| 2017 | VTS | Keynote address tribute to Professor Mel Breuer: Contributions to CAD and Test. | Sandeep Gupta, Miron Abramovici, Magdy Abadir, Sridhar Narayanan |
| 2010 | DAC | Bridging pre-silicon verification and post-silicon validation. | Amir Nahir, Avi Ziv, Rajesh Galivanche, Alan J. Hu, Miron Abramovici, Albert Camilleri, Bob Bentley, Harry Foster, Valeria Bertacco, Shakti Kapoor |
| 2006 | DAC | A reconfigurable design-for-debug infrastructure for SoCs. | Miron Abramovici, Paul Bradley, Kumar N. Dwarakanath, Peter Levin, Grard Memmi, Dave Miller |
| 2002 | DAC | Using embedded FPGAs for SoC yield improvement. | Miron Abramovici, Charles E. Stroud, John Marty Emmert |
| 2002 | DAC | Low-cost sequential ATPG with clock-control DFT. | Miron Abramovici, Xiaoming Yu, Elizabeth M. Rudnick |
| 2002 | IOLTS | BIST-Based Delay-Fault Testing in FPGAs. | Miron Abramovici, Charles E. Stroud |
| 2002 | ITC | BIST-Based Diagnosis of FPGA Interconnect. | Charles E. Stroud, Jeremy Nall, Matthew Lashinsky, Miron Abramovici |
| 2001 | FCCM | A Configurable Hardware/Software Approach to SAT Solving. | Jos T. de Sousa, J. M. da Silva, Miron Abramovici |
| 2001 | IOLTS | On-Line BIST and Diagnosis of FPGA Interconnect Using Roving STARs. | Miron Abramovici, Charles E. Stroud, Matthew Lashinsky, Jeremy Nall, John Marty Emmert |
| 2001 | ITC | At-speed logic BIST using a frozen clock testing strategy. | Jongshin Shin, Xiaoming Yu, Elizabeth M. Rudnick, Miron Abramovici |
| 2000 | FCCM | Dynamic Fault Tolerance in FPGAs via Partial Reconfiguration. | John Marty Emmert, Charles E. Stroud, Brandon Skaggs, Miron Abramovici |
| 2000 | FPL | Performance Penalty for Fault Tolerance in Roving STARs. | John Marty Emmert, Charles E. Stroud, Jason A. Cheatham, Andrew M. Taylor, Pankaj Kataria, Miron Abramovici |
| 2000 | IOLTS | Improving On-Line BIST-Based Diagnosis for Roving STARs. | Miron Abramovici, Charles E. Stroud, Brandon Skaggs, John Marty Emmert |
| 2000 | ITC | DIST-based detection and diagnosis of multiple faults in FPGAs. | Miron Abramovici, Charles E. Stroud |
| 2000 | ITC | MUST: multiple-stem analysis for identifying sequentially untestable faults. | Qiang Peng, Miron Abramovici, Jacob Savir |
| 1999 | DAC | A Massively-Parallel Easily-Scalable Satisfiability Solver Using Reconfigurable Hardware. | Miron Abramovici, Jos T. de Sousa, Daniel G. Saab |
| 1999 | DATE | FreezeFrame: Compact Test Generation Using a Frozen Clock Strategy. | Yanti Santoso, Matthew C. Merten, Elizabeth M. Rudnick, Miron Abramovici |
| 1999 | FCCM | A Virtual Logic Algorithm for Solving Satisfiability Problems Using Reconfigurable Hardware. | Miron Abramovici, Jos T. de Sousa |
| 1999 | ITC | Using roving STARs for on-line testing and diagnosis of FPGAs in fault-tolerant applications. | Miron Abramovici, Charles E. Stroud, Carter Hamilton, Sajitha Wijesuriya, Vinay Verma |
| 1998 | ITC | Built-in self-test of FPGA interconnect. | Charles E. Stroud, Sajitha Wijesuriya, Carter Hamilton, Miron Abramovici |
| 1997 | FCCM | Fault simulation on reconfigurable hardware. | Miron Abramovici, Prem R. Menon |
| 1997 | FPL | Satisfiability on reconfigurable hardware. | Miron Abramovici, Daniel G. Saab |
| 1997 | ITC | BIST-Based Diagnostics of FPGA Logic Blocks. | Charles E. Stroud, Eric Lee, Miron Abramovici |
| 1996 | DAC | Identifying Sequential Redundancies Without Search. | Mahesh A. Iyer, David E. Long, Miron Abramovici |
| 1996 | DATE | Surprises in Sequential Redundancy Identification. | Mahesh A. Iyer, David E. Long, Miron Abramovici |
| 1996 | FPGA | Evaluation of FPGA Resources for Built-In Self-Test of Programmable Logic Blocks. | Charles E. Stroud, Ping Chen, Srinivasa Konala, Miron Abramovici |
| 1996 | ITC | Using ILA Testing for BIST in FPGAs. | Charles E. Stroud, Eric Lee, Srinivasa Konala, Miron Abramovici |
| 1996 | VTS | Increasing testability by clock transformation (getting rid of those darn states). | Krishna B. Rajan, David E. Long, Miron Abramovici |
| 1996 | VTS | Built-in self-test of logic blocks in FPGAs (Finally, a free lunch: BIST without overhead!). | Charles E. Stroud, Srinivasa Konala, Ping Chen, Miron Abramovici |
| 1995 | ITC | On Combining Design for Testability Techniques. | Prashant S. Parikh, Miron Abramovici |
| 1995 | VTS | Identifying sequentially untestable faults using illegal states. | David E. Long, Mahesh A. Iyer, Miron Abramovici |
| 1994 | ITC | Sequentially Untestable Faults Identified Without Search ("Simple Implications Beat Exhaustive Search!"). | Mahesh A. Iyer, Miron Abramovici |
| 1994 | VLSID | Low-Cost Redundancy Identification for Combinatorial Circuits. | Mahesh A. Iyer, Miron Abramovici |
| 1993 | DAC | A Cost-Based Approach to Partial Scan. | Prashant S. Parikh, Miron Abramovici |
| 1993 | ITC | DOs and DON'Ts in Computing Fault Coverage. | Miron Abramovici |
| 1993 | ITC | On Selecting Flip-Flops for Partial Reset. | Miron Abramovici, Prashant S. Parikh, Ben Mathew, Daniel G. Saab |
| 1992 | DAC | Freeze!: A New Approach for Testing Sequential Circuits. | Miron Abramovici, Krishna B. Rajan, David T. Miller |
| 1992 | ITC | One-Pass Redundancy Identification and Removal. | Miron Abramovici, Mahesh A. Iyer |
| 1992 | ITC | Warning: 100% Fault Coverage May Be Misleading!! | Miron Abramovici, Prashant S. Parikh |
| 1991 | ITC | The Best Flip-Flops to Scan. | Miron Abramovici, James J. Kulikowski, Rabindra K. Roy |
| 1990 | ITC | Global cost functions for test generation. | Miron Abramovici, David T. Miller, R. Henning |
| 1989 | ICCAD | Dynamic redundancy identification in automatic test generation. | Miron Abramovici, David T. Miller, Rabindra K. Roy |
| 1989 | ICCD | System-level design verification in the AT&T computer division: overview and strategy. | Miron Abramovici, J. W. Bierbauer, R. H. Hellman, C. L. Hong, David T. Miller, R. G. Taylor |
| 1989 | ICCD | System-level design verification in the AT&T Computer Division: tools. | Miron Abramovici, James J. Kulikowski, David T. Miller, Prem R. Menon |
| 1988 | ICCAD | Critical path tracing in sequential circuits. | Prem R. Menon, Ytzhak H. Levendel, Miron Abramovici |
| 1988 | ITC | What is the Path to Fast Fault Simulation? | Miron Abramovici, Balaji Krishnamurthy, Rob Mathews, Bill Rogers, Michael Schulz, Sharad Seth, John A. Waicukauski |
| 1985 | ITC | Low-Cost Fault Simulation: Why, When and How. | Miron Abramovici |
| 1985 | ITC | Test Generation In Lamp2: System Overview. | Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller |
| 1985 | ITC | Test Generation In Lamp2: Concepts and Algorithms. | Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller |
| 1983 | DAC | Critical path tracing - an alternative to fault simulation. | Miron Abramovici, Prem R. Menon, David T. Miller |
| 1983 | ITC | A Practical Approach to Fault Simulation and Test Generation for Bridging Faults. | Miron Abramovici, Premachandran R. Menon |
| 1982 | DAC | A logic simulation machine. | Miron Abramovici, Ytzhak H. Levendel, Prem R. Menon |
| 1982 | ISCA | A logic simulation machine. | Miron Abramovici, Ytzhak H. Levendel, Prem R. Menon |
| 1981 | DAC | A maximal resolution guided-probe testing algorithm. | Miron Abramovici |
| 1980 | DAC | Fault diagnosis based on effect-cause analysis: An introduction. | Miron Abramovici, Melvin A. Breuer |
| 1977 | DAC | Concurrent fault simulation and functional level modeling. | Miron Abramovici, Melvin A. Breuer, K. Kumar |