| 2022 | Hardware Root of Trust for SSN-basedDFT Ecosystems. | Janusz Rajski, Maciej Trawka, Jerzy Tyszer, Bartosz Wlodarczak |
| 2022 | Circuit-to-Circuit Attacks in SoCs via Trojan-Infected IEEE 1687 Test Infrastructure. | Michele Portolan, Antonios Pavlidis, Giorgio Di Natale, Eric Faehn, Haralampos-G. Stratigopoulos |
| 2022 | Transforming an $n$-Detection Test Set into a Test Set for a Variety of Fault Models. | Irith Pomeranz |
| 2022 | The Impact of On-chip Training to Adversarial Attacks in Memristive Crossbar Arrays. | Bijay Raj Paudel, Spyros Tragoudas |
| 2022 | DFT-Enhanced Test Scheme for Spin-Transfer-Torque (STT) MRAMs. | Ze-Wei Pan, Jin-Fu Li |
| 2022 | High Speed IO Access for Test forms the foundation for Silicon Lifecycle Management. | Amit Pandey, Brendan Tully, Karthikeyan Natarajan |
| 2022 | Virtual Prototyping: Closing the digital gap between product requirements and post-Si verification. | Thomas Nirmaier, Manuel Harrant, Marc Huppmann, Wendy You, Georg Pelz |
| 2022 | Improving structural coverage of functional tests with checkpoint signature computation. | Benjamin Niewenhuis, Devanathan Varadarajan |
| 2022 | DEFCON: Defect Acceleration through Content Optimization. | Suriyaprakash Natarajan, Abhijit Sathaye, Chaitali Oak, Nipun Chaplot, Suvadeep Banerjee |
| 2022 | Scaling physically aware logic diagnosis to complex high volume 7nm server processors. | Bharath Nandakumar, Madhur Maheshwari, Sameer Chillarige, Robert Redburn, Jeff Zimmerman, Nicholai L'Esperance, Edward Dziarcak |
| 2022 | DIST: Deterministic In-System Test with X-masking. | Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer, Bartosz Wlodarczak |
| 2022 | Industry Evaluation of Reversible Scan Chain Diagnosis. | Soumya Mittal, Szczepan Urban, Kun Young Chung, Jakub Janicki, Wu-Tung Cheng, Martin Parley, Manish Sharma, Shaun Nicholson |
| 2022 | Analyzing the Electromigration Challenges of Computation in Resistive Memories. | Mahta Mayahinia, Mehdi B. Tahoori, Manu Perumkunnil, Kristof Croes, Francky Catthoor |
| 2022 | An Efficient Test Strategy for Detection of Electromigration Impact in Advanced FinFET Memories. | Mahta Mayahinia, Mehdi B. Tahoori, Gurgen Harutyunyan, Grigor Tshagharyan, Karen Amirkhanyan |
| 2022 | In search of Vmin for dynamic power managmenet and reliable operation in mission mode. | Firooz Massoudi |
| 2022 | Efficient Low Cost Alternative Testing of Analog Crossbar Arrays for Deep Neural Networks. | Kwondo Ma, Anurup Saha, Chandramouli N. Amarnath, Abhijit Chatterjee |
| 2022 | Fault Resilience Techniques for Flash Memory of DNN Accelerators. | Shyue-Kung Lu, Yu-Sheng Wu, Jin-Hua Hong, Kohei Miyase |
| 2022 | Fine-Grained Built-In Self-Repair Techniques for NAND Flash Memories. | Shyue-Kung Lu, Shi-Chun Tseng, Kohei Miyase |
| 2022 | A Practical Online Error Detection Method for Functional Safety Using Three-Site Implications. | Kazuya Loki, Yasuyuki Kai, Kohei Miyase, Seiji Kajihara |
| 2022 | PEPR: Pseudo-Exhaustive Physically-Aware Region Testing. | Wei Li, Chris Nigh, Danielle Duvalsaint, Subhasish Mitra, Ronald D. Blanton |
| 2022 | ML-Assisted VminBinning with Multiple Guard Bands for Low Power Consumption. | Wei-Chen Lin, Chun Chen, Chao-Ho Hsieh, James Chien-Mo Li, Eric Jia-Wei Fang, Sung S.-Y. Hsueh |
| 2022 | Efficient and Robust Resistive Open Defect Detection Based on Unsupervised Deep Learning. | Yiwen Liao, Zahra Paria Najafi-Haghi, Hans-Joachim Wunderlich, Bin Yang |
| 2022 | Wafer Map Defect Classification Based on the Fusion of Pattern and Pixel Information. | Yiwen Liao, Raphal Latty, Paul R. Genssler, Hussam Amrouch, Bin Yang |
| 2022 | Optimization of Tests for Managing Silicon Defects in Data Centers. | David P. Lerner, Benson Inkley, Shubhada H. Sahasrabudhe, Ethan Hansen, Luis D. Rojas Munoz, Arjan van de Ven |
| 2022 | ML-Assisted Bug Emulation Experiments for Post-Silicon Multi-Debug of AMS Circuits. | Jun-Yang Lei, Abhijit Chatterjee |