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IEEE European Test Symposium

ETS

B

CORE rank

CORE rank (raw)

B

Fields of research

Computer Systems Engineering

Papers indexed

1,163

1999–2026

Papers per year

199968 peak2026

ETS papers

1,163 records sourced from DBLP. Search titles, filter by year, sort by recency.

YearTitleAuthors
2022Prediction of Thermally Accelerated Aging Process at 28nm.Parvez Anwar Chanawala, Ian Hill, S. Arash Sheikholeslam, Andr Ivanov
2022Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries.Riccardo Cantoro, Francesco Garau, Patrick Girard, Nima Kolahimahmoudi, Sandro Sartoni, Matteo Sonza Reorda, Arnaud Virazel
2022Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip.Paolo Bernardi, Giorgio Insinga, G. Paganini, Riccardo Cantoro, P. Beer, Matteo Coppetta, N. Mautone, G. Carnevale, Pierre Scaramuzza, Rudolf Ullmann
2022An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip.Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
2022Test, Reliability and Functional Safety Trends for Automotive System-on-Chip.Francesco Angione, Davide Appello, Joseph Aribido, Jyotika Athavale, Nicol Bellarmino, Paolo Bernardi, Riccardo Cantoro, Corrado De Sio, Tommaso Foscale, Gabriele Gavarini, Juan-David Guerrero-Balaguera, Martin Huch, Giusy Iaria, Tobias Kilian, Riccardo Mariani, Raffaele Martone, Annachiara Ruospo, Ernesto Snchez, Ulf Schlichtmann, Giovanni Squillero, Matteo Sonza Reorda, Luca Sterpone, Vincenzo Tancorre, Roberto Ugioli
2022Machine Learning for Test, Diagnosis, Post-Silicon Validation and Yield Optimization.Hussam Amrouch, Krishnendu Chakrabarty, Dirk Pflger, Ilia Polian, Matthias Sauer, Matteo Sonza Reorda
2022Process and Runtime Variation Robustness for Spintronic-Based Neuromorphic Fabric.Soyed Tuhin Ahmed, Mahta Mayahinia, Michael Hefenbrock, Christopher Mnch, Mehdi B. Tahoori
2021Exploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuli.Thibault Vayssade, Mouhamad Chehaitly, Florence Azas, Laurent Latorre, Franois Lefvre
2021TDMS Test Scheduler: An Integrated Framework for Test Scheduling of DVFS-based SoCs with Multiple Voltage Islands.Fotios Vartziotis
2021Analyzing the Impact of Approximate Adders on the Reliability of FPGA Accelerators.Ioannis Tsounis, Athanasios Papadimitriou, Mihalis Psarakis
2021Exploring and Comparing IEEE P1687.1 and IEEE 1687 Modeling of Non-TAP Interfaces.Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Michele Portolan, Martin Keim
2021Test Data-Driven Machine Learning Models for Reliable Quantum Circuit Output.Vedika Saravanan, Samah Mohamed Saeed
2021Trustworthy computing on untrustworthy and Trojan-infected on-chip interconnects.Heba A. Salem, Nigel P. Topham
2021Arithmetic Circuit Correction by Adding Optimized Correctors Based on Groebner Basis Computation.Negar Aghapour Sabbagh, Bijan Alizadeh
2021Unsupervised Learning in Test Generation for Digital Integrated Circuits.Soham Roy, Spencer K. Millican, Vishwani D. Agrawal
2021Online Testing of a Row-Stationary Convolution Accelerator.Mohammad Rasoul Roshanshah, Katayoon Basharkhah, Zainalabedin Navabi
2021Synergies Between Delay Test and Post-silicon Speed Path Validation: A Tutorial Introduction.Sandip Ray, Arani Sinha
2021BIST-Assisted Analog Fault Diagnosis.Antonios Pavlidis, Eric Faehn, Marie-Minerve Lourat, Haralampos-G. Stratigopoulos
2021Recent Advances in Photonic Physical Unclonable Functions.Fabio Pavanello, Ian O'Connor, Ulrich Rhrmair, Amy C. Foster, Dimitris Syvridis
2021Chill Out: Freezing Attacks on Capacitors and DC/DC Converters.Obi Nnorom, Jalil Morris, Ilias Giechaskiel, Jakub Szefer
2021Design of Fault-Tolerant and Thermally Stable XOR Gate in Quantum dot Cellular Automata.Syed Farah Naz, Ambika Prasad Shah, Suhaib Ahmed, Patrick Girard, Michael Waltl
2021Transit-Guard: An OS-based Defense Mechanism Against Transient Execution Attacks.Maria Mushtaq, David Novo, Florent Bruguier, Pascal Benoit, Muhammad Khurram Bhatti
2021MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM.Christopher Mnch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori
2021Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring.Kazuki Monta, Leonidas Katselas, Ferenc Fodor, Alkis A. Hatzopoulos, Makoto Nagata, Erik Jan Marinissen
2021Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs.Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia Bolzani Poehls, Said Hamdioui
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