| 2023 | Enhanced ML-Based Approach for Functional Safety Improvement in Automotive AMS Circuits. | Ayush Arunachalam, Sanjay Das, Monikka Rajan, Fei Su, Xiankun Jin, Suvadeep Banerjee, Arnab Raha, Suriyaprakash Natarajan, Kanad Basu |
| 2023 | Utilizing ECC Analytics to Improve Memory Lifecycle Management. | Costas Argyrides, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
| 2022 | Configurable BISR Chain For Fast Repair Data Loading. | Wei Zou, Benoit Nadeau-Dostie |
| 2022 | Reusing IEEE 1687-Compatible Instruments and Sub-Networks over a System Bus. | Farrokh Ghani Zadegan, Zilin Zhang, Kim Petersn, Erik Larsson |
| 2022 | Fault-coverage Maximizing March Tests for Memory Testing. | Feng Yun, Yunkun Lin, Lou Yunfei, Lei Gao, Vaibhav Gera, Boxuan Li, Vennela Chowdary Nekkanti, Aditya Rajendra Pharande, Kunal Sheth, Meghana Thommondru, Guizhong Ye, Sandeep Gupta |
| 2022 | Language Driven Analytics for Failure Pattern Feedforward and Feedback. | Min Jian Yang, Yueling Zeng, Li-C. Wang |
| 2022 | Transient Fault Pruning for Effective Candidate Reduction in Functional Debugging. | Dun-An Yang, Jing-Jia Liou, Harry H. Chen |
| 2022 | Modeling Challenge Covariances and Design Dependency for Efficient Attacks on Strong PUFs. | Hongfei Wang, Wei Liu, Hai Jin, Yu Chen, Wenjie Cai |
| 2022 | Compression-Aware ATPG. | Xing Wang, Zezhong Wang, Naixing Wang, Weiwei Zhang, Yu Huang |
| 2022 | Achieving Automotive Safety Requirements through Functional In-Field Self-Test for Deep Learning Accelerators. | Takumi Uezono, Yi He, Yanjing Li |
| 2022 | Just-Enough Stress Test for Infant-Mortality Screening Using Speed Binning. | Chen-Lin Tsai, Shi-Yu Huang |
| 2022 | Improvements in Automated IC Socket Pin Defect Detection. | Vijayakumar Thangamariappan, Nidhi Agrawal, Jason Kim, Constantinos Xanthopoulos, Ken Butler, Ira Leventhal, Joe Xiao |
| 2022 | Automatic Structural Test Generation for Analog Circuits using Neural Twins. | Jonti Talukdar, Arjun Chaudhuri, Mayukh Bhattacharya, Krishnendu Chakrabarty |
| 2022 | Reliability Study of 14 nm Scan Chains and Its Application to Hardware Security. | Franco Stellari, Peilin Song |
| 2022 | High-Coverage DfT and Reliability Enhancements for Automotive Floating Gate OTP Beyond AEC-Q100. | Hans Martin von Staudt, Franz Schuler, Rohitaswa Bhattacharya, Justin Wei-Lin Cheng, Cheng-Da Huang, Parker Chih-Chun Chen |
| 2022 | Probeless DfT Scheme for Testing 20k I/Os of an Automotive Micro-LED Headlamp Driver IC. | Hans Martin von Staudt, Luai Tarek Elnawawy, Sarah Wang, Larry Ping, Jung Woo Choi |
| 2022 | Low Capture Power At-Speed Test with Local Hot Spot Analysis to Reduce Over-Test. | Ankush Srivastava, Jais Abraham |
| 2022 | Testing of Analog Circuits using Statistical and Machine Learning Techniques. | Supriyo Srimani, Hafizur Rahaman |
| 2022 | Enhanced Data Pattern to Detect Defects in Flash Memory Address Decoder. | Weng Joe Soh, Chen He |
| 2022 | Multi-die Parallel Test Fabric for Scalability and Pattern Reusability. | Arani Sinha, Yonsang Cho, Jon Easter, Meizel V. Leiva Rojas |
| 2022 | Yield-Enhanced Probe Head Cleaning with AI-Driven Image and Signal Integrity Pattern Recognition for Wafer Test. | Nadun Sinhabahu, Katherine Shu-Min Li, Jian-De Li, J. R. Wang, Sying-Jyan Wang |
| 2022 | Accelerating RRAM Testing with a Low-cost Computation-in-Memory based DFT. | Abhairaj Singh, Moritz Fieback, Rajendra Bishnoi, Filip Bradaric, Anteneh Gebregiorgis, Rajiv V. Joshi, Said Hamdioui |
| 2022 | Understanding Vmin Failures for Improved Testing of Timing Marginalities. | Adit D. Singh |
| 2022 | DeepTPI: Test Point Insertion with Deep Reinforcement Learning. | Zhengyuan Shi, Min Li, Sadaf Khan, Liuzheng Wang, Naixing Wang, Yu Huang, Qiang Xu |
| 2022 | Error Model (EM) - A New Way of Doing Fault Simulation. | Nirmal R. Saxena, Atieh Lotfi |