IEEE European Test Symposium

ETS

CORE rank

CORE rank (raw)

Fields of research

Computer Systems Engineering

Papers indexed

1,163

1999–2026

Best Computer Systems Engineering conferences

Papers per year

199968 peak2026

Most published authors

ETS papers

1,163 records sourced from DBLP. Search titles, filter by year, sort by recency.

Year	Title	Authors
2021	Security, Reliability and Test Aspects of the RISC-V Ecosystem.	Jaume Abella, Sergi Alcaide, Jens Anders, Francisco Bas, Steffen Becker, Elke De Mulder, Nourhan Elhamawy, Frank K. Grkaynak, Helena Handschuh, Carles Hernndez, Michael Hutter, Leonidas Kosmidis, Ilia Polian, Matthias Sauer, Stefan Wagner, Francesco Regazzoni
2020	A Built-In Self-Test Method For MEMS Piezoresistive Sensor.	Manhong Zhu, Jia Li, Weibing Wang, Dapeng Chen
2020	MBIST Support for Reliable eMRAM Sensing.	Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Cyrille Dray, El Mehdi Boujamaa
2020	Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics.	Nektar Xama, Jakob Raymaekers, Martin Andraud, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen
2020	Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level.	Lizhou Wu, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui
2020	Efficient Prognostication of Pattern Count with Different Input Compression Ratios.	Fong-Jyun Tsai, Chong-Siao Ye, Yu Huang, Kuen-Jong Lee, Wu-Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski
2020	Analog Fault Simulation - a Hot Topic!	Stephen Sunter
2020	Accurate Measurements of Small Resistances in Vertical Interconnects with Small Aspect Ratios.	Michele Stucchi, Ferenc Fodor, Erik Jan Marinissen
2020	Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs.	Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Sandro Sartoni, Riccardo Cantoro, Matteo Sonza Reorda, Said Hamdioui, Christian Sauer
2020	Built-In Predictors for Dynamic Crosstalk Avoidance.	Rezgar Sadeghi, Zainalabedin Navabi
2020	LiD-CAT: A Lightweight Detector for Cache ATtacks.	Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil, Behrad Niazmand, Tara Ghasempouri, Jaan Raik, Johanna Seplveda
2020	Minimal Witnesses for Security Weaknesses in Reconfigurable Scan Networks.	Pascal Raiola, Tobias Paxian, Bernd Becker
2020	Dynamic Authentication-Based Secure Access to Test Infrastructure.	Michele Portolan, Vincent Reynaud, Paolo Maistri, Rgis Leveugle
2020	Linking Chip, Board, and System Test via Standards.	Michele Portolan, Jeff Rearick, Martin Keim
2020	Anomaly Detection in Embedded Systems Using Power and Memory Side Channels.	Jiho Park, Virinchi Roy Surabhi, Prashanth Krishnamurthy, Siddharth Garg, Ramesh Karri, Farshad Khorrami
2020	Thermal Neutrons: a Possible Threat for Supercomputers and Safety Critical Applications.	Daniel Oliveira, Sean Blanchard, Nathan DeBardeleben, Fernando Fernandes dos Santos, Gabriel Piscoya Dvila, Philippe O. A. Navaux, Carlo Cazzaniga, Christopher Frost, Robert C. Baumann, Paolo Rech
2020	Nonlinear Codes for Control Flow Checking.	Giorgio Di Natale, Osnat Keren
2020	Variation-Aware Defect Characterization at Cell Level.	Zahra Paria Najafi-Haghi, Marzieh Hashemipour-Nazari, Hans-Joachim Wunderlich
2020	Defect Characterization and Test Generation for Spintronic-based Compute-In-Memory.	Sarath Mohanachandran Nair, Christopher Mnch, Mehdi Baradaran Tahoori
2020	Learning-Based Cell-Aware Defect Diagnosis of Customer Returns.	Safa Mhamdi, Patrick Girard, Arnaud Virazel, Alberto Bosio, Aymen Ladhar
2020	Modeling Static Noise Margin for FinFET based SRAM PUFs.	Shayesteh Masoumian, Georgios N. Selimis, Roel Maes, Geert Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil
2020	PWS: Potential Wafermap Scratch Defect Pattern Recognition with Machine Learning Techniques.	Katherine Shu-Min Li, Peter Yi-Yu Liao, Leon Chou, Ken Chau-Cheung Cheng, Andrew Yi-Ann Huang, Sying-Jyan Wang, Gus Chang-Hung Han
2020	Automated Graph-Based Fault Injection Into Virtual Prototypes for Robustness Evaluation.	Jo Laufenberg, Thomas Kropf, Oliver Bringmann
2020	IEEE Std. P1687.1 for Access Control of Reconfigurable Scan Networks.	Erik Larsson, Zehang Xiang, Prathamesh Murali
2020	The Risk of Outsourcing: Hidden SCA Trojans in Third-Party IP-Cores Threaten Cryptographic ICs.	David Knichel, Thorben Moos, Amir Moradi

326–350 of 1,163← Previous Next →

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