Skip to content

Mohammad Tehranipoor

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

56

Venues

11

Active years

2005–2014

Best venue rank

A*

Where they publish

Papers

56 indexed papers, newest first.

YearVenueTitleAuthors
2014DACLow-cost On-Chip Structures for Combating Die and IC Recycling.Ujjwal Guin, Xuehui Zhang, Domenic Forte, Mohammad Tehranipoor
2014DACTI-TRNG: Technology Independent True Random Number Generator.Md Tauhidur Rahman, Kan Xiao, Domenic Forte, Xuhei Zhang, Zhijie Jerry Shi, Mohammad Tehranipoor
2014DATEARO-PUF: An aging-resistant ring oscillator PUF design.Md Tauhidur Rahman, Domenic Forte, Jim Fahrny, Mohammad Tehranipoor
2014VLSIDTutorial T4: All You Need to Know about Hardware Trojans and Counterfeit ICs.Mohammad Tehranipoor, Domenic Forte
2014VTSIdentification of testable representative paths for low-cost verification of circuit performance during manufacturing and in-field tests.Jifeng Chen, LeRoy Winemberg, Mohammad Tehranipoor
2013ICCDFunctional Fmax test-time reduction using novel DFTs for circuit initialization.Ujjwal Guin, Tapan J. Chakraborty, Mohammad Tehranipoor
2013ICCDOn design vulnerability analysis and trust benchmarks development.Hassan Salmani, Mohammad Tehranipoor, Ramesh Karri
2013VTSSpecial session 12A: Hot topic counterfeit IC identification: How can test help?Ilia Polian, Mohammad Tehranipoor
2013VTSA study on the effectiveness of Trojan detection techniques using a red team blue team approach.Xuehui Zhang, Kan Xiao, Mohammad Tehranipoor, Jeyavijayan Rajendran, Ramesh Karri
2012DACIdentification of recovered ICs using fingerprints from a light-weight on-chip sensor.Xuehui Zhang, Nicholas Tuzzio, Mohammad Tehranipoor
2012DATEA sensor-assisted self-authentication framework for hardware trojan detection.Min Li, Azadeh Davoodi, Mohammad Tehranipoor
2012ICCADExperimental analysis of a ring oscillator network for hardware Trojan detection in a 90nm ASIC.Andrew Ferraiuolo, Xuehui Zhang, Mohammad Tehranipoor
2012ICCADRepresentative Critical Reliability Paths for low-cost and accurate on-chip aging evaluation.Shuo Wang, Jifeng Chen, Mohammad Tehranipoor
2012ITCRadic: A standard-cell-based sensor for on-chip aging and flip-flop metastability measurements.Xiaoxiao Wang, Dat Tran, Saji George, LeRoy Winemberg, Nisar Ahmed, Steve Palosh, Allan Dobin, Mohammad Tehranipoor
2012ITCOn pinpoint capture power management in at-speed scan test generation.Xiaoqing Wen, Y. Nishida, Kohei Miyase, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor, Laung-Terng Wang
2012VTSA novel method for fast identification of peak current during test.Wei Zhao, Sreejit Chakravarty, Junxia Ma, Narendra Devta-Prasanna, Fan Yang, Mohammad Tehranipoor
2011DACIn-field aging measurement and calibration for power-performance optimization.Shuo Wang, Mohammad Tehranipoor, LeRoy Winemberg
2011DATERON: An on-chip ring oscillator network for hardware Trojan detection.Xuehui Zhang, Mohammad Tehranipoor
2011ETSCritical Fault-Based Pattern Generation for Screening SDDs.Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, LeRoy Winemberg, Mohammad Tehranipoor
2011ICCDRed team: Design of intelligent hardware trojans with known defense schemes.Xuehui Zhang, Nicholas Tuzzio, Mohammad Tehranipoor
2011VTSLow-cost diagnostic pattern generation and evaluation procedures for noise-related failures.Junxia Ma, Nisar Ahmed, Mohammad Tehranipoor
2011VTSCase Study: Efficient SDD test generation for very large integrated circuits.Ke Peng, Fang Bao, Geoff Shofner, LeRoy Winemberg, Mohammad Tehranipoor
2011VTSPower-aware test generation with guaranteed launch safety for at-speed scan testing.Xiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A. Kochte, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor
2011VTSSpecial session 5B: Panel How much toggle activity should we be testing with?Xiaoqing Wen, Mohammad Tehranipoor, Rohit Kapur, Anand Bhat, Amitava Majumdar, LeRoy Winemberg
2011VTSSpecial session: Hot topic: Smart silicon.LeRoy Winemberg, Mohammad Tehranipoor
2011VTSPower-safe test application using an effective gating approach considering current limits.Wei Zhao, Mohammad Tehranipoor, Sreejit Chakravarty
2010ASPDACEmulating and diagnosing IR-drop by using dynamic SDF.Ke Peng, Yu Huang, Ruifeng Guo, Wu-Tung Cheng, Mohammad Tehranipoor
2010DATEHigh-quality pattern selection for screening small-delay defects considering process variations and crosstalk.Ke Peng, Mahmut Yilmaz, Mohammad Tehranipoor, Krishnendu Chakrabarty
2010DATENovel Physical Unclonable Function with process and environmental variations.Xiaoxiao Wang, Mohammad Tehranipoor
2010DDECSAnalysis of power consumption and transition fault coverage for LOS and LOC testing schemes.Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Junxia Ma, Wei Zhao, Mohammad Tehranipoor, Xiaoqing Wen
2010ETSFull-circuit SPICE simulation based validation of dynamic delay estimation.Ke Peng, Yu Huang, Pinki Mallick, Wu-Tung Cheng, Mohammad Tehranipoor
2010ITCIs test power reduction through X-filling good enough?Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Mohammad Tehranipoor, Kohei Miyase, Xiaoqing Wen, Nisar Ahmed
2010VTSA novel hybrid method for SDD pattern grading and selection.Ke Peng, Jason Thibodeau, Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor
2009ITCA novel architecture for on-chip path delay measurement.Xiaoxiao Wang, Mohammad Tehranipoor, Ramyanshu Datta
2009VTSLayout-Aware Pattern Generation for Maximizing Supply Noise Effects on Critical Paths.Junxia Ma, Jeremy Lee, Mohammad Tehranipoor
2008DATELayout-Aware, IR-Drop Tolerant Transition Fault Pattern Generation.Jeremy Lee, Sumit Narayan, Mike Kapralos, Mohammad Tehranipoor
2008ICCADPower supply signal calibration techniques for improving detection resolution to hardware Trojans.Reza M. Rad, Xiaoxiao Wang, Mohammad Tehranipoor, Jim Plusquellic
2008ICCADPath-RO: a novel on-chip critical path delay measurement under process variations.Xiaoxiao Wang, Mohammad Tehranipoor, Ramyanshu Datta
2008ITCA Novel Pattern Generation Framework for Inducing Maximum Crosstalk Effects on Delay-Sensitive Paths.Jeremy Lee, Mohammad Tehranipoor
2008ITCPower Distribution Failure Analysis Using Transition-Delay Fault Patterns.Junxia Ma, Jeremy Lee, Mohammad Tehranipoor
2008ITCInterconnect-Aware and Layout-Oriented Test-Pattern Selection for Small-Delay Defects.Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor
2008VTSLS-TDF: Low-Switching Transition Delay Fault Pattern Generation.Jeremy Lee, Mohammad Tehranipoor
2008VTSTest-Pattern Grading and Pattern Selection for Small-Delay Defects.Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor
2007DACTransition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design.Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
2007VTSSupply Voltage Noise Aware ATPG for Transition Delay Faults.Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
2006DACTiming-based delay test for screening small delay defects.Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
2006DACA new hybrid FPGA with nanoscale clusters and CMOS routing.Reza M. Rad, Mohammad Tehranipoor
2006FPGAFine-grained island style architecture for molecular electronic devices.Mohammad Tehranipoor, Reza M. Rad
2006FPGATest and recovery for fine-grained nanoscale architectures.Mohammad Tehranipoor, Reza M. Rad
2006ICCADA novel framework for faster-than-at-speed delay test considering IR-drop effects.Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
2006VTSSession Abstract.Kee Sup Kim, Mohammad Tehranipoor
2006VTSA Low-Cost Solution for Protecting IPs Against Scan-Based Side-Channel Attacks.Jeremy Lee, Mohammad Tehranipoor, Jim Plusquellic
2006VTSSCT: An Approach For Testing and Configuring Nanoscale Devices.Reza M. Rad, Mohammad Tehranipoor
2005ITCEnhanced launch-off-capture transition fault testing.Nisar Ahmed, Mohammad Tehranipoor, C. P. Ravikumar
2005VTSAt-Speed Transition Fault Testing With Low Speed Scan Enable.Nisar Ahmed, C. P. Ravikumar, Mohammad Tehranipoor, Jim Plusquellic
2005VTSPattern Generation and Estimation for Power Supply Noise Analysis.Mehrdad Nourani, Mohammad Tehranipoor, Nisar Ahmed