFrugal linear network-based test decompression for drastic test cost reductions.Wenjing Rao, Alex Orailoglu, George Su
2004ICCDExtending the Applicability of Parallel-Serial Scan Designs.Baris Arslan, Ozgur Sinanoglu, Alex Orailoglu
2004ICCDEnd-to-End Testability Analysis and DfT Insertion for Mixed-Signal Paths.Sule Ozev, Alex Orailoglu
2004ITCTest Cost Reduction Through A Reconfigurable Scan Architecture.Baris Arslan, Alex Orailoglu
2004ITCFault Tolerant Arithmetic with Applications in Nanotechnology based Systems.Wenjing Rao, Alex Orailoglu, Ramesh Karri
2004ITCAutonomous Yet Deterministic Test of SOC Cores.Ozgur Sinanoglu, Alex Orailoglu
2003DACTest application time and volume compression through seed overlapping.Wenjing Rao, Ismet Bayraktaroglu, Alex Orailoglu
2003DATEPower Efficiency through Application-Specific Instruction Memory Transformations.Peter Petrov, Alex Orailoglu
2003DATEVirtual Compression through Test Vector Stitching for Scan Based Designs.Wenjing Rao, Alex Orailoglu
2003DSDCustomizable Embedded Processor Architectures.Peter Petrov, Alex Orailoglu
2003DSDLow-power Branch Target Buffer for Application-Specific Embedded Processors.Peter Petrov, Alex Orailoglu
2003DSDHierarchical Constraint Conscious RT-level Test Generation.Ozgur Sinanoglu, Alex Orailoglu
2003ETSParity-based output compaction for core-based SOCs [logic testing].Ozgur Sinanoglu, Alex Orailoglu
2003ICCADCompiler-Based Register Name Adjustment for Low-Power Embedded Processors.Peter Petrov, Alex Orailoglu
2003ICCADPartial Core Encryption for Performance-Efficient Test of SOCs.Ozgur Sinanoglu, Alex Orailoglu
2003ICCDVirtual Page Tag Reduction for Low-power TLBs.Peter Petrov, Alex Orailoglu
2003ICCDAggressive Test Power Reduction Through Test Stimuli Transformation.Ozgur Sinanoglu, Alex Orailoglu
2003ITCModeling Scan Chain Modifications For Scan-in Test Power Minimization.Ozgur Sinanoglu, Alex Orailoglu
2003VTSDecompression Hardware Determination for Test Volume and Time Reduction through Unified Test Pattern Compaction and Compression.Ismet Bayraktaroglu, Alex Orailoglu
2002DATEGate Level Fault Diagnosis in Scan-Based BIST.Ismet Bayraktaroglu, Alex Orailoglu
2002DATETest Planning and Design Space Exploration in a Core-Based Environment.rika F. Cota, Luigi Carro, Marcelo Lubaszewski, Alex Orailoglu
2002DATEPower Efficient Embedded Processor Ip's through Application-Specific Tag Compression in Data Caches.Peter Petrov, Alex Orailoglu
2002DATEReducing Test Application Time Through Test Data Mutation Encoding.Sherief Reda, Alex Orailoglu
2002ETSDynamic test data transformations for average and peak power reductions.Ozgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailoglu
2002ICCADA novel scan architecture for power-efficient, rapid test.Ozgur Sinanoglu, Alex Orailoglu
2002ICCDFault Dictionary Size Reduction through Test Response Superposition.Baris Arslan, Alex Orailoglu
2002ICCDCost-Effective Concurrent Test Hardware Design for Linear Analog Circuits.Sule Ozev, Alex Orailoglu
2002ISCASAutomated test development and test time reduction for RF subsystems.Sule Ozev, Alex Orailoglu, Hosam Haggag
2002ITCScan Power Reduction Through Test Data Transition Frequency Analysis.Ozgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailoglu
2002VTSBoosting the Accuracy of Analog Test Coverage Computation through Statistical Tolerance Analysis.Sule Ozev, Alex Orailoglu
2002VTSTest Power Reduction through Minimization of Scan Chain Transitions.Ozgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailoglu
2001DACTest Volume and Application Time Reduction Through Scan Chain Concealment.Ismet Bayraktaroglu, Alex Orailoglu
2001DACSpeeding Up Control-Dominated Applications through Microarchitectural Customizations in Embedded Processors.Peter Petrov, Alex Orailoglu
2001DATEDiagnosis for scan-based BIST: reaching deep into the signatures.Ismet Bayraktaroglu, Alex Orailoglu
2001ITCTestability implications in low-cost integrated radio transceivers: a Bluetooth case study.Christian Olgaard, Sule Ozev, Alex Orailoglu
2001ITCSpace and time compaction schemes for embedded cores.Ozgur Sinanoglu, Alex Orailoglu
2001VTSEfficient Transparency Extraction and Utilization in Hierarchical Test.Yiorgos Makris, Vishal Patel, Alex Orailoglu
2001VTSRT-level Fault Simulation Based on Symbolic Propagation.Ozgur Sinanoglu, Alex Orailoglu
2000DACImproved fault diagnosis in scan-based BIST via superposition.Ismet Bayraktaroglu, Alex Orailoglu
2000DATETest Quality and Fault Risk in Digital Filter Datapath BIST.Laurence Goodby, Alex Orailoglu
2000DATETest Synthesis for Mixed-Signal SOC Paths.Sule Ozev, Ismet Bayraktaroglu, Alex Orailoglu
2000ETSLow cost concurrent test implementation for linear digital systems.Ismet Bayraktaroglu, Alex Orailoglu
2000ETSHow to avoid random walks in hierarchical test path identification.Yiorgos Makris, Jamison Collins, Alex Orailoglu
2000ICASSPCost effective digital filter design for concurrent test.Ismet Bayraktaroglu, Alex Orailoglu
2000ISCASUnifying methodologies for high fault coverage concurrent and off-line test of digital filters.Ismet Bayraktaroglu, Alex Orailoglu
2000ISCASTransparency-based hierarchical test generation for modular RTL designs.Yiorgos Makris, Jamison Collins, Alex Orailoglu, Praveen Vishakantaiah
2000ITCDeterministic partitioning techniques for fault diagnosis in scan-based BIST.Ismet Bayraktaroglu, Alex Orailoglu
2000VTSInvariance-Based On-Line Test for RTL Controller-Datapath Circuits.Yiorgos Makris, Ismet Bayraktaroglu, Alex Orailoglu
2000VTSTest Selection Based on High Level Fault Simulation for Mixed-Signal Systems.Sule Ozev, Alex Orailoglu
1999DATESelf Recovering Controller and Datapath Codesign.Samuel Norman Hamilton, Alex Orailoglu, Andre Hertwig
1999DATEChannel-Based Behavioral Test Synthesis for Improved Module Reachability.Yiorgos Makris, Alex Orailoglu
1999VTSLow-Cost On-Line Test for Digital Filters.Ismet Bayraktaroglu, Alex Orailoglu
1998DATEConcurrent Error Recovery with Near-Zero Latency in Synthesized ASICs.Samuel Norman Hamilton, Alex Orailoglu
1998ITCDFT guidance through RTL test justification and propagation analysis.Yiorgos Makris, Alex Orailoglu
1997DACFrequency-Domain Compatibility in Digital Filter BIST.Laurence Goodby, Alex Orailoglu
1996DACPseudorandom-Pattern Test Resistance in High-Performance DSP Datapaths.Laurence Goodby, Alex Orailoglu
1996DATEHigh-level synthesis of gracefully degradable ASICs.Wah Chan, Alex Orailoglu
1996ICASSPVariance mismatch: identifying random-test resistance in DSP datapaths.Laurence Goodby, Alex Orailoglu
1996ICCDMicroarchitectural synthesis of gracefully degradable, dynamically reconfigurable ASICs.Alex Orailoglu
1996VTSCan Defect-Tolerant Chips Better Meet the Quality Challenge?R. L. Campbell, P. Kuekes, David Y. Lepejian, Wojciech P. Maly, Michael Nicolaidis, Alex Orailoglu
1995ITCTowards 100% Testable FIR Digital Filters.Laurence Goodby, Alex Orailoglu
1995VTSTestability metrics for synthesis of self-testable designs and effective test plans.Mahsa Vahidi, Alex Orailoglu
1994DACMicroarchitectural Synthesis of VLSI Designs with High Test Concurrency.Ian G. Harris, Alex Orailoglu
1994DACArea-Efficient Fault Detection During Self-Recovering Microarchitecture Synthesis.Ramesh Karri, Alex Orailoglu
1994ICCDMicroarchitectural Synthesis of Performance-Constrained, Low-Power VLSI Designs.Laurence Goodby, Alex Orailoglu, Paul M. Chau
1994ICCDSYNCBIST: SYNthesis for Concurrent Built-In-Self-Testability.Ian G. Harris, Alex Orailoglu
1994ICCDIntegrating Binding Constraints in the Synthesis of Area-Efficient Self-Recovering Microarchitectures.Karin Hgstedt, Alex Orailoglu
1993DACHigh-Level Synthesis of Fault-Secure Microarchitectures.Ramesh Karri, Alex Orailoglu
1993ICCDTest Path Generation and Test Scheduling for Self-Testable Designs.Alex Orailoglu, Ian G. Harris
1993ISCASIntertwined Scheduling, Module Selection and Allocation in Time-and-Area.Ian G. Harris, Alex Orailoglu
1992DACTransformation-Based High-Level Synthesis of Fault-Tolerant ASICs.Ramesh Karri, Alex Orailoglu
1992ICCDHigh-Level Synthesis of Self-Recovering MicroArchitectures.Alex Orailoglu, Ramesh Karri
1991MICROALPS: An Algorithm for Pipeline Data Path Synthesis.Ramesh Karri, Alex Orailoglu
1986DACFlow graph representation.Alex Orailoglu, Daniel Gajski