Fernando M. Gonalves
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
15
Venues
7
Active years
1991–2019
Best venue rank
A
Where they publish
Papers
15 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2019 | ISCAS | Low Energy Heterogeneous Computing with Multiple RISC-V and CGRA Cores. | Lus Fiolhais, Fernando M. Gonalves, Rui Policarpo Duarte, Mrio P. Vstias, Jos T. de Sousa |
| 2014 | EUC | High-Level Synthesis in the Delft Workbench Hardware/Software Co-design Tool-Chain. | Razvan Nane, Vlad Mihai Sima, Cuong Pham-Quoc, Fernando M. Gonalves, Koen Bertels |
| 2005 | FPL | A Low-Cost Scalable Pipelined Reconfigurable Architecture for Simulation of Digital Circuits. | Victor Gonalves, Jos T. de Sousa, Fernando M. Gonalves |
| 2003 | IOLTS | Property Coverage for Quality Assessment of Fault Tolerant or Fail Safe Systems. | Fernando M. Gonalves, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira |
| 2002 | FPL | DARP - A Digital Audio Reconfigurable Processor. | Jos T. de Sousa, Fernando M. Gonalves, Nuno Barreiro, Joo Moura |
| 2001 | ETS | RTL design validation, DFT and test pattern generation for high defects coverage. | Marcelino B. Santos, Fernando M. Gonalves, Isabel C. Teixeira, Joo Paulo Teixeira |
| 2001 | IOLTS | Design and Test of Certifiable ASICs for Safety-Critical Gas Burners Contro. | Fernando M. Gonalves, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira |
| 2001 | ITC | Implicit functionality and multiple branch coverage (IFMB): a testability metric for RT-level. | Fernando M. Gonalves, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira |
| 2000 | ETS | RTL-based functional test generation for high defects coverage in digital SOCs. | Marcelino B. Santos, Fernando M. Gonalves, Isabel C. Teixeira, Joo Paulo Teixeira |
| 1999 | VTS | Defect-Oriented Verilog Fault Simulation of SoC Macros using a Stratified Fault Sampling Technique. | Marcelino B. Santos, Fernando M. Gonalves, Isabel C. Teixeira, Joo Paulo Teixeira |
| 1998 | ITC | Defect-oriented test quality assessment using fault sampling and simulation. | Fernando M. Gonalves, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira |
| 1998 | VTS | Sampling Techniques of Non-Equally Probable Faults in VLSI System. | Fernando M. Gonalves, Joo Paulo Teixeira |
| 1994 | ITC | Back Annotation of Physical Defects into Gate-Level, Realistic Faults in Digital ICs. | Mario Calha, Marcelino B. Santos, Fernando M. Gonalves, Isabel C. Teixeira, Joo Paulo Teixeira |
| 1992 | ITC | Physical DFT for High Coverage of Realistic Faults. | M. Saraiva, P. Casimiro, Marcelino B. Santos, Jos T. de Sousa, Fernando M. Gonalves, Isabel C. Teixeira, Joo Paulo Teixeira |
| 1991 | ITC | IC Defects-Based Testability Analysis. | Jos T. de Sousa, Fernando M. Gonalves, Joo Paulo Teixeira |