| 2019 | QRS | An API Development Model for Digital Twins. | Jim A. Scheibmeir, Yashwant K. Malaiya |
| 2016 | SEC | Evaluating CVSS Base Score Using Vulnerability Rewards Programs. | Awad A. Younis, Yashwant K. Malaiya, Indrajit Ray |
| 2015 | QRS | Comparing and Evaluating CVSS Base Metrics and Microsoft Rating System. | Awad A. Younis, Yashwant K. Malaiya |
| 2014 | ISSRE | Are the Classical Disaster Recovery Tiers Still Applicable Today? | Omar Hussain Alhazmi, Yashwant K. Malaiya |
| 2012 | ISSRE | Assessing Disaster Recovery Alternatives: On-Site, Colocation or Cloud. | Omar Hussain Alhazmi, Yashwant K. Malaiya |
| 2010 | ITC | Principal Component Analysis-based compensation for measurement errors due to mechanical misalignments in PCB testing. | Xin He, Yashwant K. Malaiya, Anura P. Jayasumana, Kenneth P. Parker, Stephen Hird |
| 2009 | ICST | Seasonal Variation in the Vulnerability Discovery Process. | HyunChul Joh, Yashwant K. Malaiya |
| 2009 | ITC | An outlier detection based approach for PCB testing. | Xin He, Yashwant K. Malaiya, Anura P. Jayasumana, Kenneth P. Parker, Stephen Hird |
| 2008 | ISSRE | Vulnerability Discovery Modeling Using Weibull Distribution. | HyunChul Joh, Jinyoo Kim, Yashwant K. Malaiya |
| 2008 | ISSRE | Seasonality in Vulnerability Discovery in Major Software Systems. | HyunChul Joh, Yashwant K. Malaiya |
| 2006 | DASC | Assessing Vulnerabilities in Apache and IIS HTTP Servers. | Sung-Whan Woo, Omar Hussain Alhazmi, Yashwant K. Malaiya |
| 2006 | ISSRE | Measuring and Enhancing Prediction Capabilities of Vulnerability Discovery Models for Apache and IIS HTTP Servers. | Omar Hussain Alhazmi, Yashwant K. Malaiya |
| 2006 | VTS | X-IDDQ: A Novel Defect Detection Technique Using IDDQ Data. | Ashutosh Sharma, Anura P. Jayasumana, Yashwant K. Malaiya |
| 2005 | CEC | Dynamic power minimization during combinational circuit testing as a traveling salesman problem. | Artem Sokolov, Alodeep Sanyal, L. Darrell Whitley, Yashwant K. Malaiya |
| 2005 | DBSEC | Security Vulnerabilities in Software Systems: A Quantitative Perspective. | Omar Hussain Alhazmi, Yashwant K. Malaiya, Indrajit Ray |
| 2005 | ISSRE | Modeling the Vulnerability Discovery Process. | Omar Hussain Alhazmi, Yashwant K. Malaiya |
| 2000 | ISSRE | Module Size Distribution and Defect Density. | Yashwant K. Malaiya, Jason Denton |
| 1999 | ISSRE | Requirements volatility and defect density. | Yashwant K. Malaiya, Jason Denton |
| 1998 | ICCD | Antirandom vs. pseudorandom testing. | Shen Hui Wu, Yashwant K. Malaiya, Anura P. Jayasumana |
| 1997 | ISSRE | What do the software reliability growth model parameters represent? | Yashwant K. Malaiya, Jason Denton |
| 1997 | ISSRE | Automatic test generation using checkpoint encoding and antirandom testing. | Huifang Yin, Zemen Lebne-Dengel, Yashwant K. Malaiya |
| 1997 | VLSID | Input Pattern Classification for Detection of Stuck-ON and Bridging Faults Using I | Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana |
| 1996 | ISSRE | Fault exposure ratio estimation and applications. | Michael Naixin Li, Yashwant K. Malaiya |
| 1995 | ISCAS | A Novel High-Speed BiCMOS Domino Logic Family. | Anura P. Jayasumana, Yashwant K. Malaiya, Sankaran M. Menon |
| 1995 | ISSRE | ROBUST: a next generation software reliability engineering tool. | Michael Naixin Li, Yashwant K. Malaiya |
| 1995 | ISSRE | Antirandom testing: getting the most out of black-box testing. | Yashwant K. Malaiya |
| 1995 | LCN | Interconnection of FDDI-II networks through an ATM backbone - An analysis. | Ramanagopal V. Vogety, Yashwant K. Malaiya, Anura P. Jayasumana |
| 1994 | ISSRE | On input profile selection for software testing. | Michael Naixin Li, Yashwant K. Malaiya |
| 1994 | ISSRE | The relationship between test coverage and reliability. | Yashwant K. Malaiya, Michael Naixin Li, James M. Bieman, Rick Karcich, Bob Skibbe |
| 1994 | VLSID | The Effect of Built-In Current Sensors (BICS) on Operational and Test Performance. | Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong |
| 1994 | VTS | Input pattern classification for transistor level testing of BiCMOS circuits. | Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya |
| 1993 | ISCAS | Test Generation for BiCMOS Circuits. | Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya |
| 1993 | ISSRE | Enhancing accuracy of software reliability prediction. | Michael Naixin Li, Yashwant K. Malaiya |
| 1993 | ISSRE | On the need for simulation for better characterization of software reliability. | Anneliese von Mayrhauser, Yashwant K. Malaiya, Pradip K. Srimani, James Keables |
| 1993 | ISSRE | The effect of correlated faults on software reliability. | Kang Wu, Yashwant K. Malaiya |
| 1993 | VLSID | Use of Storage Elements as Primitives for Modelling Faults in Synchronous Sequential Circuits. | W. K. Al-Assadi, Yashwant K. Malaiya, Anura P. Jayasumana |
| 1993 | VTS | Testable design for BiCMOS stuck-open fault detection. | Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya |
| 1992 | ISSRE | The scaling problem in neural networks for software reliability prediction. | Nachimuthu Karunanithi, Yashwant K. Malaiya |
| 1992 | ISSRE | The nature of fault exposure ratio. | Yashwant K. Malaiya, Anneliese von Mayrhauser, Pradip K. Srimani |
| 1992 | VLSID | On Bridging Faults in ECL Circuits. | Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya |
| 1992 | VTS | Behavior of faulty single BJT BiCMOS logic gates. | Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana |
| 1991 | ISSRE | Prediction of software reliability using neural networks. | Nachimuthu Karunanithi, Yashwant K. Malaiya, L. Darrell Whitley |
| 1991 | VTS | Evaluation of detectability in BIST environment. | Sheng Feng, Yashwant K. Malaiya |
| 1991 | VTS | Enhancement of resolution in supply current based testing for large ICs. | Yashwant K. Malaiya, Anura P. Jayasumana, Qiao Tong, Sankaran M. Menon |
| 1991 | VTS | An analysis and testing of operation induced faults in MOS VLSI. | Rochit Rajsuman, Anura P. Jayasumana, Yashwant K. Malaiya, Juney Park |
| 1990 | COMPSAC | Predictability measures for software reliability models. | Yashwant K. Malaiya, Nachimuthu Karunanithi, Pradeep Verma |
| 1990 | MICRO | On the testing of microprogrammed processor. | Suntae Hwang, Rochit Rajsuman, Yashwant K. Malaiya |
| 1989 | DAC | CMOS Stuck-open Fault Detection Using Single Test Patterns. | Rochit Rajsuman, Anura P. Jayasumana, Yashwant K. Malaiya |
| 1989 | MICRO | On inherent untestability of unaugmented microprogrammed control. | Yashwant K. Malaiya |
| 1988 | MICRO | Design of a testable RISC-to-CISC control architecture. | Yashwant K. Malaiya, Sheng Feng |
| 1987 | DAC | On Accuracy of Switch-Level Modeling of Bridging Faults in Complex Gates. | Rochit Rajsuman, Yashwant K. Malaiya, Anura P. Jayasumana |
| 1985 | ITC | Faults in Microprogrammed and Hardwired Control. | Yashwant K. Malaiya |
| 1984 | ITC | The Coverage Problem for Random Testing. | Yashwant K. Malaiya, Shoubao Yang |
| 1983 | ITC | Testing for Timing Faults in Synchronous Sequential Integrated Circuits. | Yashwant K. Malaiya, Ramesh Narayanaswamy |
| 1982 | ITC | A New Fault Model and Testing Technique for CMOS Devices. | Yashwant K. Malaiya, Stephen Y. H. Su |
| 1981 | ITC | State Diagram Approach for Functional Testing of Control Section. | Chi-Chang Liaw, Stephen Y. H. Su, Yashwant K. Malaiya |