Joo Paulo Teixeira
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
52
Venues
12
Active years
1991–2018
Best venue rank
C
Where they publish
Papers
52 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2018 | ETFA | Maintenance 4.0: Intelligent and Predictive Maintenance System Architecture. | Ana Cachada, Jos Barbosa, Paulo Leito, Carla A. S. Gcraldcs, Leonel Deusdado, Jacinta Costa, Carlos Teixeira, Joo Paulo Teixeira, Antnio H. J. Moreira, Pedro Miguel, Lus Romero |
| 2018 | HCI | Performance Sensor for Reliable Operation. | Jorge Semio, Ruben Cabral, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira |
| 2013 | FPL | Aging monitoring with local sensors in FPGA-based designs. | Carlos Leong, Jorge Semio, Isabel C. Teixeira, Marcelino B. Santos, Joo Paulo Teixeira, Mara Dolores Valds, Judit Freijedo, Juan J. Rodrguez-Andina, Fabian Vargas |
| 2012 | IOLTS | The influence of clock-gating on NBTI-induced delay degradation. | Jackson Pachito, Celestino V. Martins, Jorge Semio, Marcelino Bicho Dos Santos, Isabel C. Teixeira, Joo Paulo Teixeira |
| 2011 | FPL | Performance Failure Prediction Using Built-In Delay Sensors in FPGAs. | Vasco Bexiga, Carlos Leong, Jorge Semio, Isabel C. Teixeira, Joo Paulo Teixeira, Mara Dolores Valds, Judit Freijedo, Juan J. Rodrguez-Andina, Fabian Vargas |
| 2011 | VTS | Adaptive Error-Prediction Flip-flop for performance failure prediction with aging sensors. | Celestino V. Martins, Jorge Semio, Julio Csar Vzquez, Vctor H. Champac, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira |
| 2010 | DATE | Programmable aging sensor for automotive safety-critical applications. | Julio Csar Vzquez, Vctor H. Champac, Isabel C. Teixeira, Marcelino B. Santos, Joo Paulo Teixeira |
| 2010 | DDECS | Built-in Clock Domain Crossing (CDC) test and diagnosis in GALS systems. | Carlos Leong, Pedro Machado, Vasco Bexiga, Joo Paulo Teixeira, Isabel C. Teixeira, Jos C. Silva, Pedro Lous, Joo Varela |
| 2010 | IOLTS | Investigating the Use of BICS to detect resistive-open defects in SRAMs. | Raul Chipana, Letcia Maria Veiras Bolzani, Fabian Vargas, Jorge Semio, Juan J. Rodrguez-Andina, Isabel C. Teixeira, Joo Paulo Teixeira |
| 2010 | IOLTS | Predictive error detection by on-line aging monitoring. | Julio Csar Vzquez, Vctor H. Champac, Adriel Ziesemer, Ricardo Reis, Jorge Semio, Isabel C. Teixeira, Marcelino B. Santos, Joo Paulo Teixeira |
| 2010 | ISCAS | Automatic Configuration of a Medical Imaging System to Unknown Delays in Synchronous Input Data Channels. | Carlos Leong, Joo Paulo Teixeira, Isabel C. Teixeira, Ricardo Bugalho, Manuel Ferreira, Pedro Miguel Rodrigues, Jos C. Silva, Pedro Lous, Joo Varela |
| 2010 | VTS | Low-sensitivity to process variations aging sensor for automotive safety-critical applications. | Julio Csar Vzquez, Vctor H. Champac, Adriel Ziesemer, Ricardo Reis, Isabel Maria Cacho Teixeira, Marcelino B. Santos, Joo Paulo Teixeira |
| 2009 | IOLTS | Controllability and observability in mixed signal cores. | Jos F. da Rocha, Nuno Dias, Angelo Monteiro, Alexandre Neves, Gabriel Santos, Marcelino B. Santos, Joo Paulo Teixeira |
| 2009 | IOLTS | Delay-fault tolerance to power supply Voltage disturbances analysis in nanometer technologies. | Jorge Semio, Judit Freijedo, Juan J. Rodrguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira |
| 2009 | IOLTS | Built-in aging monitoring for safety-critical applications. | Julio Csar Vzquez, Vctor H. Champac, Adriel Ziesemer, Ricardo Reis, Isabel C. Teixeira, Marcelino B. Santos, Joo Paulo Teixeira |
| 2008 | DDECS | Process Tolerant Design Using Thermal and Power-Supply Tolerance in Pipeline Based Circuits. | Jorge Semio, Juan J. Rodrguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira |
| 2008 | IOLTS | Exploiting Parametric Power Supply and/or Temperature Variations to Improve Fault Tolerance in Digital Circuits. | Jorge Semio, Judit Freijedo, Juan J. Rodrguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira |
| 2007 | DDECS | Improving Tolerance to Power-Supply and Temperature Variations in Synchronous Circuits. | Jorge Semio, Judit Freijedo, Juan J. Rodrguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira |
| 2007 | IOLTS | On-line Dynamic Delay Insertion to Improve Signal Integrity in Synchronous Circuits. | Jorge Semio, Judit Freijedo, Juan J. Rodrguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira |
| 2006 | DDECS | Probabilistic Testability Analysis and DFT Methods at RTL. | Jos M. Fernandes, Marcelino B. Santos, Arlindo L. Oliveira, Joo Paulo Teixeira |
| 2006 | DDECS | Functional-Oriented BIST of Sequential Circuits Aiming at Dynamic Faults Coverage. | F. Guerreiro, Jorge Semio, A. Pierce, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira |
| 2006 | IOLTS | Dynamic Fault Detection in Digital Systems Using Dynamic Voltage Scaling and Multi-Temperature Schemes. | Marcial Jess Rodrguez-Irago, Juan J. Rodrguez-Andina, Fabian Vargas, Jorge Semio, Isabel C. Teixeira, Joo Paulo Teixeira |
| 2005 | FPL | Design and Test Methodology for a Reconfigurable PEM Data Acquisition Electronics System. | Carlos Leong, P. Bento, Pedro Miguel Rodrigues, Andreia Trindade, Jos C. Silva, Pedro Lous, Joel Rego, J. Nobre, Joo Varela, Joo Paulo Teixeira, Isabel C. Teixeira |
| 2005 | IOLTS | Dynamic Fault Test and Diagnosis in Digital Systems Using Multiple Clock Schemes and Multi-VDD Test. | Marcial Jess Rodrguez-Irago, Juan J. Rodrguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira |
| 2004 | DATE | A Probabilistic Method for the Computation of Testability of RTL Constructs. | Jos M. Fernandes, Marcelino B. Santos, Arlindo L. Oliveira, Joo Paulo Teixeira |
| 2004 | FPL | FPGAs BIST Evaluation. | Abilio Parreira, Joo Paulo Teixeira, Marcelino B. Santos |
| 2004 | IOLTS | Modeling and Simulation of Time Domain Faults in Digital Systems. | Daniel Barros Jr., Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira |
| 2003 | DATE | RTL Test Pattern Generation for High Quality Loosely Deterministic BIST. | Marcelino B. Santos, Jos M. Fernandes, Isabel C. Teixeira, Joo Paulo Teixeira |
| 2003 | ETFA | Hardware/software solution for the automation and real-time control of a wine bottling production line. | Rui Ribeiro, Octvio Pscoa Dias, Joo Paulo Teixeira, Isabel C. Teixeira |
| 2003 | FPL | Fault Simulation Using Partially Reconfigurable Hardware. | Abilio Parreira, Joo Paulo Teixeira, A. Pantelimon, Marcelino B. Santos, Jos T. de Sousa |
| 2003 | IOLTS | Property Coverage for Quality Assessment of Fault Tolerant or Fail Safe Systems. | Fernando M. Gonalves, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira |
| 2002 | ITC | RTL Level Preparation of High-Quality/Low-Energy/Low-Power BIST. | Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira, Salvador Manich, Rosa Rodrguez-Montas, Joan Figueras |
| 2001 | DATE | Embedded tutorial: TRP: integrating embedded test and ATE. | Yervant Zorian, Paolo Prinetto, Joo Paulo Teixeira, Isabel C. Teixeira, Carlos Eduardo Pereira, Octvio Pscoa Dias, Jorge Semio, Peter Muhmenthaler, W. Radermacher |
| 2001 | ETS | RTL design validation, DFT and test pattern generation for high defects coverage. | Marcelino B. Santos, Fernando M. Gonalves, Isabel C. Teixeira, Joo Paulo Teixeira |
| 2001 | IOLTS | Design and Test of Certifiable ASICs for Safety-Critical Gas Burners Contro. | Fernando M. Gonalves, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira |
| 2001 | ITC | Implicit functionality and multiple branch coverage (IFMB): a testability metric for RT-level. | Fernando M. Gonalves, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira |
| 2000 | ETS | RTL-based functional test generation for high defects coverage in digital SOCs. | Marcelino B. Santos, Fernando M. Gonalves, Isabel C. Teixeira, Joo Paulo Teixeira |
| 2000 | ISORC | MOSYS A Methodology for Automatic Object Identification from System Specification. | Leandro Buss Becker, Carlos Eduardo Pereira, Octvio Pscoa Dias, Isabel C. Teixeira, Joo Paulo Teixeira |
| 1999 | DATE | Defect-Oriented Mixed-Level Fault Simulation of Digital Systems-on-a-Chip Using HDL. | Marcelino B. Santos, Joo Paulo Teixeira |
| 1999 | ETS | From system level to defect-oriented test: a case study. | Octvio Pscoa Dias, Jorge Semio, Marcelino B. Santos, Isabel Maria Cacho Teixeira, Joo Paulo Teixeira |
| 1999 | ETS | Low power BIST by filtering non-detecting vectors. | Salvador Manich, A. Gabarr, M. Lopez, Joan Figueras, Patrick Girard, Los Guiller, Christian Landrault, Serge Pravossoudovitch, Joo Paulo Teixeira, Marcelino B. Santos |
| 1999 | ISCAS | Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity. | Patrick Girard, Los Guiller, Christian Landrault, Serge Pravossoudovitch, Joan Figueras, Salvador Manich, Joo Paulo Teixeira, Marcelino B. Santos |
| 1999 | VTS | Defect-Oriented Verilog Fault Simulation of SoC Macros using a Stratified Fault Sampling Technique. | Marcelino B. Santos, Fernando M. Gonalves, Isabel C. Teixeira, Joo Paulo Teixeira |
| 1998 | ITC | Defect-oriented test quality assessment using fault sampling and simulation. | Fernando M. Gonalves, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira |
| 1998 | VTS | Sampling Techniques of Non-Equally Probable Faults in VLSI System. | Fernando M. Gonalves, Joo Paulo Teixeira |
| 1996 | ITC | Defect-Oriented IC Test and Diagnosis Using VHDL Fault Simulation. | F. Celeiro, L. Dias, J. Ferreira, Marcelino B. Santos, Joo Paulo Teixeira |
| 1996 | RSP | HW/SW specification using OOM techniques. | Mario Calha, Joo Paulo Teixeira, Isabel C. Teixeira |
| 1995 | DATE | Test preparation methodology for high coverage of physical defects in CMOS digital ICs. | Marcelino B. Santos, M. Simes, Isabel C. Teixeira, Joo Paulo Teixeira |
| 1995 | VTS | Test preparation for high coverage of physical defects in CMOS digital ICs. | Marcelino B. Santos, M. Simes, Isabel C. Teixeira, Joo Paulo Teixeira |
| 1994 | ITC | Back Annotation of Physical Defects into Gate-Level, Realistic Faults in Digital ICs. | Mario Calha, Marcelino B. Santos, Fernando M. Gonalves, Isabel C. Teixeira, Joo Paulo Teixeira |
| 1992 | ITC | Physical DFT for High Coverage of Realistic Faults. | M. Saraiva, P. Casimiro, Marcelino B. Santos, Jos T. de Sousa, Fernando M. Gonalves, Isabel C. Teixeira, Joo Paulo Teixeira |
| 1991 | ITC | IC Defects-Based Testability Analysis. | Jos T. de Sousa, Fernando M. Gonalves, Joo Paulo Teixeira |