| 2018 | A Capture Safe Static Test Compaction Method Based on Don't Cares. | Sayuri Ochi, Hiroshi Yamazaki, Toshinori Hosokawa, Masayoshi Yoshimura |
| 2018 | Test Compression Using Extended Nonlinear Binary Codes. | Ondrej Novk |
| 2018 | DRAM Characterization under Relaxed Refresh Period Considering System Level Effects within a Commodity Server. | Lev Mukhanov, Konstantinos Tovletoglou, Dimitrios S. Nikolopoulos, Georgios Karakonstantis |
| 2018 | Cross-Layer Control Adaptation for Autonomous System Resilience. | Md Imran Momtaz, Suvadeep Banerjee, Sujay Pandey, Jacob A. Abraham, Abhijit Chatterjee |
| 2018 | Finding False Paths for Sequential Circuits Using Operations on ROBDDs. | Anzhela Yu. Matrosova, Sergei Ostanin, Semen Chernyshov |
| 2018 | A Novel Use of Approximate Circuits to Thwart Hardware Trojan Insertion and Provide Obfuscation. | Honorio Martn, Luis Entrena, Sophie Dupuis, Giorgio Di Natale |
| 2018 | Efficient Fault Injection for Embedded Systems: As Fast as Possible but as Accurate as Necessary. | Petra R. Maier, Uzair Sharif, Daniel Mueller-Gritschneder, Ulf Schlichtmann |
| 2018 | Design Tradeoffs in Bioimplantable Devices: A Case Study with Bladder Pressure Monitoring. | Shakil Mahmud, Steve J. A. Majerus, Margot S. Damaser, Robert Karam |
| 2018 | Adaptive ECC Techniques for Reliability and Yield Enhancement of Phase Change Memory. | Shyue-Kung Lu, Hui-Ping Li, Kohei Miyase |
| 2018 | Emulation of an ASIC Power, Temperature and Aging Monitor System for FPGA Prototyping. | Alexandra Listl, Daniel Mueller-Gritschneder, Fabian Kluge, Ulf Schlichtmann |
| 2018 | Power/Area-Optimized Fault Tolerance for Safety Critical Applications. | Milos Krstic, Aleksandar Simevski, Markus Ulbricht, Stefan Weidling |
| 2018 | Near-Optimal Node Selection Procedure for Aging Monitor Placement. | Somayeh Sadeghi Kohan, Arash Vafaei, Zainalabedin Navabi |
| 2018 | Impact of a Laser Pulse on a STT-MRAM Bitcell: Security and Reliability Issues. | Mounia Kharbouche-Harrari, Jrmy Postel-Pellerin, Gregory di Pendina, Romain Wacquez, Driss Aboulkassimi, Marc Bocquet, R. Sousa, R. Delattre, Jean-Michel Portal |
| 2018 | On the Effect of Aging in Detecting Hardware Trojan Horses with Template Analysis. | Naghmeh Karimi, Jean-Luc Danger, Sylvain Guilley |
| 2018 | An Effective Stochastic Number Duplicator and Its Evaluations Using Composite Arithmetic Circuits. | Ryota Ishikawa, Masashi Tawada, Masao Yanagisawa, Nozomu Togawa |
| 2018 | A Test Register Assignment Method Based on Controller Augmentation to Reduce the Number of Test Patterns. | Toshinori Hosokawa, Hiroshi Yamazaki, Shun Takeda, Masayoshi Yoshimura |
| 2018 | A Sequentially Untestable Fault Identification Method Based on n-Bit State Cube Justification. | Toshinori Hosokawa, Morito Niseki, Masayoshi Yoshimura, Hiroshi Yamazaki, Masayuki Arai, Hiroyuki Yotsuyanagi, Masaki Hashizume |
| 2018 | A New Approach to Threshold Voltage Measurements of Transistors. | Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen |
| 2018 | Detecting the Existence of Malfunctions in Microcontrollers Utilizing Power Analysis. | Kento Hasegawa, Masao Yanagisawa, Nozomu Togawa |
| 2018 | Robust Machine Learning Systems: Reliability and Security for Deep Neural Networks. | Muhammad Abdullah Hanif, Faiq Khalid, Rachmad Vidya Wicaksana Putra, Semeen Rehman, Muhammad Shafique |
| 2018 | AMS-RF test quality: Assessing defect severity. | Valentin Guiterrez, Antonio J. Gins, Gildas Lger |
| 2018 | Resistive Switching Behavior seen from the Energy Point of View. | Jorge Gomez, Angel Abusleme, Ioannis Vourkas, Antonio Rubio |
| 2018 | Fault-Independent Test-Generation for Software-Based Self-Testing. | Panagiotis Georgiou, Xrysovalantis Kavousianos, Riccardo Cantoro, Matteo Sonza Reorda |
| 2018 | Reliability And Performance Challenges Of Ultra-Low Voltage Caches: A Trade-Off Analysis. | Anteneh Gebregiorgis, Mehdi Baradaran Tahoori |
| 2018 | Development flow of on-line Software Test Libraries for asynchronous processor cores. | Andrea Floridia, Ernesto Snchez, Nikolaos Andrikos |