IEEE International Test Conference

ITC

CORE rank

CORE rank (raw)

Fields of research

Computer Systems Engineering

Papers indexed

4,920

1981–2025

Best Computer Systems Engineering conferences

Papers per year

1981207 peak2025

Most published authors

ITC papers

4,920 records sourced from DBLP. Search titles, filter by year, sort by recency.

Year	Title	Authors
2023	Predictor BIST: An "All-in-One" Optical Test Solution for CMOS Image Sensors.	Julia Lefevre, P. Debaud, Patrick Girard, Arnaud Virazel
2023	Method for Diagnosing Channel Damage Using FPGA Transceiver.	Seongkwan Lee, Jun Yeon Won, Cheolmin Park, Minho Kang, Jaemoo Choi
2023	Method for Adjusting Termination Resistance Using PMU in DC Test.	Seongkwan Lee, Minho Kang, Cheolmin Park, Jun Yeon Won, Jaemoo Choi
2023	Novel Methodology to Optimize TAT and Resource Utilization for ATPG Simulations for Large SoCs.	Sudhakar Kongala, Anuj Gupta, Yash Walia, Sahil Jain
2023	OATT: Outlier Oriented Alternative Testing and Post-Manufacture Tuning of Mixed-Signal/RF Circuits and Systems.	Suhasini Komarraju, Akhil Tammana, Chandramouli N. Amarnath, Abhijit Chatterjee
2023	ARC-FSM-G: Automatic Security Rule Checking for Finite State Machine at the Netlist Abstraction.	Rasheed Kibria, Farimah Farahmandi, Mark Tehranipoor
2023	SLM Subsystem for Automotive SoC: Case Study on Path Margin Monitor.	Kranthi Kandula, Ramalingam Kolisetti, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
2023	Robust Pattern Generation for Small Delay Faults Under Process Variations.	Hanieh Jafarzadeh, Florian Klemme, Jan Dennis Reimer, Zahra Paria Najafi-Haghi, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich
2023	A New Framework for RTL Test Points Insertion Facilitating a "Shift-Left DFT" Strategy.	Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima, Oussama Laouamri, Naveen Khanna, Jeff Mayer, Nilanjan Mukherjee
2023	Scan Cell Segmentation Based on Reinforcement Learning for Power-Safe Testing of Monolithic 3D ICs.	Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty
2023	Diagnosis of Systematic Delay Failures Through Subset Relationship Analysis.	Bing-Han Hsieh, Yun-Sheng Liu, James Chien-Mo Li, Chris Nigh, Mason Chern, Gaurav Bhargava
2023	Preventing Single-Event Double-Node Upsets by Engineering Change Order in Latch Designs.	Sam M.-H. Hsiao, Amy H.-Y. Tsai, Lowry P.-T. Wang, Aaron C.-W. Liang, Charles H.-P. Wen, Herming Chiueh
2023	Laser Fault Injection Vulnerability Assessment and Mitigation with Case Study on PG-TVD Logic Cells.	Ryan Holzhausen, Tasnuva Farheen, Morgan Thomas, Nima Maghari, Domenic Forte
2023	Improving Productivity and Efficiency of SSD Manufacturing Self-Test Process by Learning-Based Proactive Defect Prediction.	Yunfei Gu, Xingyu Wang, Zixiao Chen, Chentao Wu, Xinfei Guo, Jie Li, Minyi Guo, Song Wu, Rong Yuan, Taile Zhang, Yawen Zhang, Haoran Cai
2023	Estimating the Failures and Silent Errors Rates of CPUs Across ISAs and Microarchitectures.	Dimitris Gizopoulos, George Papadimitriou, Odysseas Chatzopoulos
2023	Enabling In-Field Parametric Testing for RISC-V Cores.	Seyedeh Maryam Ghasemi, Sergej Meschkov, Jonas Krautter, Dennis R. E. Gnad, Mehdi B. Tahoori
2023	Improving Efficiency and Robustness of Gaussian Process Based Outlier Detection via Ensemble Learning.	Makoto Eiki, Tomoki Nakamura, Masuo Kajiyama, Michiko Inoue, Takashi Sato, Michihiro Shintani
2023	IEA-Plot: Conducting Wafer-Based Data Analytics Through Chat.	Matthew Dupree, Min Jian Yang, Yueling Jenny Zeng, Li-C. Wang
2023	A Full-Stack Approach for Side-Channel Secure ML Hardware.	Anuj Dubey, Aydin Aysu
2023	Transitioning eMRAM from Pilot Project to Volume Production.	Cyrille Dray, Khushal Gelda, Benoit Nadeau-Dostie, Wei Zou, Luc Romain, Jongsin Yun, Harshitha Kodali, Lori Schramm, Martin Keim
2023	Predicting the Resolution of Scan Diagnosis.	Manoj Devendhiran, Jakub Janicki, Szczepan Urban, Manish Sharma, Jayant D'Souza
2023	Algorithmic Read Resistance Trim for Improving Yield and Reducing Test Time in MRAM.	Daehyun Chang, Youngdae Kim, Suksoo Pyo, Shin Hun, Daesop Lee, Sohee Hwang, Jaesik Choi, Siwoong Kim
2023	A Case Study on IEEE 1838 Compliant Multi-Die 3DIC DFT Implementation.	Anshuman Chandra, Moiz Khan, Ankita Patidar, Fumiaki Takashima, Sandeep Kumar Goel, Bharath Shankaranarayanan, Vuong Nguyen, Vistrita Tyagi, Manish Arora
2023	Biochip-PUF: Physically Unclonable Function for Microfluidic Biochips.	Navajit Singh Baban, Ajymurat Orozaliev, Yong-Ak Song, Urbi Chatterjee, Sankalp Bose, Sukanta Bhattacharjee, Ramesh Karri, Krishnendu Chakrabarty
2023	Improving Angle of Arrival Estimation Accuracy for mm-Wave Radars.	Ferhat Can Ataman, Y. B. Chethan Kumar, Sandeep Rao, Sule Ozev

176–200 of 4,920← Previous Next →

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