On-Line Testing and Robust System Design
IOLTS
C
CORE rank
CORE rank (raw)
C
Fields of research
Computer Systems Engineering · Software Engineering
Papers indexed
1,346
2000–2026
Papers per year
200069 peak2026
Most published authors
IOLTS papers
1,346 records sourced from DBLP. Search titles, filter by year, sort by recency.
| Year | Title | Authors |
|---|---|---|
| 2010 | Reducing the area overhead of TMR-systems by protecting specific signals. | Michael Augustin, Michael Gssel, Rolf Kraemer |
| 2010 | Thermal coupling in ICs: Applications to the test and characterization of analogue and RF circuits. | Josep Altet, Diego Mateo, Eduardo Aldrete-Vidrio |
| 2010 | Reconfigurable low-power Concurrent Error Detection in logic circuits. | Sobeeh Almukhaizim, Sara Bunian, Ozgur Sinanoglu |
| 2010 | How to flip a bit? | Michel Agoyan, Jean-Max Dutertre, Amir-Pasha Mirbaha, David Naccache, Anne-Lise Ribotta, Assia Tria |
| 2009 | On-line characterization and reconfiguration for single event upset variations. | Kenneth M. Zick, John P. Hayes |
| 2009 | Ultra low cost asynchronous handshake checker. | Steffen Zeidler, Marcus Ehrig, Milos Krstic, Michael Augustin, Christoph Wolf, Rolf Kraemer |
| 2009 | Multilinear codes for robust error detection. | Zhen Wang, Mark G. Karpovsky, Berk Sunar |
| 2009 | An Input Vector Monitoring Concurrent BIST scheme exploiting . | Ioannis Voyiatzis, Dimitris Gizopoulos, Antonis M. Paschalis |
| 2009 | A low-cost solution for developing reliable Linux-based space computers for on-board data handling. | Massimo Violante, M. L. Esposti |
| 2009 | Online error detection and correction of erratic bits in register files. | Xavier Vera, Jaume Abella, Javier Carretero, Pedro Chaparro, Antonio Gonzlez |
| 2009 | DFx for massively multiprocessors. | Xavier Vera |
| 2009 | Built-in aging monitoring for safety-critical applications. | Julio Csar Vzquez, Vctor H. Champac, Adriel Ziesemer, Ricardo Reis, Isabel C. Teixeira, Marcelino B. Santos, Joo Paulo Teixeira |
| 2009 | Briefing power/reliability optimization in embedded software design. | Fabian Vargas, Claudia A. Rocha, Bernardo Pianta, Marta Portela-Garca, Celia Lpez-Ongil, Mario Garca-Valderas, Luis Entrena |
| 2009 | SRAM cell design using tri-state devices for SEU protection. | Yuriy Shiyanovskii, Francis G. Wolff, Christos A. Papachristou |
| 2009 | Delay-fault tolerance to power supply Voltage disturbances analysis in nanometer technologies. | Jorge Semio, Judit Freijedo, Juan J. Rodrguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira |
| 2009 | Controllability and observability in mixed signal cores. | Jos F. da Rocha, Nuno Dias, Angelo Monteiro, Alexandre Neves, Gabriel Santos, Marcelino B. Santos, Joo Paulo Teixeira |
| 2009 | Concurrent checking with split-parity codes. | Michael Richter, Michael Gssel |
| 2009 | Soft error detection and correction for FFT based convolution using different block lengths. | Pedro Reviriego, Juan Antonio Maestro, Anne O'Donnell, Chris J. Bleakley |
| 2009 | Evaluating Alpha-induced soft errors in embedded microprocessors. | Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Davide Appello |
| 2009 | A fault tolerant journalized stack processor architecture. | Abbas Ramazani, Mohsin Amin, Fabrice Monteiro, Camille Diou, Abbas Dandache |
| 2009 | C-testable S-box implementation for secure advanced encryption standard. | Hafizur Rahaman, Jimson Mathew, Abusaleh M. Jabir, Dhiraj K. Pradhan |
| 2009 | Error detection in addition chain based ECC Point Multiplication. | Salvatore Pontarelli, Gian Carlo Cardarilli, Marco Re, Adelio Salsano |
| 2009 | Aggressively voltage overscaled adaptive RF systems using error control at the bit and symbol levels. | Jayaram Natarajan, Gokul Kumar, Shreyas Sen, Muhammad Mudassar Nisar, Deuk Lee, Abhijit Chatterjee |
| 2009 | A low-cost fault-tolerant technique for Carry Look-Ahead adder. | Alireza Namazi, Yasser Sedaghat, Seyed Ghassem Miremadi, Alireza Ejlali |
| 2009 | A methodology for measuring transistor ageing effects towards accurate reliability simulation. | Elie Maricau, Georges G. E. Gielen |
826–850 of 1,346← PreviousNext →
Comparable venues
Other A*/A conferences filed under the same field of research.
- ADATEDesign, Automation and Test in Europe Conference
- A*DACDesign Automation Conf
- ASCInternational Conference for High Performance Computing, Networking, Storage and Analysis (was Supercomputing Conference)
- AICCADIEEE/ACM International Conference on Computer-Aided Design
- AITCIEEE International Test Conference
- A*ISCAACM International Symposium on Computer Architecture
- A*MICROInternational Symposium on Microarchitecture
- AISLPEDIEEE/ACM International Symposium on Low Power Electronics and Design