Subhasish Mitra
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
142
Venues
18
Active years
1997–2025
Best venue rank
A*
Where they publish
Papers
142 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2025 | ITC | IC-PEPR: PEPR Testing Goes Intra-Cell. | Chris Nigh, Ruben Purdy, Wei Li, Subhasish Mitra, R. D. (Shawn) Blanton |
| 2024 | ETS | Silent Data Corruption: Test or Reliability Problem? | Erik Jan Marinissen, Harish Dattatraya Dixit, Ronald Shawn Blanton, Aaron Kuo, Wei Li, Subhasish Mitra, Chris Nigh, Ruben Purdy, Ben Kaczer, Dishant Sangani, Pieter Weckx, Philippe J. Roussel, Georges G. E. Gielen |
| 2024 | ETS | Faulty Function Extraction for Defective Circuits. | Chris Nigh, Ruben Purdy, Wei Li, Subhasish Mitra, R. D. Shawn Blanton |
| 2024 | ICCAD | Efficient Ultra-Dense 3D IC Power Delivery and Cooling Using 3D Thermal Scaffolding. | Dennis Rich, Tathagata Srimani, Mohamadali Malakoutian, Srabanti Chowdhury, Subhasish Mitra |
| 2023 | DAC | G-QED: Generalized QED Pre-silicon Verification beyond Non-Interfering Hardware Accelerators. | Saranyu Chattopadhyay, Keerthikumara Devarajegowda, Bihan Zhao, Florian Lonsing, Brandon A. D'Agostino, Ioanna Vavelidou, Vijay Deep Bhatt, Sebastian Prebeck, Wolfgang Ecker, Caroline Trippel, Clark W. Barrett, Subhasish Mitra |
| 2023 | DAC | Thermal Scaffolding for Ultra-Dense 3D Integrated Circuits. | Dennis Rich, Anna Kasperovich, Mohamadali Malakoutian, Robert M. Radway, Shiho Hagiwara, Takahide Yoshikawa, Srabanti Chowdhury, Subhasish Mitra |
| 2023 | DATE | Ultra-Dense 3D Physical Design Unlocks New Architectural Design Points with Large Benefits. | Tathagata Srimani, Robert M. Radway, Jinwoo Kim, Kartik Prabhu, Dennis Rich, Carlo Gilardi, Priyanka Raina, Max M. Shulaker, Sung Kyu Lim, Subhasish Mitra |
| 2023 | ICCAD | PBA: Percentile-Based Level Allocation for Multiple-Bits-Per-Cell RRAM. | Anjiang Wei, Akash Levy, Pu Yi, Robert M. Radway, Priyanka Raina, Subhasish Mitra, Sara Achour |
| 2022 | ITC | PEPR: Pseudo-Exhaustive Physically-Aware Region Testing. | Wei Li, Chris Nigh, Danielle Duvalsaint, Subhasish Mitra, Ronald D. Blanton |
| 2021 | FMCAD | Scaling Up Hardware Accelerator Verification using A-QED with Functional Decomposition. | Saranyu Chattopadhyay, Florian Lonsing, Luca Piccolboni, Deepraj Soni, Peng Wei, Xiaofan Zhang, Yuan Zhou, Luca P. Carloni, Deming Chen, Jason Cong, Ramesh Karri, Zhiru Zhang, Caroline Trippel, Clark W. Barrett, Subhasish Mitra |
| 2020 | DAC | DECOY: DEflection-Driven HLS-Based Computation Partitioning for Obfuscating Intellectual PropertY. | Jianqi Chen, Monir Zaman, Yiorgos Makris, R. D. Shawn Blanton, Subhasish Mitra, Benjamin Carrin Schfer |
| 2020 | DAC | A Formal Approach for Detecting Vulnerabilities to Transient Execution Attacks in Out-of-Order Processors. | Mohammad Rahmani Fadiheh, Johannes Mller, Raik Brinkmann, Subhasish Mitra, Dominik Stoffel, Wolfgang Kunz |
| 2020 | DAC | A-QED Verification of Hardware Accelerators. | Eshan Singh, Florian Lonsing, Saranyu Chattopadhyay, Maxwell Strange, Peng Wei, Xiaofan Zhang, Yuan Zhou, Deming Chen, Jason Cong, Priyanka Raina, Zhiru Zhang, Clark W. Barrett, Subhasish Mitra |
| 2020 | DATE | Gap-free Processor Verification by S | Keerthikumara Devarajegowda, Mohammad Rahmani Fadiheh, Eshan Singh, Clark W. Barrett, Subhasish Mitra, Wolfgang Ecker, Dominik Stoffel, Wolfgang Kunz |
| 2020 | FMCAD | A Theoretical Framework for Symbolic Quick Error Detection. | Florian Lonsing, Subhasish Mitra, Clark W. Barrett |
| 2020 | ISCAS | Sensory Particles with Optical Telemetry. | Karthik Ganesan, Thomas A. Flores, Binh Q. Le, Dante G. Muratore, Neal A. Patel, Subhasish Mitra, Boris Murmann, Daniel Palanker |
| 2020 | ISLPED | Reconfigurable tiles of computing-in-memory SRAM architecture for scalable vectorization. | Roman Gauchi, Valentin Egloff, Maha Kooli, Jean-Philippe Nol, Bastien Giraud, Pascal Vivet, Subhasish Mitra, Henri-Pierre Charles |
| 2020 | VLSID | Message from the Technical Program Co-Chairs. | David Atienza, Subhasish Mitra, Manan Suri |
| 2019 | DAC | Cross-Layer Resilience: Challenges, Insights, and the Road Ahead. | Eric Cheng, Daniel Mueller-Gritschneder, Jacob A. Abraham, Pradip Bose, Alper Buyuktosunoglu, Deming Chen, Hyungmin Cho, Yanjing Li, Uzair Sharif, Kevin Skadron, Mircea Stan, Ulf Schlichtmann, Subhasish Mitra |
| 2019 | DATE | Processor Hardware Security Vulnerabilities and their Detection by Unique Program Execution Checking. | Mohammad Rahmani Fadiheh, Dominik Stoffel, Clark W. Barrett, Subhasish Mitra, Wolfgang Kunz |
| 2019 | DATE | Review of Methodologies for Pre- and Post-Silicon Analog Verification in Mixed-Signal SOCs. | Georges G. E. Gielen, Nektar Xama, Karthik Ganesan, Subhasish Mitra |
| 2019 | DATE | Symbolic QED Pre-silicon Verification for Automotive Microcontroller Cores: Industrial Case Study. | Eshan Singh, Keerthikumara Devarajegowda, Sebastian Simon, Ralf Schnieder, Karthik Ganesan, Mohammad Rahmani Fadiheh, Dominik Stoffel, Wolfgang Kunz, Clark W. Barrett, Wolfgang Ecker, Subhasish Mitra |
| 2019 | ICCAD | Unlocking the Power of Formal Hardware Verification with CoSA and Symbolic QED: Invited Paper. | Florian Lonsing, Karthik Ganesan, Makai Mann, Srinivasa Shashank Nuthakki, Eshan Singh, Mario Srouji, Yahan Yang, Subhasish Mitra, Clark W. Barrett |
| 2019 | ISCAS | A Data-Compressive Wired-OR Readout for Massively Parallel Neural Recording. | Dante G. Muratore, Pulkit Tandon, Mary Wootters, E. J. Chichilnisky, Subhasish Mitra, Boris Murmann |
| 2018 | DAC | TRIG: hardware accelerator for inference-based applications and experimental demonstration using carbon nanotube FETs. | Gage Hills, Daniel Bankman, Bert Moons, Lita Yang, Jake Hillard, Alex Kahng, Rebecca Park, Marian Verhelst, Boris Murmann, Max M. Shulaker, H.-S. Philip Wong, Subhasish Mitra |
| 2018 | DATE | Symbolic quick error detection using symbolic initial state for pre-silicon verification. | Mohammad Rahmani Fadiheh, Joakim Urdahl, Srinivasa Shashank Nuthakki, Subhasish Mitra, Clark W. Barrett, Dominik Stoffel, Wolfgang Kunz |
| 2018 | DATE | ETISS-ML: A multi-level instruction set simulator with RTL-level fault injection support for the evaluation of cross-layer resiliency techniques. | Daniel Mueller-Gritschneder, Martin Dittrich, Josef Weinzierl, Eric Cheng, Subhasish Mitra, Ulf Schlichtmann |
| 2018 | ISCAS | Coming Up N3XT, After 2D Scaling of Si CMOS. | William Hwang, Weier Wan, Subhasish Mitra, H.-S. Philip Wong |
| 2017 | ASPDAC | ASP-DAC 2017 keynote speech I: In memory of Edward J. McCluskey: The next wave of pioneering innovations. | Subhasish Mitra, Deming Chen |
| 2017 | CAV | E-QED: Electrical Bug Localization During Post-silicon Validation Enabled by Quick Error Detection and Formal Methods. | Eshan Singh, Clark W. Barrett, Subhasish Mitra |
| 2017 | DAC | A Systems Approach to Computing in Beyond CMOS Fabrics: Invited. | Ameya Patil, Naresh R. Shanbhag, Lav R. Varshney, Eric Pop, H.-S. Philip Wong, Subhasish Mitra, Jan M. Rabaey, Jeffrey A. Weldon, Larry T. Pileggi, Sasikanth Manipatruni, Dmitri E. Nikonov, Ian A. Young |
| 2017 | ICCD | Very Low Voltage (VLV) Design. | Ramon Bertran, Pradip Bose, David M. Brooks, Jeff Burns, Alper Buyuktosunoglu, Nandhini Chandramoorthy, Eric Cheng, Martin Cochet, Schuyler Eldridge, Daniel J. Friedman, Hans M. Jacobson, Rajiv V. Joshi, Subhasish Mitra, Robert K. Montoye, Arun Paidimarri, Pritish Parida, Kevin Skadron, Mircea Stan, Karthik Swaminathan, Augusto Vega, Swagath Venkataramani, Christos Vezyrtzis, Gu-Yeon Wei, John-David Wellman, Matthew M. Ziegler |
| 2017 | ICCD | Cross-Layer Resilience in Low-Voltage Digital Systems: Key Insights. | Eric Cheng, Jacob A. Abraham, Pradip Bose, Alper Buyuktosunoglu, Keith A. Campbell, Deming Chen, Chen-Yong Cher, Hyungmin Cho, Binh Q. Le, Klas Lilja, Shahrzad Mirkhani, Kevin Skadron, Mircea Stan, Lukasz G. Szafaryn, Christos Vezyrtzis, Subhasish Mitra |
| 2016 | DAC | Clear: cross-layer exploration for architecting resilience combining hardware and software techniques to tolerate soft errors in processor cores. | Eric Cheng, Shahrzad Mirkhani, Lukasz G. Szafaryn, Chen-Yong Cher, Hyungmin Cho, Kevin Skadron, Mircea R. Stan, Klas Lilja, Jacob A. Abraham, Pradip Bose, Subhasish Mitra |
| 2016 | ETS | Cross-layer resilience. | Subhasish Mitra |
| 2015 | ASPDAC | Multiple Independent Gate FETs: How many gates do we need? | Luca Gaetano Amar, Gage Hills, Pierre-Emmanuel Gaillardon, Subhasish Mitra, Giovanni De Micheli |
| 2015 | DAC | Hybrid quick error detection (H-QED): accelerator validation and debug using high-level synthesis principles. | Keith A. Campbell, David Lin, Subhasish Mitra, Deming Chen |
| 2015 | DAC | Understanding soft errors in uncore components. | Hyungmin Cho, Chen-Yong Cher, Thomas Shepherd, Subhasish Mitra |
| 2015 | DATE | Quick error detection tests with fast runtimes for effective post-silicon validation and debug. | David Lin, Eswaran S, Sharad Kumar, Eric Rentschler, Subhasish Mitra |
| 2015 | DATE | Efficient soft error vulnerability estimation of complex designs. | Shahrzad Mirkhani, Subhasish Mitra, Chen-Yong Cher, Jacob A. Abraham |
| 2015 | DATE | Monolithic 3D integration: a path from concept to reality. | Max M. Shulaker, Tony F. Wu, Mohamed M. Sabry, Hai Wei, H.-S. Philip Wong, Subhasish Mitra |
| 2015 | ISCAS | Time-based sensor interface circuits in carbon nanotube technology. | Georges G. E. Gielen, Jelle Van Rethy, Max M. Shulaker, Gage Hills, H.-S. Philip Wong, Subhasish Mitra |
| 2015 | ITC | A structured approach to post-silicon validation and debug using symbolic quick error detection. | David Lin, Eshan Singh, Clark W. Barrett, Subhasish Mitra |
| 2014 | ASPDAC | QED post-silicon validation and debug: Frequently asked questions. | David Lin, Subhasish Mitra |
| 2014 | ASPDAC | Rethinking error injection for effective resilience. | Shahrzad Mirkhani, Hyungmin Cho, Subhasish Mitra, Jacob A. Abraham |
| 2014 | DATE | Cross layer resiliency in real world. | Vikas Chandra, Subhasish Mitra, Chen-Yong Cher, Silvia Melitta Mller |
| 2014 | ITC | Welcome message. | Michael Purtell, Subhasish Mitra |
| 2013 | DAC | Quantitative evaluation of soft error injection techniques for robust system design. | Hyungmin Cho, Shahrzad Mirkhani, Chen-Yong Cher, Jacob A. Abraham, Subhasish Mitra |
| 2013 | DAC | Rapid exploration of processing and design guidelines to overcome carbon nanotube variations. | Gage Hills, Jie Zhang, Charles Mackin, Max M. Shulaker, Hai Wei, H.-S. Philip Wong, Subhasish Mitra |
| 2013 | DAC | Sacha: the Stanford carbon nanotube controlled handshaking robot. | Max M. Shulaker, Jelle Van Rethy, Gage Hills, Hong-Yu Chen, Georges G. E. Gielen, H.-S. Philip Wong, Subhasish Mitra |
| 2013 | DATE | Overcoming post-silicon validation challenges through quick error detection (QED). | David Lin, Ted Hong, Yanjing Li, Farzan Fallah, Donald S. Gardner, Nagib Hakim, Subhasish Mitra |
| 2013 | DATE | Carbon nanotube circuits: opportunities and challenges. | Hai Wei, Max M. Shulaker, Gage Hills, Hong-Yu Chen, Chi-Shuen Lee, Luckshitha Liyanage, Jie Zhang, H.-S. Philip Wong, Subhasish Mitra |
| 2013 | ISLPED | Carbon nanotube imperfection-immune digital VLSI. | Subhasish Mitra |
| 2013 | ITC | Self-repair of uncore components in robust system-on-chips: An OpenSPARC T2 case study. | Yanjing Li, Eric Cheng, Samy Makar, Subhasish Mitra |
| 2013 | ITC | Early-life-failure detection using SAT-based ATPG. | Matthias Sauer, Young Moon Kim, Jun Seomun, Hyung-Ock Kim, Kyung Tae Do, Jung Yun Choi, Kee Sup Kim, Subhasish Mitra, Bernd Becker |
| 2012 | ASPDAC | Nano-Electro-Mechanical (NEM) relays and their application to FPGA routing. | Chen Chen, W. Scott Lee, J. Provine, Soogine Chong, Roozbeh Parsa, Daesung Lee, Roger T. Howe, H.-S. Philip Wong, Subhasish Mitra |
| 2012 | ASPDAC | Bug localization techniques for effective post-silicon validation. | Subhasish Mitra, David Lin, Nagib Hakim, Donald S. Gardner |
| 2012 | DAC | Quick detection of difficult bugs for effective post-silicon validation. | David Lin, Ted Hong, Farzan Fallah, Nagib Hakim, Subhasish Mitra |
| 2012 | DATE | Nano-Electro-Mechanical relays for FPGA routing: Experimental demonstration and a design technique. | Chen Chen, W. Scott Lee, Roozbeh Parsa, Soogine Chong, J. Provine, Jeff Watt, Roger T. Howe, H.-S. Philip Wong, Subhasish Mitra |
| 2012 | VLSID | Tutorial T6: Variability-resistant Software and Hardware for Nano-Scale Computing. | Nikil D. Dutt, Mani B. Srivastava, Rajesh Gupta, Subhasish Mitra |
| 2011 | ICCAD | Carbon nanotube imperfection-immune digital VLSI: Frequently asked questions updated. | Hai Wei, Jie Zhang, Lan Wei, Nishant Patil, Albert Lin, Max M. Shulaker, Hong-Yu Chen, H.-S. Philip Wong, Subhasish Mitra |
| 2010 | DAC | Post-silicon validation opportunities, challenges and recent advances. | Subhasish Mitra, Sanjit A. Seshia, Nicola Nicolici |
| 2010 | DAC | BLoG: post-silicon bug localization in processors using bug localization graphs. | Sung-Boem Park, Anne Bracy, Hong Wang, Subhasish Mitra |
| 2010 | DAC | Carbon nanotube correlation: promising opportunity for CNFET circuit yield enhancement. | Jie Zhang, Shashikanth Bobba, Nishant Patil, Albert Lin, H.-S. Philip Wong, Giovanni De Micheli, Subhasish Mitra |
| 2010 | DATE | Statistical static timing analysis using Markov chain Monte Carlo. | Yashodhan Kanoria, Subhasish Mitra, Andrea Montanari |
| 2010 | DATE | ERSA: Error Resilient System Architecture for probabilistic applications. | Larkhoon Leem, Hyungmin Cho, Jason Bau, Quinn Jacobson, Subhasish Mitra |
| 2010 | DATE | Optimized self-tuning for circuit aging. | Evelyn Mintarno, Jolle Skaf, Rui Zheng, Jyothi Velamala, Yu Cao, Stephen P. Boyd, Robert W. Dutton, Subhasish Mitra |
| 2010 | DATE | Cross-layer resilience challenges: Metrics and optimization. | Subhasish Mitra, Kevin Brelsford, Pia N. Sanda |
| 2010 | DATE | Carbon nanotube circuits: Living with imperfections and variations. | Jie Zhang, Nishant Patil, Albert Lin, H.-S. Philip Wong, Subhasish Mitra |
| 2010 | FPGA | Efficient FPGAs using nanoelectromechanical relays. | Chen Chen, Roozbeh Parsa, Nishant Patil, Soogine Chong, Kerem Akarvardar, J. Provine, David Lewis, Jeff Watt, Roger T. Howe, H.-S. Philip Wong, Subhasish Mitra |
| 2010 | ICCAD | Cross-layer error resilience for robust systems. | Larkhoon Leem, Hyungmin Cho, Hsiao-Heng Lee, Young Moon Kim, Yanjing Li, Subhasish Mitra |
| 2010 | ITC | QED: Quick Error Detection tests for effective post-silicon validation. | Ted Hong, Yanjing Li, Sung-Boem Park, Diana Mui, David Lin, Ziyad Abdel Kaleq, Nagib Hakim, Helia Naeimi, Donald S. Gardner, Subhasish Mitra |
| 2010 | VLSID | Robust System Design. | Subhasish Mitra |
| 2010 | VTS | Gate-oxide early-life failure identification using delay shifts. | Young Moon Kim, Tze Wee Chen, Yoshio Kameda, Masayuki Mizuno, Subhasish Mitra |
| 2010 | VTS | Concurrent autonomous self-test for uncore components in system-on-chips. | Yanjing Li, Onur Mutlu, Donald S. Gardner, Subhasish Mitra |
| 2009 | DAC | Digital VLSI logic technology using Carbon Nanotube FETs: frequently asked questions. | Nishant Patil, Albert Lin, Jie Zhang, H.-S. Philip Wong, Subhasish Mitra |
| 2009 | DAC | Carbon nanotube circuits in the presence of carbon nanotube density variations. | Jie Zhang, Nishant Patil, Arash Hazeghi, Subhasish Mitra |
| 2009 | DATE | Imperfection-immune VLSI logic circuits using Carbon Nanotube Field Effect Transistors. | Subhasish Mitra, Jie Zhang, Nishant Patil, Hai Wei |
| 2009 | ICCAD | Nanoelectromechanical (NEM) relays integrated with CMOS SRAM for improved stability and low leakage. | Soogine Chong, Kerem Akarvardar, Roozbeh Parsa, Jun-Bo Yoon, Roger T. Howe, Subhasish Mitra, H.-S. Philip Wong |
| 2009 | ICCAD | Operating system scheduling for efficient online self-test in robust systems. | Yanjing Li, Onur Mutlu, Subhasish Mitra |
| 2009 | ICCD | Imperfection-immune Carbon Nanotube digital VLSI. | Nishant Patil, Subhasish Mitra |
| 2009 | VTS | Testing for Transistor Aging. | A. Hakan Baba, Subhasish Mitra |
| 2008 | DAC | IFRA: instruction footprint recording and analysis for post-silicon bug localization in processors. | Sung-Boem Park, Subhasish Mitra |
| 2008 | DATE | Soft Errors: System Effects, Protection Techniques and Case Studies. | Dimitris Gizopoulos, Kaushik Roy, Subhasish Mitra, Pia N. Sanda |
| 2008 | DATE | CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns. | Yanjing Li, Samy Makar, Subhasish Mitra |
| 2008 | DATE | Globally Optimized Robust Systems to Overcome Scaled CMOS Reliability Challenges. | Subhasish Mitra |
| 2008 | DATE | Dependable Embedded Systems Special Day Panel: Issues and Challenges in Dependable Embedded Systems. | Neeraj Suri, Christof Fetzer, Jacob A. Abraham, Stefan Poledna, Avi Mendelson, Subhasish Mitra |
| 2008 | DATE | Design Guidelines for Metallic-Carbon-Nanotube-Tolerant Digital Logic Circuits. | Jie Zhang, Nishant Patil, Subhasish Mitra |
| 2008 | ICCAD | A low-overhead fault tolerance scheme for TSV-based 3D network on chip links. | Igor Loi, Subhasish Mitra, Thomas H. Lee, Shinobu Fujita, Luca Benini |
| 2008 | ICCAD | Reliable system design: models, metrics and design techniques. | Subhasish Mitra, Ravishankar K. Iyer, Kishor S. Trivedi, James W. Tschanz |
| 2008 | IOLTS | Soft Error Protection Techniques. | Subhasish Mitra |
| 2008 | ITC | Optimized Circuit Failure Prediction for Aging: Practicality and Promise. | Mridul Agarwal, Varsha Balakrishnan, Anshuman Bhuyan, Kyunglok Kim, Bipul C. Paul, Wenping Wang, Bo Yang, Yu Cao, Subhasish Mitra |
| 2008 | ITC | VAST: Virtualization-Assisted Concurrent Autonomous Self-Test. | Hiroaki Inoue, Yanjing Li, Subhasish Mitra |
| 2008 | VTS | Gate-Oxide Early Life Failure Prediction. | Tze Wee Chen, Kyunglok Kim, Young Moon Kim, Subhasish Mitra |
| 2007 | DAC | Automated Design of Misaligned-Carbon-Nanotube-Immune Circuits. | Nishant Patil, Jie Deng, H.-S. Philip Wong, Subhasish Mitra |
| 2007 | DATE | Verification-guided soft error resilience. | Sanjit A. Seshia, Wenchao Li, Subhasish Mitra |
| 2007 | IOLTS | Circuit Failure Prediction Enables Robust System Design Resilient to Aging and Wearout. | Subhasish Mitra |
| 2007 | IOLTS | Soft Errors: Technology Trends, System Effects, and Protection Techniques. | Subhasish Mitra, Pia N. Sanda, Norbert Seifert |
| 2007 | ITC | California scan architecture for high quality and low power testing. | Kyoung Youn Cho, Subhasish Mitra, Edward J. McCluskey |
| 2007 | ITC | Circuit failure prediction to overcome scaled CMOS reliability challenges. | Subhasish Mitra, Mridul Agarwal |
| 2007 | VTS | Circuit Failure Prediction and Its Application to Transistor Aging. | Mridul Agarwal, Bipul C. Paul, Ming Zhang, Subhasish Mitra |
| 2006 | IOLTS | Should Logic SER be Solved at the Circuit Level? | T. M. Mak, Subhasish Mitra |
| 2006 | ITC | Combinational Logic Soft Error Correction. | Subhasish Mitra, Ming Zhang, Saad Waqas, Norbert Seifert, Balkaran S. Gill, Kee Sup Kim |
| 2006 | ITC | Signature Analyzer Design for Yield Learning Support. | Nishant Patil, Subhasish Mitra, Steven S. Lumetta |
| 2006 | ITC | Test Compression for FPGAs. | Mehdi Baradaran Tahoori, Subhasish Mitra |
| 2006 | VTS | Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive. | Ruifeng Guo, Subhasish Mitra, M. Enamul Amyeen, Jinkyu Lee, Srihari Sivaraj, Srikanth Venkataraman |
| 2006 | SRDS | How To Safeguard Your Sensitive Data. | Bob Mungamuru, Hector Garcia-Molina, Subhasish Mitra |
| 2005 | DAC | Logic soft errors in sub-65nm technologies design and CAD challenges. | Subhasish Mitra, Tanay Karnik, Norbert Seifert, Ming Zhang |
| 2005 | DAC | Response compaction with any number of unknowns using a new LFSR architecture. | Erik H. Volkerink, Subhasish Mitra |
| 2005 | IOLTS | DFT Assisted Built-In Soft Error Resilience. | T. M. Mak, Subhasish Mitra, Ming Zhang |
| 2005 | ITC | Gate exhaustive testing. | Kyoung Youn Cho, Subhasish Mitra, Edward J. McCluskey |
| 2005 | ITC | Logic soft errors: a major barrier to robust platform design. | Subhasish Mitra, Ming Zhang, T. M. Mak, Norbert Seifert, Victor Zia, Kee Sup Kim |
| 2005 | ITC | Enabling yield analysis with X-compact. | Zoran Stanojevic, Ruifeng Guo, Subhasish Mitra, Srikanth Venkataraman |
| 2005 | VLSID | Testing Nanometer Digital Integration Circuits: Myths, Reality and the Road Ahead. | R. D. (Shawn) Blanton, Subhasish Mitra |
| 2004 | FCCM | Defect and Fault Tolerance of Reconfigurable Molecular Computing. | Mehdi Baradaran Tahoori, Subhasish Mitra |
| 2004 | ITC | Speed Clustering of Integrated Circuits. | Kenneth A. Brand, Erik H. Volkerink, Edward J. McCluskey, Subhasish Mitra |
| 2004 | ITC | X-Tolerant Signature Analysis. | Subhasish Mitra, Steven S. Lumetta, Michael Mitzenmacher |
| 2004 | ITC | Interconnect Delay Testing of Designs on Programmable Logic Devices. | Mehdi Baradaran Tahoori, Subhasish Mitra |
| 2004 | VTS | ELF-Murphy Data on Defects and Test Sets. | Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, Franois-Fabien Ferhani, Edward Li, Subhasish Mitra |
| 2004 | VTS | Delay Defect Screening using Process Monitor Structures. | Subhasish Mitra, Erik H. Volkerink, Edward J. McCluskey, Stefan Eichenberger |
| 2003 | ICCD | XMAX: X-Tolerant Architecture for MAXimal Test Compression. | Subhasish Mitra, Kee Sup Kim |
| 2003 | ITC | H-DFT: A Hybrid DFT Architecture For Low-Cost High Quality Structural Testing. | David M. Wu, Mike Lin, Subhasish Mitra, Kee Sup Kim, Anil Sabbavarapu, Talal Jaber, Pete Johnson, Dale March, Greg Parrish |
| 2003 | VTS | Bist Reseeding with very few Seeds. | Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey |
| 2003 | VTS | Automatic Configuration Generation for FPGA Interconnect Testing. | Mehdi Baradaran Tahoori, Subhasish Mitra |
| 2003 | VTS | Efficient Seed Utilization for Reseeding based Compression. | Erik H. Volkerink, Subhasish Mitra |
| 2002 | ITC | X-Compact: An Efficient Response Compaction Technique for Test Cost Reduction. | Subhasish Mitra, Kee Sup Kim |
| 2002 | ITC | Fault Grading FPGA Interconnect Test Configurations. | Mehdi Baradaran Tahoori, Subhasish Mitra, Shahin Toutounchi, Edward J. McCluskey |
| 2002 | ITC | Packet-Based Input Test Data Compression Techniques. | Erik H. Volkerink, Ajay Khoche, Subhasish Mitra |
| 2002 | VTS | Test Vector Compression Using EDA-ATE Synergies. | Ajay Khoche, Erik H. Volkerink, Jochen Rivoir, Subhasish Mitra |
| 2002 | VTS | Debating the Future of Burn-In. | Edward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers |
| 2002 | VTS | Design for Testability and Testing of IEEE 1149.1 Tap Controller. | Subhasish Mitra, Edward J. McCluskey, Samy Makar |
| 2001 | DSN | Techniques for Estimation of Design Diversity for Combinational Logic Circuits. | Subhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey |
| 2001 | VTS | Design Diversity for Concurrent Error Detection in Sequential Logic Circuts. | Subhasish Mitra, Edward J. McCluskey |
| 2001 | VTS | Design of Redundant Systems Protected Against Common-Mode Failures. | Subhasish Mitra, Edward J. McCluskey |
| 2001 | VTS | An Evaluation of Pseudo Random Testing for Detecting Real Defects. | Chao-Wen Tseng, Subhasish Mitra, Edward J. McCluskey, Scott Davidson |
| 2000 | ITC | Combinational logic synthesis for diversity in duplex systems. | Subhasish Mitra, Edward J. McCluskey |
| 2000 | ITC | Which concurrent error detection scheme to choose ? | Subhasish Mitra, Edward J. McCluskey |
| 2000 | VTS | Word Voter: A New Voter Design for Triple Modular Redundant Systems. | Subhasish Mitra, Edward J. McCluskey |
| 2000 | VTS | Fault Escapes in Duplex Systems. | Subhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey |
| 1999 | ITC | A design diversity metric and reliability analysis for redundant systems. | Subhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey |
| 1997 | ICCAD | An output encoding problem and a solution technique. | Subhasish Mitra, LaNae J. Avra, Edward J. McCluskey |
| 1997 | ITC | Scan Synthesis for One-Hot Signals. | Subhasish Mitra, LaNae J. Avra, Edward J. McCluskey |