| 2020 | Fast BCH 1-Bit Error Correction Combined with Fast Multi-Bit Error Detection. | Christian Schulz-Hanke |
| 2020 | Reduced-Precision DWC for Mixed-Precision GPUs. | Fernando Fernandes dos Santos, Marcelo Brandalero, Pedro Martins Basso, Michael Hbner, Luigi Carro, Paolo Rech |
| 2020 | Industrial Practices in Low-Power Robust Design. | C. P. Ravikumar |
| 2020 | A Comprehensive End-to-end Solution for a Secure and Dynamic Mixed-signal 1687 System. | Michele Portolan, R. Silveira Feitoza, Ghislain Takam Tchendjou, Vincent Reynaud, Kalpana Senthamarai Kannan, Manuel J. Barragn, Emmanuel Simeu, Paolo Maistri, Lorena Anghel, Rgis Leveugle, Salvador Mir |
| 2020 | Reduced Fault Coverage as a Target for Design Scaffolding Security. | Irith Pomeranz, Sandip Kundu |
| 2020 | Storage Based Built-In Test Pattern Generation Method for Close-to-Functional Broadside Tests. | Irith Pomeranz |
| 2020 | Error Resilient Machine Learning for Safety-Critical Systems: Position Paper. | Karthik Pattabiraman, Guanpeng Li, Zitao Chen |
| 2020 | An ECC-Based Repair Approach with an Offset-Repair CAM for Mitigating the MBUs Affecting Repair CAM. | Panagiota Papavramidou, Michael Nicolaidis, Patrick Girard |
| 2020 | A Secure Scan Controller for Protecting Logic Locking. | Quang-Linh Nguyen, Emanuele Valea, Marie-Lise Flottes, Sophie Dupuis, Bruno Rouzeyre |
| 2020 | Defect Characterization of Spintronic-based Neuromorphic Circuits. | Christopher Mnch, Mehdi B. Tahoori |
| 2020 | On-Chip Delay Measurement for Degradation Detection And Its Evaluation under Accelerated Life Test. | Yousuke Miyake, Takaaki Kato, Seiji Kajihara, Masao Aso, Haruji Futami, Satoshi Matsunaga, Yukiya Miura |
| 2020 | Soft Error Tolerance of Power-Supply-Noise Hardened Latches. | Yukiya Miura, Yuya Kinoshita |
| 2020 | Automatic Fault Simulators for Diagnosis of Analog Systems. | Tommaso Melis, Emmanuel Simeu, Etienne Auvray |
| 2020 | Leveraging CMOS Aging for Efficient Microelectronics Design. | Antonio Leonel Hernndez Martnez, S. Saqib Khursheed, Daniele Rossi |
| 2020 | A self-scrubbing scheme for embedded systems in radiation environments. | Yufan Lu, Xiaojun Zhai, Sangeet Saha, Shoaib Ehsan, Klaus D. McDonald-Maier |
| 2020 | Leveraging reuse and endurance by efficient mapping and placement for NVM-based FPGAs. | Joo Paulo Cardoso de Lima, Rafael Fo de Moura, Luigi Carro |
| 2020 | Lightweight Protection of Cryptographic Hardware Accelerators against Differential Fault Analysis. | Ana Lasheras, Ramon Canal, Eva Rodrguez, Luca Cassano |
| 2020 | Machine Learning Clustering Techniques for Selective Mitigation of Critical Design Features. | Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone |
| 2020 | Evaluation on Hardware-Trojan Detection at Gate-Level IP Cores Utilizing Machine Learning Methods. | Tatsuki Kurihara, Kento Hasegawa, Nozomu Togawa |
| 2020 | High-level Modeling of Manufacturing Faults in Deep Neural Network Accelerators. | Shamik Kundu, Ahmet Soyyigit, Khaza Anuarul Hoque, Kanad Basu |
| 2020 | Hardware Security Vulnerability Assessment to Identify the Potential Risks in A Critical Embedded Application. | Zahra Kazemi, Mahdi Fazeli, David Hly, Vincent Beroulle |
| 2020 | Single Phase Clock Based Radiation Tolerant D Flip-flop Circuit. | Abhishek Jain, Andrea Veggetti, Dennis Crippa, Antonio Benfante, Simone Gerardin, Marta Bagatin |
| 2020 | A Test Sensitization State Compaction Method on Controller Augmentation. | Yuki Ikegaya, Toshinori Hosokawa, Yuta Ishiyama, Hiroshi Yamazaki |
| 2020 | A Low Capture Power Oriented X-Identification-Filling Co-Optimization Method. | Toshinori Hosokawa, Kenichiro Misawa, Hiroshi Yamazaki, Masayoshi Yoshimura, Masayuki Arai |
| 2020 | Dependable Deep Learning: Towards Cost-Efficient Resilience of Deep Neural Network Accelerators against Soft Errors and Permanent Faults. | Muhammad Abdullah Hanif, Muhammad Shafique |