| 2006 | IOLTS | Towards The Methodology of On-line Diagnosis. | Rochit Rajsuman |
| 2004 | ASPDAC | Opportunities with the open architecture test system. | Kazumi Hatayama, Rochit Rajsuman |
| 2004 | ASPDAC | New opportunities with the open architecture test system. | Rochit Rajsuman |
| 2004 | ITC | Open Architecture Test System: System Architecture and Design. | Rochit Rajsuman, Masuda Noriyuki |
| 2002 | ITC | Testing The Tester. | Rochit Rajsuman |
| 2002 | ITC | Testing The Tester. | Rochit Rajsuman |
| 2002 | ITC | Can IC Test Learn from How a Tester is Tested. | Rochit Rajsuman |
| 2001 | ITC | Test and repair of large embedded DRAMs. I. | Roderick McConnell, Rochit Rajsuman, Eric A. Nelson, Jeffrey H. Dreibelbis |
| 2000 | ITC | A new paradigm in test for the next millennium. | Jerry Katz, Rochit Rajsuman |
| 1999 | ITC | Testing a system-on-a-chip with embedded microprocessor. | Rochit Rajsuman |
| 1996 | ITC | Challenge of the 90's: Testing CoreWare | Rochit Rajsuman |
| 1994 | VLSID | Untitled record | Suntae Hwang, Rochit Rajsuman, Scott Davidson |
| 1993 | VLSID | Coverage of Bridging Faults by Random Testing in I | Rochit Rajsuman, David A. Penry |
| 1992 | LCN | An analysis and simulation of multiple ring token networks. | David A. Vasko, Rochit Rajsuman |
| 1992 | VLSID | An Architecture To Test Random Access Memories. | Rochit Rajsuman |
| 1991 | VTS | An analysis of feedback bridging faults in MOS VLSI. | Rochit Rajsuman |
| 1991 | VTS | An analysis and testing of operation induced faults in MOS VLSI. | Rochit Rajsuman, Anura P. Jayasumana, Yashwant K. Malaiya, Juney Park |
| 1990 | MICRO | On the testing of microprogrammed processor. | Suntae Hwang, Rochit Rajsuman, Yashwant K. Malaiya |
| 1989 | DAC | CMOS Stuck-open Fault Detection Using Single Test Patterns. | Rochit Rajsuman, Anura P. Jayasumana, Yashwant K. Malaiya |
| 1987 | DAC | On Accuracy of Switch-Level Modeling of Bridging Faults in Complex Gates. | Rochit Rajsuman, Yashwant K. Malaiya, Anura P. Jayasumana |