Kohei Miyase
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
33
Venues
12
Active years
2001–2026
Best venue rank
A*
Where they publish
Papers
33 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2026 | IOLTS | Progressive Error-Aware ECC Techniques for Enhancing Flash Memory Reliability. | Shyue-Kung Lu, Jie-Xin Shi, Shi-Yu Huang, Kohei Miyase |
| 2025 | ETS | Synergistic Built-In ECC Repair (BIER) Technique for Enhancing Yield and Reliability of Flash Memory. | Shyue-Kung Lu, Chun-Kai Chao, Kohei Miyase |
| 2022 | ITC | A Practical Online Error Detection Method for Functional Safety Using Three-Site Implications. | Kazuya Loki, Yasuyuki Kai, Kohei Miyase, Seiji Kajihara |
| 2022 | ITC | Fine-Grained Built-In Self-Repair Techniques for NAND Flash Memories. | Shyue-Kung Lu, Shi-Chun Tseng, Kohei Miyase |
| 2022 | ITC | Fault Resilience Techniques for Flash Memory of DNN Accelerators. | Shyue-Kung Lu, Yu-Sheng Wu, Jin-Hua Hong, Kohei Miyase |
| 2018 | IOLTS | Adaptive ECC Techniques for Reliability and Yield Enhancement of Phase Change Memory. | Shyue-Kung Lu, Hui-Ping Li, Kohei Miyase |
| 2017 | ITC | Analysis and mitigation or IR-Drop induced scan shift-errors. | Stefan Holst, Eric Schneider, Koshi Kawagoe, Michael A. Kochte, Kohei Miyase, Hans-Joachim Wunderlich, Seiji Kajihara, Xiaoqing Wen |
| 2016 | ETS | SAT-based post-processing for regional capture power reduction in at-speed scan test generation. | Stephan Eggersgl, Kohei Miyase, Xiaoqing Wen |
| 2015 | ETS | Identification of high power consuming areas with gate type and logic level information. | Kohei Miyase, Matthias Sauer, Bernd Becker, Xiaoqing Wen, Seiji Kajihara |
| 2015 | ETS | A soft-error tolerant TCAM using partial don't-care keys. | Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen, Stefan Holst, Kohei Miyase |
| 2013 | VLSID | On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression. | Kazunari Enokimoto, Xiaoqing Wen, Kohei Miyase, Jiun-Lang Huang, Seiji Kajihara, Laung-Terng Wang |
| 2012 | ITC | On pinpoint capture power management in at-speed scan test generation. | Xiaoqing Wen, Y. Nishida, Kohei Miyase, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor, Laung-Terng Wang |
| 2012 | VTS | A novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits. | Kohei Miyase, Masao Aso, Ryou Ootsuka, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Kazunari Enokimoto, Seiji Kajihara |
| 2011 | DATE | Transition-Time-Relation based capture-safety checking for at-speed scan test generation. | Kohei Miyase, Xiaoqing Wen, Masao Aso, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara |
| 2011 | ISLPED | SAT-based capture-power reduction for at-speed broadcast-scan-based test compression architectures. | Michael A. Kochte, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Kazunari Enokimoto, Hans-Joachim Wunderlich |
| 2011 | ITC | A novel scan segmentation design method for avoiding shift timing failure in scan testing. | Yuta Yamato, Xiaoqing Wen, Michael A. Kochte, Kohei Miyase, Seiji Kajihara, Laung-Terng Wang |
| 2011 | VTS | Power-aware test generation with guaranteed launch safety for at-speed scan testing. | Xiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A. Kochte, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor |
| 2010 | ETS | On estimation of NBTI-Induced delay degradation. | Mitsumasa Noda, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen, Yukiya Miura |
| 2010 | ITC | Is test power reduction through X-filling good enough? | Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Mohammad Tehranipoor, Kohei Miyase, Xiaoqing Wen, Nisar Ahmed |
| 2009 | ICCAD | A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment. | Kohei Miyase, Yuta Yamato, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Xiaoqing Wen, Seiji Kajihara |
| 2009 | PRDC | A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-speed Scan Testing. | Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Hiroshi Furukawa, Seiji Kajihara |
| 2008 | DDECS | Diagnosis of Realistic Defects Based on the X-Fault Model. | Ilia Polian, Kohei Miyase, Yusuke Nakamura, Seiji Kajihara, Piet Engelke, Bernd Becker, Stefan Spinner, Xiaoqing Wen |
| 2008 | ETS | A Capture-Safe Test Generation Scheme for At-Speed Scan Testing. | Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Hiroshi Furukawa, Yuta Yamato, Atsushi Takashima, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja |
| 2008 | ICCAD | Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification. | Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara |
| 2008 | ITC | Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Scan Testing. | Meng-Fan Wu, Jiun-Lang Huang, Xiaoqing Wen, Kohei Miyase |
| 2007 | DAC | Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing. | Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Yuji Ohsumi, Kewal K. Saluja |
| 2007 | ITC | A novel scheme to reduce power supply noise for high-quality at-speed scan testing. | Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Tatsuya Suzuki, Yuta Yamato, Patrick Girard, Yuji Ohsumi, Laung-Terng Wang |
| 2006 | ICCD | Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation. | Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Yuta Yamato, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja |
| 2006 | VTS | A New ATPG Method for Efficient Capture Power Reduction During Scan Testing. | Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Khader S. Abdel-Hafez, Kozo Kinoshita |
| 2002 | ICCD | Don't-Care Identification on Specific Bits of Test Patterns. | Kohei Miyase, Seiji Kajihara, Irith Pomeranz, Sudhakar M. Reddy |
| 2002 | VTS | Test Vector Modification for Power Reduction during Scan Testing. | Seiji Kajihara, Koji Ishida, Kohei Miyase |
| 2002 | VTS | On Test Data Volume Reduction for Multiple Scan Chain Designs. | Sudhakar M. Reddy, Kohei Miyase, Seiji Kajihara, Irith Pomeranz |
| 2001 | ICCAD | On Identifying Don't Care Inputs of Test Patterns for Combinational Circuits. | Seiji Kajihara, Kohei Miyase |