IEEE International Test Conference

ITC

CORE rank

CORE rank (raw)

Fields of research

Computer Systems Engineering

Papers indexed

4,920

1981–2025

Best Computer Systems Engineering conferences

Papers per year

1981207 peak2025

Most published authors

ITC papers

4,920 records sourced from DBLP. Search titles, filter by year, sort by recency.

Year	Title	Authors
2024	Virtual Test Development Using Pre-Silicon Verification Environment.	E. Aderholz, Q. Atol, B. Baptist, R. Holzner, R. Ignacio, V. Kamanuri, A. Kun, K. Ma, B. Mariacher, O. Pfabigan, A. Przybilla, D. Samardzic, F. Schlagbauer, M. Schleicher, J. P. Valiente, E. Vargas, K. Vinod, O. Zikulnig
2024	Delay Monitoring Under Different PVT Corners for Test and Functional Operation.	Hari Addepalli, Jiezhong Wu, Nilanjan Mukherjee, Irith Pomeranz, Janusz Rajski
2024	Early Soft Error Reliability Assessment of Convolutional Neural Networks Executing on Resource-constrained IoT Edge Devices.	Geancarlo Abich, Ricardo Augusto da Luz Reis, Luciano Ost
2023	Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs.	Sicong Yuan, Ziwei Zhang, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui
2023	Domain-Specific Machine Learning Based Minimum Operating Voltage Prediction Using On-Chip Monitor Data.	Yuxuan Yin, Rebecca Chen, Chen He, Peng Li
2023	Device-Aware Test for Ion Depletion Defects in RRAMs.	Hanzhi Xun, Sicong Yuan, Moritz Fieback, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui
2023	Welcome Message ITC 2023.	Li-C. Wang, Jeff Rearick
2023	Recognizing Wafer Map Patterns Using Semi-Supervised Contrastive Learning with Optimized Latent Representation Learning and Data Augmentation.	Zihu Wang, Hanbin Hu, Chen He, Peng Li
2023	Global Control Signal Defect Diagnosis in Volume Production Environment.	Szczepan Urban, Piotr Zimnowlodzki, Manish Sharma, Shraddha Bodhe, John Schulze, Abdullah Yassine, Adam Styblinski
2023	Analysis and Characterization of Defects in FeFETs.	Dhruv Thapar, Simon Thomann, Arjun Chaudhuri, Hussam Amrouch, Krishnendu Chakrabarty
2023	Maximizing Stress Coverage by Novel DFT Techniques and Relaxed Timing Closure.	Arani Sinha, Glenn Coln-Bonet, Michael Fahy, Pankaj Pant, Haijing Mao, Akhilesh Shukla
2023	Machine-Learning Driven Sensor Data Analytics for Yield Enhancement of Wafer Probing.	Nadun Sinhabahu, Katherine Shu-Min Li, Sying-Jyan Wang, J. R. Wang, Matt Ho
2023	Low Distortion Sinusoidal Signal Generator with Harmonics Cancellation Using Two Types of Digital Predistortion.	Keno Sato, Takayuki Nakatani, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Shogo Katayama, Daisuke Iimori, Misaki Takagi, Yujie Zhao, Shuhei Yamamoto, Anna Kuwana, Kentaroh Katoh, Kazumi Hatayama, Haruo Kobayashi
2023	Understanding and Improving GPUs' Reliability Combining Beam Experiments with Fault Simulation.	Fernando Fernandes dos Santos, Luigi Carro, Paolo Rech
2023	Measuring Non-Redundant VIA Test-Coverage for Automotive Designs in Lower Process Nodes.	Saidapet Ramesh, Rahul Kalyan, Jesse Yanez, Andreas Glowatz, Maija Ryynnen, Sergej Schwarz
2023	New Algorithm for Fast and Accurate Linearity Testing of High-Resolution SAR ADCs.	Aswin R
2023	Compaction of Functional Broadside Tests for Path Delay Faults Using Clusters of Propagation Lines.	Irith Pomeranz
2023	Simply-Track-and-Refresh: Efficient and Scalable Rowhammer Mitigation.	Eduardo Ortega, Tyler K. Bletsch, Biresh Kumar Joardar, Jonti Talukdar, Woohyun Paik, Krishnendu Chakrabarty
2023	Low cost production scan chain test for compression based designs.	Bharath Nandakumar, Sameer Chillarige
2023	Logic Test Vehicles for High Resolution Diagnosis of Systematic FEOL/MEOL Yield Detractors.	Yinxuan Lyu, Liangliang Yu, Pengju Li, Junlin Huang
2023	Wafer-Scale Electrical Characterization of Silicon Quantum Dots from Room to Low Temperatures.	Francesco Lorenzelli, Asser Elsayed, Clement Godfrin, Alexander Grill, Stefan Kubicek, Ruoyu Li, Michele Stucchi, Danny Wan, Kristiaan De Greve, Erik Jan Marinissen, Georges G. E. Gielen
2023	Towards Robust Deep Neural Networks Against Design-Time and Run-Time Failures.	Yu Li, Qiang Xu
2023	Enhancing Good-Die-in-Bad-Neighborhood Methodology with Wafer-Level Defect Pattern Information.	Ching-Min Liu, Chia-Heng Yen, Shu-Wen Lee, Kai-Chiang Wu, Mango Chia-Tso Chao
2023	High-Speed, Low-Storage Power and Thermal Predictions for ATPG Test Patterns.	Zhe-Jia Liang, Yu-Tsung Wu, Yun-Feng Yang, James Chien-Mo Li, Norman Chang, Akhilesh Kumar, Ying-Shiun Li
2023	GPU-Based Concurrent Static Learning.	Huaxiao Liang, Xiaoze Lin, Liyang Lai, Naixing Wang, Yu Huang, Fei Yang, Yuxin Yang

151–175 of 4,920← Previous Next →

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