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Isabel C. Teixeira

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

38

Venues

12

Active years

1992–2018

Best venue rank

C

Where they publish

Papers

38 indexed papers, newest first.

YearVenueTitleAuthors
2018HCIPerformance Sensor for Reliable Operation.Jorge Semio, Ruben Cabral, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira
2013FPLAging monitoring with local sensors in FPGA-based designs.Carlos Leong, Jorge Semio, Isabel C. Teixeira, Marcelino B. Santos, Joo Paulo Teixeira, Mara Dolores Valds, Judit Freijedo, Juan J. Rodrguez-Andina, Fabian Vargas
2012IOLTSThe influence of clock-gating on NBTI-induced delay degradation.Jackson Pachito, Celestino V. Martins, Jorge Semio, Marcelino Bicho Dos Santos, Isabel C. Teixeira, Joo Paulo Teixeira
2011FPLPerformance Failure Prediction Using Built-In Delay Sensors in FPGAs.Vasco Bexiga, Carlos Leong, Jorge Semio, Isabel C. Teixeira, Joo Paulo Teixeira, Mara Dolores Valds, Judit Freijedo, Juan J. Rodrguez-Andina, Fabian Vargas
2011VTSAdaptive Error-Prediction Flip-flop for performance failure prediction with aging sensors.Celestino V. Martins, Jorge Semio, Julio Csar Vzquez, Vctor H. Champac, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira
2010DATEProgrammable aging sensor for automotive safety-critical applications.Julio Csar Vzquez, Vctor H. Champac, Isabel C. Teixeira, Marcelino B. Santos, Joo Paulo Teixeira
2010DDECSBuilt-in Clock Domain Crossing (CDC) test and diagnosis in GALS systems.Carlos Leong, Pedro Machado, Vasco Bexiga, Joo Paulo Teixeira, Isabel C. Teixeira, Jos C. Silva, Pedro Lous, Joo Varela
2010IOLTSInvestigating the Use of BICS to detect resistive-open defects in SRAMs.Raul Chipana, Letcia Maria Veiras Bolzani, Fabian Vargas, Jorge Semio, Juan J. Rodrguez-Andina, Isabel C. Teixeira, Joo Paulo Teixeira
2010IOLTSPredictive error detection by on-line aging monitoring.Julio Csar Vzquez, Vctor H. Champac, Adriel Ziesemer, Ricardo Reis, Jorge Semio, Isabel C. Teixeira, Marcelino B. Santos, Joo Paulo Teixeira
2010ISCASAutomatic Configuration of a Medical Imaging System to Unknown Delays in Synchronous Input Data Channels.Carlos Leong, Joo Paulo Teixeira, Isabel C. Teixeira, Ricardo Bugalho, Manuel Ferreira, Pedro Miguel Rodrigues, Jos C. Silva, Pedro Lous, Joo Varela
2009IOLTSDelay-fault tolerance to power supply Voltage disturbances analysis in nanometer technologies.Jorge Semio, Judit Freijedo, Juan J. Rodrguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira
2009IOLTSBuilt-in aging monitoring for safety-critical applications.Julio Csar Vzquez, Vctor H. Champac, Adriel Ziesemer, Ricardo Reis, Isabel C. Teixeira, Marcelino B. Santos, Joo Paulo Teixeira
2008DDECSProcess Tolerant Design Using Thermal and Power-Supply Tolerance in Pipeline Based Circuits.Jorge Semio, Juan J. Rodrguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira
2008IOLTSExploiting Parametric Power Supply and/or Temperature Variations to Improve Fault Tolerance in Digital Circuits.Jorge Semio, Judit Freijedo, Juan J. Rodrguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira
2007DDECSImproving Tolerance to Power-Supply and Temperature Variations in Synchronous Circuits.Jorge Semio, Judit Freijedo, Juan J. Rodrguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira
2007IOLTSOn-line Dynamic Delay Insertion to Improve Signal Integrity in Synchronous Circuits.Jorge Semio, Judit Freijedo, Juan J. Rodrguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira
2006DDECSFunctional-Oriented BIST of Sequential Circuits Aiming at Dynamic Faults Coverage.F. Guerreiro, Jorge Semio, A. Pierce, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira
2006IOLTSDynamic Fault Detection in Digital Systems Using Dynamic Voltage Scaling and Multi-Temperature Schemes.Marcial Jess Rodrguez-Irago, Juan J. Rodrguez-Andina, Fabian Vargas, Jorge Semio, Isabel C. Teixeira, Joo Paulo Teixeira
2005FPLDesign and Test Methodology for a Reconfigurable PEM Data Acquisition Electronics System.Carlos Leong, P. Bento, Pedro Miguel Rodrigues, Andreia Trindade, Jos C. Silva, Pedro Lous, Joel Rego, J. Nobre, Joo Varela, Joo Paulo Teixeira, Isabel C. Teixeira
2005IOLTSDynamic Fault Test and Diagnosis in Digital Systems Using Multiple Clock Schemes and Multi-VDD Test.Marcial Jess Rodrguez-Irago, Juan J. Rodrguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira
2004IOLTSModeling and Simulation of Time Domain Faults in Digital Systems.Daniel Barros Jr., Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira
2003DATERTL Test Pattern Generation for High Quality Loosely Deterministic BIST.Marcelino B. Santos, Jos M. Fernandes, Isabel C. Teixeira, Joo Paulo Teixeira
2003ETFAHardware/software solution for the automation and real-time control of a wine bottling production line.Rui Ribeiro, Octvio Pscoa Dias, Joo Paulo Teixeira, Isabel C. Teixeira
2003IOLTSProperty Coverage for Quality Assessment of Fault Tolerant or Fail Safe Systems.Fernando M. Gonalves, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira
2002ITCRTL Level Preparation of High-Quality/Low-Energy/Low-Power BIST.Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira, Salvador Manich, Rosa Rodrguez-Montas, Joan Figueras
2001DATEEmbedded tutorial: TRP: integrating embedded test and ATE.Yervant Zorian, Paolo Prinetto, Joo Paulo Teixeira, Isabel C. Teixeira, Carlos Eduardo Pereira, Octvio Pscoa Dias, Jorge Semio, Peter Muhmenthaler, W. Radermacher
2001ETSRTL design validation, DFT and test pattern generation for high defects coverage.Marcelino B. Santos, Fernando M. Gonalves, Isabel C. Teixeira, Joo Paulo Teixeira
2001IOLTSDesign and Test of Certifiable ASICs for Safety-Critical Gas Burners Contro.Fernando M. Gonalves, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira
2001ITCImplicit functionality and multiple branch coverage (IFMB): a testability metric for RT-level.Fernando M. Gonalves, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira
2000ETSRTL-based functional test generation for high defects coverage in digital SOCs.Marcelino B. Santos, Fernando M. Gonalves, Isabel C. Teixeira, Joo Paulo Teixeira
2000ISORCMOSYS A Methodology for Automatic Object Identification from System Specification.Leandro Buss Becker, Carlos Eduardo Pereira, Octvio Pscoa Dias, Isabel C. Teixeira, Joo Paulo Teixeira
1999VTSDefect-Oriented Verilog Fault Simulation of SoC Macros using a Stratified Fault Sampling Technique.Marcelino B. Santos, Fernando M. Gonalves, Isabel C. Teixeira, Joo Paulo Teixeira
1998ITCDefect-oriented test quality assessment using fault sampling and simulation.Fernando M. Gonalves, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira
1996RSPHW/SW specification using OOM techniques.Mario Calha, Joo Paulo Teixeira, Isabel C. Teixeira
1995DATETest preparation methodology for high coverage of physical defects in CMOS digital ICs.Marcelino B. Santos, M. Simes, Isabel C. Teixeira, Joo Paulo Teixeira
1995VTSTest preparation for high coverage of physical defects in CMOS digital ICs.Marcelino B. Santos, M. Simes, Isabel C. Teixeira, Joo Paulo Teixeira
1994ITCBack Annotation of Physical Defects into Gate-Level, Realistic Faults in Digital ICs.Mario Calha, Marcelino B. Santos, Fernando M. Gonalves, Isabel C. Teixeira, Joo Paulo Teixeira
1992ITCPhysical DFT for High Coverage of Realistic Faults.M. Saraiva, P. Casimiro, Marcelino B. Santos, Jos T. de Sousa, Fernando M. Gonalves, Isabel C. Teixeira, Joo Paulo Teixeira